| Recombination activity of light-activated copper defects in p-type silicon studied by injection- and temperature-dependent lifetime spectroscopy A Inglese, J Lindroos, H Vahlman, H Savin Journal of Applied Physics 120 (12), 125703, 2016 | 51 | 2016 |
| NUV-HD SiPMs with metal-filled trenches S Merzi, SE Brunner, A Gola, A Inglese, A Mazzi, G Paternoster, M Penna, ... Journal of Instrumentation 18 (05), P05040, 2023 | 39 | 2023 |
| Accelerated light-induced degradation for detecting copper contamination in p-type silicon A Inglese, J Lindroos, H Savin Applied Physics Letters 107 (5), 2015 | 32 | 2015 |
| Modeling of light-induced degradation due to Cu precipitation in p-type silicon. II. Comparison of simulations and experiments H Vahlman, A Haarahiltunen, W Kwapil, J Schön, A Inglese, H Savin Journal of Applied Physics 121 (195704), 2017 | 28 | 2017 |
| Impact of copper on light-induced degradation in Czochralski silicon PERC solar cells C Modanese, M Wagner, F Wolny, A Oehlke, HS Laine, A Inglese, V H., ... Solar Energy Materials and Solar Cells 186, 373-377, 2018 | 26 | 2018 |
| Modeling of light-induced degradation due to Cu precipitation in p-type silicon. I. General theory of precipitation under carrier injection H Vahlman, A Haarahitunen, W Kwapil, J Schön, A Inglese, H Savin Journal of Applied Physics 121 (195703), 2017 | 20 | 2017 |
| Light-induced degradation in multicrystalline silicon: The role of copper A Inglese, A Focareta, F Schindler, J Schön, J Lindroos, MC Schubert, ... Energy Procedia 92, 808-814, 2016 | 19 | 2016 |
| Light-induced degradation in quasi-monocrystalline silicon PERC solar cells: Indications on involvement of copper H Vahlman, M Wagner, F Wolny, A Krause, H Laine, A Inglese, ... physica status solidi (a) 214 (7), 2017 | 15 | 2017 |
| Reduction of light-induced degradation of boron-doped solar-grade Czochralski silicon by corona charging Y Boulfrad, J Lindroos, A Inglese, M Yli-Koski, H Savin Energy Procedia 38, 531-535, 2013 | 15 | 2013 |
| Rapid thermal anneal activates light induced degradation due to copper redistribution N Nampalli, HS Laine, J Colwell, V Vähänissi, A Inglese, C Modanese, ... Applied Physics Letters 113, 032104, 2018 | 13 | 2018 |
| Cu gettering by phosphorus-doped emitters in p-type silicon: Effect on light-induced degradation A Inglese, HS Laine, V Vähänissi, H Savin AIP Advances 8 (015112), 2018 | 7 | 2018 |
| Characterization of light-activated Cu defects: comparison with the recombination activity of metallic precipitates A Inglese, H Vahlman, K Wolfram, J Schön, H Savin physica status solidi (c) 14 (7), 2017 | 4 | 2017 |
| Effect of low-temperature annealing on defect causing copper-related light-induced degradation in p-type silicon H Vahlman, A Haarahiltunen, W Kwapil, J Schön, M Yli-Koski, A Inglese, ... Energy Procedia 124, 188-196, 2017 | 2 | 2017 |
| (poster) Impact of copper on light-induced degradation in Czochralski silicon PERC solar cells C Modanese, M Wagner, F Wolny, A Oehlke, HS Laine, A Inglese, ... International Conference on Crystalline Silicon Photovoltaics, 2018 | | 2018 |
| (poster) Copper-Related Light Induced Degradation Activated by Firing N Nampalli, HS Laine, J Colwell, V Vähänissi, A Inglese, C Modanese, ... International Conference on Crystalline Silicon Photovoltaics, 2018 | | 2018 |
| On light-activation of copper impurities in crystalline silicon: root cause analysis and applications for high-resolution imaging A Inglese Aalto University, 2018 | | 2018 |
| (poster) Recombination activity of Cu-LID defects in silicon: modeling and applications for high-resolution Cu imaging A Inglese, H Vahlman, J Schön, W Kwapil, H Savin Conference on Gettering and Defect Engineering in Semiconductor Technology, 2017 | | 2017 |
| (poster) Light-induced degradation due to Cu precipitation in p-type silicon: Mathematical model and effects of annealing H Vahlman, A Haarahiltunen, W Kwapil, J Schön, M Yli-Koski, A Inglese, ... International Conference on Crystalline Silicon Photovoltaics, 2017 | | 2017 |
| (oral talk) High resolution imaging of light-activated copper impurities in multicrystalline silicon wafers by photoluminescence C Modanese, A Inglese, A Focareta, F Schindler, J Schön, MC Schubert, ... ALTECH EMRS Symposium: Analytical techniques for precise characterization of …, 2017 | | 2017 |
| (oral talk) Light-induced degradation in quasi-monocrystalline silicon PERC solar cells: Indications on involvement of copper H Vahlman, M Wagner, F Wolny, A Krause, H Laine, A Inglese, ... Conference on Gettering and Defect Engineering in Semiconductor Technology, 2017 | | 2017 |
Hele SavinAalto University確認したメール アドレス: aalto.fi
