| The SOP for miniaturized, mixed-signal computing, communication, and consumer systems of the next decade RR Tummala, M Swaminathan, MM Tentzeris, J Laskar, GK Chang, ... IEEE Transactions on Advanced Packaging 27 (2), 250-267, 2004 | 186 | 2004 |
| Low-cost test of embedded RF/analog/mixed-signal circuits in SOPs SS Akbay, A Halder, A Chatterjee, D Keezer IEEE Transactions on advanced packaging 27 (2), 352-363, 2004 | 109 | 2004 |
| Multiplexing test system channels for data rates above 1 Gb/s DC Keezer Proceedings. International Test Conference 1990, 362-368, 1990 | 33 | 1990 |
| Bare die testing and MCM probing techniques DC Keezer 1992 IEEE Multi-Chip Module Conference, 20, 21, 22, 23-20, 21, 22, 23, 1992 | 32 | 1992 |
| Design and evaluation of wafer scale clock distribution DC Keezer, VK Jain 1992 Proceedings International Conference on Wafer Scale Integration, 168 …, 1992 | 31 | 1992 |
| Constant current power transmission line-based power delivery network for single-ended signaling SL Huh, M Swaminathan, D Keezer IEEE Transactions on Electromagnetic Compatibility 53 (4), 1050-1064, 2011 | 29 | 2011 |
| Terabit-per-second automated digital testing DC Keezer, Q Zhou, C Bair, J Kuan, B Poole Proceedings International Test Conference 2001 (Cat. No. 01CH37260), 1143-1151, 2001 | 28 | 2001 |
| Modular extension of ATE to 5 Gbps DC Keezer, D Minier, M Paradis, L Binette 2004 International Conferce on Test, 748-757, 2004 | 23 | 2004 |
| Low cost ATE pin electronics for multigigabit-per-second at-speed test DC Keezer, RJ Wenzel Proceedings International Test Conference 1997, 94-100, 1997 | 23 | 1997 |
| Multi-purpose digital test core utilizing programmable logic JS Davis, DC Keezer Proceedings. International Test Conference, 438-445, 2002 | 22 | 2002 |
| A comparative study of clock distribution approaches for WSI N Nigam, DC Keezer 1993 Proceedings Fifth Annual IEEE International Conference on Wafer Scale …, 1993 | 22 | 1993 |
| Bit-parallel message exchange and data recovery in optical packet switched interconnection networks O Liboiron-Ladouceur, C Gray, DC Keezer, K Bergman IEEE photonics technology letters 18 (6), 779-781, 2006 | 21 | 2006 |
| Clock distribution strategies for WSI: A critical survey DC Keezer, VK Jain 1991 International Conference on Wafer Scale Integration, 277,278,279,280 …, 1991 | 20 | 1991 |
| A development platform and electronic modules for automated test up to 20 Gbps DC Keezer, C Gray, A Majid, D Minier, P Ducharme 2009 International Test Conference, 1-11, 2009 | 19 | 2009 |
| A production-oriented multiplexing system for testing above 2.5 Gbps DC Keezer, D Minier, MC Caron International Test Conference, 2003. Proceedings. ITC 2003., 191-191, 2003 | 19 | 2003 |
| Application and demonstration of a digital test core: Optoelectronic test bed and wafer-level prober JS Davis, DC Keezer, O Liboiron-Ladouceur, K Bergman International Test Conference, 2003. Proceedings. ITC 2003., 166-166, 2003 | 19 | 2003 |
| Test support processors for enhanced testability of high performance circuits DC Keezer, Q Zhou International Test Conference 1999. Proceedings (IEEE Cat. No. 99CH37034 …, 1999 | 19 | 1999 |
| Real-time data comparison for gigahertz digital test DC Keezer 1991, Proceedings. International Test Conference, 790, 1991 | 19 | 1991 |
| Pseudo-balanced signaling using power transmission lines for parallel I/O links SL Huh, M Swaminathan, D Keezer IEEE transactions on electromagnetic compatibility 55 (2), 315-327, 2012 | 18 | 2012 |
| A novel approach to detect hardware Trojan attacks on primary data inputs T Wehbe, VJ Mooney, DC Keezer, NB Parham Proceedings of the WESS'15: Workshop on Embedded Systems Security, 1-10, 2015 | 17 | 2015 |
