フォロー
Fahimeh Emadi
タイトル
引用先
引用先
Microstructural, optical, and electrical characteristics of Ni/C doped BST thin films
F Emadi, A Nemati, M Hinterstein, E Adabifiroozjaei
Ceramics International 45 (5), 5503-5510, 2019
162019
Co, In, and Co–In alloyed Cu6Sn5 interconnects: Microstructural and mechanical characteristics
F Emadi, V Vuorinen, G Ross, M Paulasto-Kröckel
Materials Science and Engineering: A 881, 145398, 2023
132023
Microstructural and mechanical characterization of Cu/Sn SLID bonding utilizing Co as contact metallization layer
F Emadi, V Vuorinen, S Mertin, K Widell, M Paulasto-Kröckel
Journal of Alloys and Compounds 929, 167228, 2022
102022
Ionic interdiffusion as interaction mechanism between Al and Si3N4
E Adabifiroozjaei, P Koshy, F Emadi, SS Mofarah, H Ma, E Rastkerdar, ...
Journal of the American Ceramic Society 102 (8), 4835-4847, 2019
72019
Investigation of the microstructural evolution and detachment of Co in contact with Cu–Sn electroplated silicon chips during solid-liquid interdiffusion bonding
F Emadi, V Vuorinen, H Dong, G Ross, M Paulasto-Kröckel
Journal of Alloys and Compounds 890, 161852, 2022
62022
Thermoelectric characteristics of InAs nanowire networks directly grown on flexible plastic substrates
T Koskinen, V Khayrudinov, F Emadi, H Jiang, T Haggren, H Lipsanen, ...
ACS Applied Energy Materials 4 (12), 14727-14734, 2021
62021
Low-temperature die attach for power components: Cu-Sn-In solid-liquid interdiffusion bonding
F Emadi, S Liu, A Klami, N Tiwary, V Vuorinen, M Paulasto-Kröckel
2022 14th International Conference on Advanced Semiconductor Devices and …, 2022
42022
Utilizing Co as a contact metallization for wafer-level Cu-Sn-In SLID bonding used in MEMS and MOEMS packaging
F Emadi, V Vuorinen, M Paulasto-Kröckel
2022 IEEE 9th Electronics System-Integration Technology Conference (ESTC …, 2022
42022
Novel Low-Temperature Interconnects for 2.5-/3-D MEMS Integration: Demonstration and Reliability
F Emadi, V Vuorinen, S Liu, M Paulusto-Kröckel
IEEE Transactions on Components, Packaging and Manufacturing Technology 14 …, 2024
12024
Low-temperature SLID-TSV Interconnects for 3D (MEMS) Packaging
F Emadi, S Liu, V Vuorinen, M Paulasto-Kröckel
IEEE Transactions on Components, Packaging and Manufacturing Technology, 2025
2025
Contact Metallization Design for Low-Temperature Interconnects in MEMS Integration
F Emadi
2024
現在システムで処理を実行できません。しばらくしてからもう一度お試しください。
論文 1–11