Characterization of heavily B‐doped polycrystalline diamond films using Raman spectroscopy and electron spin resonance P Gonon, E Gheeraert, A Deneuville, F Fontaine, L Abello, G Lucazeau Journal of applied physics 78 (12), 7059-7062, 1995 | 180 | 1995 |
Resistance switching in HfO2 metal-insulator-metal devices P Gonon, M Mougenot, C Vallée, C Jorel, V Jousseaume, H Grampeix, ... Journal of Applied Physics 107 (7), 2010 | 152 | 2010 |
Optical and electrical characterization of boron-doped diamond films R Locher, J Wagner, F Fuchs, M Maier, P Gonon, P Koidl Diamond and Related Materials 4 (5-6), 678-683, 1995 | 134 | 1995 |
Modeling of nonlinearities in the capacitance-voltage characteristics of high-k metal-insulator-metal capacitors P Gonon, C Vallée Applied physics letters 90 (14), 2007 | 132 | 2007 |
Effect of boron incorporation on the “quality” of MPCVD diamond films E Gheeraert, P Gonon, A Deneuville, L Abello, G Lucazeau Diamond and Related Materials 2 (5-7), 742-745, 1993 | 124 | 1993 |
Back-end-of-line compatible conductive bridging RAM based on Cu and SiO2 Y Bernard, VT Renard, P Gonon, V Jousseaume Microelectronic Engineering 88 (5), 814-816, 2011 | 104 | 2011 |
Dielectric properties of epoxy/silica composites used for microlectronic packaging, and their dependence on post-curing P Gonon, A Sylvestre, J Teysseyre, C Prior Journal of Materials Science: Materials in Electronics 12, 81-86, 2001 | 101 | 2001 |
Electrical properties of epoxy/silver nanocomposites P Gonon, A Boudefel Journal of Applied Physics 99 (2), 2006 | 98 | 2006 |
Electrical conduction and deep levels in polycrystalline diamond films P Gonon, A Deneuville, F Fontaine, E Gheeraert Journal of applied physics 78 (11), 6633-6638, 1995 | 94 | 1995 |
Combined effects of humidity and thermal stress on the dielectric properties of epoxy-silica composites P Gonon, A Sylvestre, J Teysseyre, C Prior Materials Science and Engineering: B 83 (1-3), 158-164, 2001 | 79 | 2001 |
Experimental evidence for the role of electrodes and oxygen vacancies in voltage nonlinearities observed in high-k metal-insulator-metal capacitors F El Kamel, P Gonon, C Vallée Applied Physics Letters 91 (17), 2007 | 63 | 2007 |
Influence of high levels of water absorption on the resistivity and dielectric permittivity of epoxy composites P Gonon, TP Hong, O Lesaint, S Bourdelais, H Debruyne Polymer testing 24 (6), 799-804, 2005 | 63 | 2005 |
High performance metal-insulator-metal capacitor using a SrTiO3/ZrO2 bilayer C Jorel, C Vallée, P Gonon, E Gourvest, C Dubarry, E Defay Applied Physics Letters 94 (25), 2009 | 62 | 2009 |
Stress-induced leakage current and trap generation in HfO2 thin films C Mannequin, P Gonon, C Vallée, L Latu-Romain, A Bsiesy, H Grampeix, ... Journal of Applied Physics 112 (7), 2012 | 61 | 2012 |
Water absorption in a glass-mica-epoxy composite-[I: Influence on Electrical Properties] TP Hong, O Lesaint, P Gonon IEEE Transactions on Dielectrics and Electrical Insulation 16 (1), 1-10, 2009 | 58 | 2009 |
Resistive switching of HfO2-based Metal–Insulator–Metal diodes: Impact of the top electrode material T Bertaud, D Walczyk, C Walczyk, S Kubotsch, M Sowinska, T Schroeder, ... Thin Solid Films 520 (14), 4551-4555, 2012 | 55 | 2012 |
On the mechanisms of cation injection in conducting bridge memories: The case of HfO2 in contact with noble metal anodes (Au, Cu, Ag) M Saadi, P Gonon, C Vallée, C Mannequin, H Grampeix, E Jalaguier, ... Journal of Applied Physics 119 (11), 2016 | 53 | 2016 |
Electrode oxygen-affinity influence on voltage nonlinearities in high-k metal-insulator-metal capacitors C Vallée, P Gonon, C Jorel, F El Kamel Applied Physics Letters 96 (23), 2010 | 51 | 2010 |
Boron doped diamond films: electrical and optical characterization and the effect of compensating nitrogen R Locher, J Wagner, F Fuchs, C Wild, P Hiesinger, P Gonon, P Koidl Materials Science and Engineering: B 29 (1-3), 211-215, 1995 | 51 | 1995 |
Thermally stimulated currents in polycrystalline diamond films: Application to radiation dosimetry P Gonon, S Prawer, D Jamieson Applied physics letters 70 (22), 2996-2998, 1997 | 48 | 1997 |