フォロー
Sean Blanchard
タイトル
引用先
引用先
Measurement of the neutron spin structure function gn1 with a polarized 3He internal target
K Ackerstaff, A Airapetian, I Akushevich, N Akopov, M Amarian, ...
Physics Letters B 404 (3-4), 383-389, 1997
5831997
Memory errors in modern systems: The good, the bad, and the ugly
V Sridharan, N DeBardeleben, S Blanchard, KB Ferreira, J Stearley, ...
ACM SIGARCH Computer Architecture News 43 (1), 297-310, 2015
3972015
Flavor decomposition of the polarized quark distributions in the nucleon from inclusive and semi-inclusive deep-inelastic scattering
K Ackerstaff, A Airapetian, N Akopov, I Akushevich, M Amarian, ...
Physics Letters B 464 (1-2), 123-134, 1999
3171999
Feng shui of supercomputer memory: Positional effects in DRAM and SRAM faults
V Sridharan, J Stearley, N DeBardeleben, S Blanchard, S Gurumurthi
Proceedings of the International Conference on High Performance Computing …, 2013
2442013
Observation of a Coherence Length Effect in Exclusive Electroproduction
K Ackerstaff, A Airapetian, N Akopov, I Akushevich, M Amarian, ...
Physical review letters 82 (15), 3025, 1999
1041999
Determination of the deep inelastic contribution to the generalised Gerasimov-Drell-Hearn integral for the proton and neutron
K Ackerstaff, A Airapetian, N Akopov, I Akushevich, M Amarian, ...
Physics Letters B 444 (3-4), 531-538, 1998
1041998
F-sefi: A fine-grained soft error fault injection tool for profiling application vulnerability
Q Guan, N Debardeleben, S Blanchard, S Fu
2014 IEEE 28th International Parallel and Distributed Processing Symposium …, 2014
892014
3-D numerical mode-matching (NMM) method for resistivity well-logging tools
GX Fan, QH Liu, SP Blanchard
IEEE Transactions on Antennas and Propagation 48 (10), 1544-1552, 2000
642000
Experimental and analytical study of xeon phi reliability
D Oliveira, L Pilla, N DeBardeleben, S Blanchard, H Quinn, I Koren, ...
Proceedings of the International Conference for High Performance Computing …, 2017
632017
Assessment of the impact of cosmic-ray-induced neutrons on hardware in the roadrunner supercomputer
SE Michalak, AJ DuBois, CB Storlie, HM Quinn, WN Rust, DH DuBois, ...
IEEE Transactions on Device and Materials Reliability 12 (2), 445-454, 2012
572012
Towards practical algorithm based fault tolerance in dense linear algebra
P Wu, Q Guan, N DeBardeleben, S Blanchard, D Tao, X Liang, J Chen, ...
Proceedings of the 25th ACM International Symposium on High-Performance …, 2016
552016
GPU behavior on a large HPC cluster
N DeBardeleben, S Blanchard, L Monroe, P Romero, D Grunau, C Idler, ...
Euro-Par 2013: Parallel Processing Workshops: BigDataCloud, DIHC, FedICI …, 2014
442014
Measurement of angular distributions and in diffractive electroproduction of $ mesons
HERMES collaboration, K Ackerstaff
The European Physical Journal C-Particles and Fields 18 (2), 303-316, 2000
402000
Interpretable anomaly detection for monitoring of high performance computing systems
E Baseman, S Blanchard, N DeBardeleben, A Bonnie, A Morrow
Outlier Definition, Detection, and Description on Demand Workshop at ACM …, 2016
372016
Relational synthesis of text and numeric data for anomaly detection on computing system logs
E Baseman, S Blanchard, Z Li, S Fu
2016 15th IEEE International Conference on Machine Learning and Applications …, 2016
332016
Experimental framework for injecting logic errors in a virtual machine to profile applications for soft error resilience
N DeBardeleben, S Blanchard, Q Guan, Z Zhang, S Fu
Euro-Par 2011: Parallel Processing Workshops: CCPI, CGWS, HeteroPar, HiBB …, 2012
332012
Silent data corruption resilient two-sided matrix factorizations
P Wu, N DeBardeleben, Q Guan, S Blanchard, J Chen, D Tao, X Liang, ...
Proceedings of the 22nd ACM SIGPLAN Symposium on Principles and Practice of …, 2017
322017
Measurements of asymmetries of pion single charge exchange on polarized at 200 MeV
Q Zhao, G Burleson, S Blanchard, T Chang, W Gibbs, J Haas, B Park, ...
Physical Review C 60 (2), 024001, 1999
271999
Design, use and evaluation of p-fsefi: A parallel soft error fault injection framework for emulating soft errors in parallel applications
Q Guan, N BeBardeleben, P Wu, S Eidenbenz, S Blanchard, L Monroe, ...
Proceedings of the 9th EAI International Conference on Simulation Tools and …, 2016
252016
Analyzing reliability of memory sub-systems with double-chipkill detect/correct
X Jian, N DeBardeleben, S Blanchard, V Sridharan, R Kumar
2013 IEEE 19th Pacific Rim International Symposium on Dependable Computing …, 2013
232013
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