| Magnetic and magnetoelastic properties of Zn-doped cobalt-ferrites—CoFe2− xZnxO4 (x= 0, 0.1, 0.2, and 0.3) N Somaiah, TV Jayaraman, PA Joy, D Das Journal of Magnetism and Magnetic Materials 324 (14), 2286-2291, 2012 | 185 | 2012 |
| Electric current induced forward and anomalous backward mass transport N Somaiah, D Sharma, P Kumar Journal of Physics D: Applied Physics 49 (20), 20LT01, 2016 | 11 | 2016 |
| Effect of substrate surface roughness on electric current induced flow of liquid metals S Talukder, N Somaiah, P Kumar Applied Physics Letters 102 (5), 2013 | 11 | 2013 |
| Tuning electromigration-thermomigration coupling in Cu/W Blech structures N Somaiah, P Kumar Journal of Applied Physics 124 (18), 2018 | 6 | 2018 |
| Inverse Blech Length Phenomenon in Thin-Film Stripes N Somaiah, P Kumar Physical Review Applied 10 (5), 054052, 2018 | 6 | 2018 |
| Carrier transport in LPCVD grown Ge-doped β-Ga2O3/4H-SiC isotype heterojunction T Saquib, F Akyol, H Ozden, N Somaiah, J Sahoo, R Muralidharan, ... Journal of Applied Physics 135 (6), 2024 | 5 | 2024 |
| Effect of Thermomigration–Electromigration Coupling on Mass Transport in Cu Thin Films N Somaiah, P Kumar Journal of Electronic Materials 49, 96-108, 2020 | 3 | 2020 |
| Effects of an interfacial layer on stress relaxation mechanisms active in the Cu–Si thin film system during thermal cycling N Somaiah, A Kanjilal, P Kumar MRS Communications 10 (1), 164-172, 2020 | 1 | 2020 |
| Tuning sample length effect on mass transport in current carrying Cu-Si thin-film systems via interfacial engineering N Somaiah, P Kumar Nanotechnology 30 (48), 485704, 2019 | 1 | 2019 |
| Mass Transport in Cu-Interlayer-Si Systems under Various Thermo-Electro-Mechanical Excursions N Somaiah | | 2021 |
| Effect of Embedding Cu-Graphene Hybrid Powder into 2-Phase In-Cu Solders on Its Suitability as Metallic Thermal Interface Material D Sharma, A Jain, N Somaiah, PR Narayanan, P Kumar Journal of Electronic Materials 47, 4863-4874, 2018 | | 2018 |
| Observation of Inverse Blech Length Effect during Electromigration of Cu Thin Film N Somaiah, P Kumar International Conference on Microelectronics and Microsystems Technology 11 …, 2017 | | 2017 |
Praveen KumarIndian Institute of Science, Bangalore, India確認したメール アドレス: iisc.ac.in