| Charge‐Induced Disorder Controls the Thermal Conductivity of Entropy‐Stabilized Oxides JL Braun, CM Rost, M Lim, A Giri, DH Olson, GN Kotsonis, G Stan, ... Advanced Materials 30 (51), 1805004, 2018 | 435 | 2018 |
| Diameter-dependent radial and tangential elastic moduli of ZnO nanowires G Stan, CV Ciobanu, PM Parthangal, RF Cook Nano Letters 7 (12), 3691-3697, 2007 | 346 | 2007 |
| Critical field for complete vortex expulsion from narrow superconducting strips G Stan, SB Field, JM Martinis Physical review letters 92 (9), 097003, 2004 | 275 | 2004 |
| Vertical 2D/3D Semiconductor Heterostructures Based on Epitaxial Molybdenum Disulfide and Gallium Nitride D Ruzmetov, K Zhang, G Stan, B Kalanyan, GR Bhimanapati, SM Eichfeld, ... ACS nano 10 (3), 3580-3588, 2016 | 272 | 2016 |
| Immobilization of streptavidin on 4H–SiC for biosensor development EH Williams, AV Davydov, A Motayed, SG Sundaresan, P Bocchini, ... Applied surface science 258 (16), 6056-6063, 2012 | 133 | 2012 |
| Ultimate bending strength of Si nanowires G Stan, S Krylyuk, AV Davydov, I Levin, RF Cook Nano letters 12 (5), 2599-2604, 2012 | 102 | 2012 |
| Elastic moduli of faceted aluminum nitride nanotubes measured by contact resonance atomic force microscopy G Stan, CV Ciobanu, TP Thayer, GT Wang, JR Creighton, ... Nanotechnology 20 (3), 035706, 2008 | 89 | 2008 |
| Influence of network bond percolation on the thermal, mechanical, electrical and optical properties of high and low-k a-SiC: H thin films SW King, J Bielefeld, G Xu, WA Lanford, Y Matsuda, RH Dauskardt, N Kim, ... Journal of Non-Crystalline Solids 379, 67-79, 2013 | 88 | 2013 |
| Mapping the elastic properties of granular Au films by contact resonance atomic force microscopy G Stan, RF Cook Nanotechnology 19 (23), 235701, 2008 | 84 | 2008 |
| Quantitative measurements of indentation moduli by atomic force acoustic microscopy using a dual reference method G Stan, W Price Review of scientific instruments 77 (10), 103707, 2006 | 79 | 2006 |
| Nanoscale mapping of contact stiffness and damping by contact resonance atomic force microscopy G Stan, SW King, RF Cook Nanotechnology 23 (21), 215703, 2012 | 62 | 2012 |
| Compressive stress effect on the radial elastic modulus of oxidized Si nanowires G Stan, S Krylyuk, AV Davydov, RF Cook Nano letters 10 (6), 2031-2037, 2010 | 55 | 2010 |
| Surface effects on the elastic modulus of Te nanowires G Stan, S Krylyuk, AV Davydov, M Vaudin, LA Bendersky, RF Cook Applied Physics Letters 92 (24), 241908, 2008 | 55 | 2008 |
| Adhesive contact between a rigid spherical indenter and an elastic multi-layer coated substrate G Stan, GG Adams International Journal of Solids and Structures 87, 1-10, 2016 | 50 | 2016 |
| Elastic modulus of low-k dielectric thin films measured by load-dependent contact-resonance atomic force microscopy G Stan, SW King, RF Cook Journal of Materials Research 24 (09), 2960-2964, 2009 | 46 | 2009 |
| Atomic force microscopy for nanoscale mechanical property characterization G Stan, SW King Journal of Vacuum Science & Technology B 38 (6), 2020 | 44 | 2020 |
| Nanoscale mechanics by tomographic contact resonance atomic force microscopy G Stan, SD Solares, B Pittenger, N Erina, C Su Nanoscale 6 (2), 962-969, 2014 | 40 | 2014 |
| Bending manipulation and measurements of fracture strength of silicon and oxidized silicon nanowires by atomic force microscopy G Stan, S Krylyuk, AV Davydov, RF Cook Journal of Materials Research 27 (03), 562-570, 2012 | 39 | 2012 |
| High resolution surface morphology measurements using EBSD cross-correlation techniques and AFM MD Vaudin, G Stan, YB Gerbig, RF Cook Ultramicroscopy 111 (8), 1206-1213, 2011 | 38 | 2011 |
| Nanomechanical Properties of Polyethylene Glycol Brushes on Gold Substrates G Stan, FW DelRio, RI MacCuspie, RF Cook The Journal of Physical Chemistry B 116 (10), 3138-3147, 2012 | 35 | 2012 |
Sean KingPrincipal Engineer確認したメール アドレス: intel.com