Simulated annealing analysis of Rutherford backscattering data NP Barradas, C Jeynes, RP Webb
Applied Physics Letters 71 (2), 291-293, 1997
792 1997 Elemental thin film depth profiles by ion beam analysis using simulated annealing-a new tool C Jeynes, NP Barradas, PK Marriott, G Boudreault, M Jenkin, E Wendler, ...
Journal of physics D: applied physics 36 (7), R97, 2003
234 2003 Advanced physics and algorithms in the IBA DataFurnace NP Barradas, C Jeynes
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2008
191 2008 Accurate determination of quantity of material in thin films by Rutherford backscattering spectrometry C Jeynes, NP Barradas, E Szilágyi
Analytical chemistry 84 (14), 6061-6069, 2012
130 2012 International Atomic Energy Agency intercomparison of ion beam analysis software NP Barradas, K Arstila, G Battistig, M Bianconi, N Dytlewski, C Jeynes, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2007
107 2007 Graded selective coatings based on chromium and titanium oxynitride C Nunes, V Teixeira, ML Prates, NP Barradas, AD Sequeira
Thin Solid Films 442 (1-2), 173-178, 2003
104 2003 Magnetoresistance enhancement in specular, bottom-pinned, A Veloso, PP Freitas, P Wei, NP Barradas, JC Soares, B Almeida, ...
Applied Physics Letters 77 (7), 1020-1022, 2000
100 2000 Status of ion beam data analysis and simulation software E Rauhala, NP Barradas, S Fazinic, M Mayer, E Szilágyi, M Thompson
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2006
98 2006 Magnetic anisotropy and temperature dependence of the hyperfine fields of NP Barradas, M Rots, AA Melo, JC Soares
Physical Review B 47 (14), 8763, 1993
93 1993 Solar selective absorbers based on Al2O3: W cermets and AlSiN/AlSiON layers L Rebouta, A Sousa, P Capela, M Andritschky, P Santilli, A Matilainen, ...
Solar Energy Materials and Solar Cells 137, 93-100, 2015
92 2015 Tuning of the surface plasmon resonance in TiO2/Au thin films grown by magnetron sputtering: the effect of thermal annealing M Torrell, R Kabir, L Cunha, MI Vasilevskiy, F Vaz, A Cavaleiro, E Alves, ...
Journal of Applied Physics 109 (7), 2011
90 2011 Efficient dipole-dipole coupling of Mott-Wannier and Frenkel excitons in (Ga, In) N quantum well/polyfluorene semiconductor heterostructures G Itskos, G Heliotis, PG Lagoudakis, J Lupton, NP Barradas, E Alves, ...
Physical Review B—Condensed Matter and Materials Physics 76 (3), 035344, 2007
90 2007 Ion beam analysis of fusion plasma-facing materials and components: facilities and research challenges M Mayer, S Möller, M Rubel, A Widdowson, S Charisopoulos, T Ahlgren, ...
Nuclear Fusion 60 (2), 025001, 2019
89 2019 Long-term fuel retention in JET ITER-like wall K Heinola, A Widdowson, J Likonen, E Alves, A Baron-Wiechec, ...
Physica Scripta 2016 (T167), 014075, 2016
88 2016 Summary of “IAEA intercomparison of IBA software” NP Barradas, K Arstila, G Battistig, M Bianconi, N Dytlewski, C Jeynes, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2008
88 2008 Effect of free layer thickness and shape anisotropy on the transfer curves of MgO magnetic tunnel junctions P Wiśniowski, JM Almeida, S Cardoso, NP Barradas, PP Freitas
Journal of Applied Physics 103 (7), 2008
80 2008 The influence of annealing treatments on the properties of Ag: TiO2 nanocomposite films prepared by magnetron sputtering RC Adochite, D Munteanu, M Torrell, L Cunha, E Alves, NP Barradas, ...
Applied Surface Science 258 (8), 4028-4034, 2012
79 2012 Optimization of nanocomposite Au/TiO2 thin films towards LSPR optical-sensing MS Rodrigues, D Costa, RP Domingues, M Apreutesei, P Pedrosa, ...
Applied surface science 438, 74-83, 2018
77 2018 Accurate calculation of pileup effects in PIXE spectra from first principles NP Barradas, MA Reis
X‐Ray Spectrometry: An International Journal 35 (4), 232-237, 2006
76 2006 Magnetoresistance and magnetic properties of NiFe/oxide/Co junctions prepared by magnetron sputtering TS Plaskett, PP Freitas, NP Barradas, MF Da Silva, JC Soares
Journal of Applied Physics 76 (10), 6104-6106, 1994
75 1994 
Eduardo AlvesFull Researcher, DECN, Instituto Superior Técnico, Universidade de Lisboa確認したメール アドレス: tecnico.ulisboa.pt
