| The evolution of patent mining: Applying bibliometrics analysis and keyword network analysis F Madani, C Weber World Patent Information 46, 32-48, 2016 | 192 | 2016 |
| Knowledge-based theories of the firm in strategic management: A review and extension S Kaplan, A Schenkel, G von Krogh, C Weber International Journal of Project Management 25 (56), 143-158, 2001 | 179 | 2001 |
| SMES for power utility applications: A review of technical and cost considerations V Karasik, K Dixon, C Weber, B Batchelder, G Campbell, P Ribeiro IEEE transactions on applied superconductivity 9 (2), 541-546, 2002 | 147 | 2002 |
| Test method for random defects in electronic microstructures CM Weber US Patent 4,855,253, 1989 | 136 | 1989 |
| Artificial markets: A review and assessment of a new venue for innovation research B Zenobia, C Weber, T Daim Technovation 29 (5), 338-350, 2009 | 92 | 2009 |
| Yield learning and the sources of profitability in semiconductor manufacturing and process development C Weber IEEE Transactions on Semiconductor Manufacturing 17 (4), 590-596, 2004 | 79 | 2004 |
| Inspection in semiconductor manufacturing KW Tobin Webster’s Encyclopedia of Electrical and Electronic Engineering 10, 242-262, 1999 | 69 | 1999 |
| Mask cost and profitability in photomask manufacturing: An empirical analysis CM Weber, CN Berglund, P Gabella IEEE Transactions on semiconductor manufacturing 19 (4), 465-474, 2006 | 40 | 2006 |
| An integrated framework for yield management and defect/fault reduction C Weber, B Moslehi, M Dutta IEEE Transactions on semiconductor manufacturing 8 (2), 110-120, 1995 | 38 | 1995 |
| Quantifying the value of ownership of yield analysis technologies C Weber, V Sankaran, KW Tobin, G Scher IEEE transactions on semiconductor manufacturing 15 (4), 411-419, 2002 | 30 | 2002 |
| Knowledge transfer and the limits to profitability: An empirical study of problem-solving practices in semiconductor manufacturing and process development C Weber IEEE Transactions on Semiconductor Manufacturing 15 (4), 420-426, 2002 | 30 | 2002 |
| Optimizing your position on the operating curve: How can a fab truly maximize its performance? CM Weber, A Fayed IEEE Transactions on Semiconductor Manufacturing 23 (1), 21-29, 2010 | 27 | 2010 |
| Technology readiness, market readiness and the triple bottom line: An empirical analysis of innovating startups in an incubator R Hasenauer, A Gschöpf, C Weber 2016 Portland International Conference on Management of Engineering and …, 2016 | 26 | 2016 |
| Rapid learning in high-velocity environments. CM Weber | 25 | 2004 |
| Dynamics of competition and strategy: A literature review of strategic management models and frameworks M Saadatmand, M Dabab, C Weber 2018 Portland international conference on management of engineering and …, 2018 | 23 | 2018 |
| Enabling collaborative solutions across the semiconductor manufacturing ecosystem J Yang, CM Weber, P Gabella IEEE transactions on semiconductor manufacturing 26 (4), 465-475, 2013 | 22 | 2013 |
| Standard defect monitor C Weber Proceedings of the IEEE International Conference on Microelectronic Test …, 1988 | 20 | 1988 |
| Do learning organizations have strokes of genius? C Weber 2006 Technology Management for the Global Future-PICMET 2006 Conference 3 …, 2006 | 19 | 2006 |
| Nokia phones: From a total success to a total fiasco: A study on why Nokia eventually failed to connect people, and an analysis of what the new home of Nokia phones must do to … A Alibage, C Weber 2018 Portland International Conference on Management of Engineering and …, 2018 | 17 | 2018 |
| Organizational learning and capital productivity in semiconductor manufacturing CM Weber, J Yang IEEE Transactions on Semiconductor Manufacturing 27 (3), 316-326, 2014 | 17 | 2014 |
KW TobinOak Ridge Associated Universities確認したメール アドレス: orau.org