| Method for sample separation and lift-out with one cut TM Moore, RD Kruger, C Hartfield US Patent 6,420,722, 2002 | 148 | 2002 |
| Total release method for sample extraction from a charged-particle instrument TM Moore US Patent 6,570,170, 2003 | 82* | 2003 |
| Autonomous mobile goods transfer JA Healey, OUF Choque US Patent 10,252,659, 2019 | 55* | 2019 |
| The impact of delamination on stress-induced and contamination-related failure in surface mount ICs TM Moore, SJ Kelsall Proceedings of the International Reliability Physics Symposium, 169-176, 1992 | 51 | 1992 |
| Characterization of integrated circuit packaging materials T Moore Elsevier, 2013 | 41 | 2013 |
| Continuous wave resonant photon stimulated electron energy-gain and electron energy-loss spectroscopy of individual plasmonic nanoparticles C Liu, Y Wu, Z Hu, JA Busche, EK Beutler, NP Montoni, TM Moore, ... ACS Photonics 6 (10), 2499-2508, 2019 | 36 | 2019 |
| Laser-Assisted Focused He+ Ion Beam Induced Etching with and without XeF2 Gas Assist MG Stanford, K Mahady, BB Lewis, JD Fowlkes, S Tan, R Livengood, ... ACS applied materials & interfaces 8 (42), 29155-29162, 2016 | 35 | 2016 |
| Exploring photothermal pathways via in situ laser heating in the transmission electron microscope: recrystallization, grain growth, phase separation, and dewetting in Ag0. 5Ni0 … Y Wu, C Liu, TM Moore, GA Magel, DA Garfinkel, JP Camden, ... Microscopy and microanalysis 24 (6), 647-656, 2018 | 34 | 2018 |
| C-mode acoustic microscopy applied to integrated circuit package inspection TM Moore Solid-state electronics 35 (3), 411-421, 1992 | 34 | 1992 |
| Method for STEM sample inspection in a charged particle beam instrument L Zaykova-Feldman, TM Moore, G Amador, M Hammer US Patent 7,834,315, 2010 | 33 | 2010 |
| Method and apparatus for in-situ probe tip replacement inside a charged particle beam microscope TM Moore, L Zaykova-Feldman US Patent 7,381,971, 2008 | 31 | 2008 |
| Correlation of surface mount plastic package reliability testing to nondestructive inspection by scanning acoustic microscopy TM Moore, R McKenna, SJ Kelsall Proc. Int. Reliability Physics Symposium, 160-166, 1991 | 30 | 1991 |
| Method and apparatus for the automated process of in-situ lift-out TM Moore, L Zaykova-Feldman US Patent 7,414,252, 2008 | 29 | 2008 |
| FIB lift-out for defect analysis LA Giannuzzi, BW Kempshall, SD Anderson, BI Prenitzer, TM Moore Microelectronic Failure Analysis: Desk Reference, 29-35, 2002 | 27 | 2002 |
| In situ laser processing in a scanning electron microscope NA Roberts, GA Magel, CD Hartfield, TM Moore, JD Fowlkes, PD Rack Journal of Vacuum Science & Technology A 30 (4), 2012 | 24 | 2012 |
| Acoustic microscopy of semiconductor packages CD Hartfield, TM Moore, S Brand Microelectronics Fialure Analysis Desk Reference 67, 2019 | 23 | 2019 |
| Method and apparatus for acquiring simultaneous and overlapping optical and charged particle beam images TM Moore, C Hartfield, GA Magel US Patent 8,440,969, 2013 | 23 | 2013 |
| EBIC characterization of electrically active defects in (Hg, Cd) Te TM Moore, HF Schaake Journal of Vacuum Science Technology A: Vacuum Surfaces and Films 1 (3 …, 1983 | 22 | 1983 |
| Identification of package defects in plastic-packaged surface-mount ICs by scanning acoustic microscopy TM Moore ISTFA 89, 61-67, 1989 | 21 | 1989 |
| TEM sample holder TM Moore US Patent 7,115,882, 2006 | 20 | 2006 |
Cheryl D. HartfieldZEISS確認したメール アドレス: zeiss.com