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SUSMRITI DAS MAHAPATRA
SUSMRITI DAS MAHAPATRA
Quality & Reliability R&D Engineer, Intel Corporation
確認したメール アドレス: intel.com - ホームページ
タイトル
引用先
引用先
Piezoelectric materials for energy harvesting and sensing applications: roadmap for future smart materials
SD Mahapatra, PC Mohapatra, AI Aria, G Christie, YK Mishra, S Hofmann, ...
Advanced Science 8 (17), 2100864, 2021
4482021
Recent advances in mitigation of whiskers from electroplated tin
BS Majumdar, I Dutta, S Bhassyvasantha, S Das Mahapatra
JOM 72, 906-917, 2020
152020
Co-electrodeposition of tin with 0.2–20% indium: Implications on tin whisker growth
SD Mahapatra, I Dutta
Surface and Coatings Technology 337, 478-483, 2018
102018
Elimination of Whisker Growth by Indium Addition in Electroplated Tin on Copper Substrate
SD Mahapatra
Washington State University, 2017
92017
Whisker mitigation mechanisms in indium-doped tin thin films: role of the surface
S Bhassyvasantha, N Fredj, SD Mahapatra, W Jennings, I Dutta, ...
Journal of Electronic Materials 47, 6229-6240, 2018
62018
Role of surface oxide in mitigating tin whisker growth: A finite element study
SD Mahapatra, I Dutta
Materials Science and Engineering: A 706, 181-191, 2017
52017
Controlling tin whisker growth via oxygen-mediated decomposition of Ti2SnC
H Tang, B Yan, P Zhang, X Yin, Z Tian, S Das Mahapatra, W Zheng, ...
Journal of Materials Science 59 (5), 1958-1967, 2024
42024
Eliminating whisker growth by indium addition in electroplated Sn on copper substrate
S Das Mahapatra, BS Majumdar, I Dutta, S Bhassyvasantha
Journal of Electronic Materials 46, 4062-4075, 2017
42017
Elimination of Tin Whisker Growth by Indium Addition to Electroplated Tin in Electronic Packages
BSMID S. Das Mahapatra
16th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena …, 2017
42017
Influence of Indium Addition on Whisker Growth in Electroplated Sn
ID S. Das Mahapatra, H. Yang, L. Meinshausen, S. Bhassyvasantha, S Banerjee ...
The Ninth Pacific Rim International Conference on Advanced Materials and …, 2016
4*2016
Method of electroplating tin films with indium using an alkanesulfonic acid based electrolyte
I Dutta, SD Mahapatra
US Patent App. 15/654,291, 2017
22017
Chip-scale package architectures containing a die back side metal and a solder thermal interface material
SD Mahapatra, M Sankarasubramanian, S Howell, J Harper, M Modi
US Patent 12,040,246, 2024
12024
Solder Thermal Interface Material (STIM) with Dopant
PL Susmriti Das Mahapatra, Bamidele Falola, Amitesh Saha, Sergio Chan
US Patent App. 16/406,593, 2019
1*2019
Lids for Integrated Circuit Packages with Solder Thermal Interface Materials
PL Bamidele Falola, Susmriti Das Mahapatra, Amitesh Saha, Sergio Chan
US Patent App. 16/435,355, 2019
1*2019
Chip-scale package architectures containing a die back side metal and a solder thermal interface material
SD Mahapatra, M Sankarasubramanian, S Howell, J Harper, M Modi
US Patent App. 18/744,108, 2024
2024
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