フォロー
Mustafa Berke Yelten
Mustafa Berke Yelten
Istanbul Technical University, Electronics and Communications Engineering
確認したメール アドレス: itu.edu.tr
タイトル
引用先
引用先
年
Demystifying surrogate modeling for circuits and systems
MB Yelten, T Zhu, S Koziel, PD Franzon, MB Steer
IEEE Circuits and Systems Magazine 12 (1), 45-63, 2012
1782012
Surrogate-model-based analysis of analog circuits—Part I: Variability analysis
MB Yelten, PD Franzon, MB Steer
IEEE Transactions on Device and Materials Reliability 11 (3), 458-465, 2011
602011
Silver nanowire coated knitted wool fabrics for wearable electronic applications
A Gurarslan, B Özdemir, İH Bayat, MB Yelten, G Karabulut Kurt
Journal of Engineered Fibers and Fabrics 14, 1558925019856222, 2019
512019
Design of cryogenic LNAs for high linearity in space applications
A Çağlar, MB Yelten
IEEE Transactions on Circuits and Systems I: Regular Papers 66 (12), 4619-4627, 2019
392019
Statistical MOSFET modeling methodology for cryogenic conditions
A Kabaoğlu, NŞ Solmaz, S İlik, Y Uzun, MB Yelten
IEEE Transactions on Electron Devices 66 (1), 66-72, 2018
272018
Analog design methodologies for reliability in nanoscale CMOS circuits
E Afacan, MB Yelten, G Dündar
2017 14th International Conference on Synthesis, Modeling, Analysis and …, 2017
262017
Scalable and efficient analog parametric fault identification
MB Yelten, S Natarajan, B Xue, P Goteti
2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 387-392, 2013
262013
A high performance TIA design in 40 nm CMOS
AD Güngördü, G Dündar, MB Yelten
2020 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2020
252020
A 180-nm X-Band Cryogenic CMOS LNA
MB Yelten
IEEE Microwave and Wireless Components Letters 30 (4), 395-398, 2020
212020
A cryogenic modeling methodology of MOSFET IV characteristics in BSIM3
A Kabaoğlu, MB Yelten
2017 14th International Conference on Synthesis, Modeling, Analysis and …, 2017
202017
Modeling of total ionizing dose degradation on 180-nm n-MOSFETs using BSIM3
S İlik, A Kabaoğlu, NŞ Solmaz, MB Yelten
IEEE Transactions on Electron Devices 66 (11), 4617-4622, 2019
162019
Design of a tunable LNA and its variability analysis through surrogate modeling
X Xhafa, MB Yelten
International Journal of Numerical Modelling: Electronic Networks, Devices …, 2020
152020
Experimental and modeling studies of automotive-qualified OLEDs under electrical stress
A Güney, MB Yelten, O Ferhanoğlu, N Kahraman
Microelectronics Reliability 111, 113704, 2020
142020
A novel multiple membership function generator for fuzzy logic systems
R Khayatzadeh, MB Yelten
2018 15th International Conference on Synthesis, Modeling, Analysis and …, 2018
142018
Design of a constant current laser driver for biomedical applications
ÖD Temel, O Ferhanoğlu, MB Yelten
2021 IEEE 12th Latin America Symposium on Circuits and System (LASCAS), 1-4, 2021
122021
Time-dependent dielectric breakdown (TDDB) reliability analysis of CMOS analog and radio frequency (RF) circuits
MT Saniç, MB Yelten
Analog Integrated Circuits and Signal Processing 97, 39-47, 2018
122018
A test-bed based guideline for multi-source energy harvesting
E Davut, O Kazanci, A Caglar, D Altinel, MB Yelten, GK Kurt
2017 10th International Conference on Electrical and Electronics Engineering …, 2017
122017
Comparison of modeling techniques in circuit variability analysis
MB Yelten, PD Franzon, MB Steer
International Journal of Numerical Modelling: Electronic Networks, Devices …, 2012
122012
Holistic device modeling: Toward a unified MOSFET model including variability, aging, and extreme operating conditions
MB Yelten
IEEE Transactions on Circuits and Systems II: Express Briefs 69 (6), 2635-2640, 2022
112022
An automated setup for the characterization of time-based degradation effects including the process variability in 40-nm CMOS transistors
X Xhafa, AD Güngördü, D Erol, Y Yavuz, MB Yelten
IEEE Transactions on Instrumentation and Measurement 70, 1-10, 2021
112021
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