Narrow-linewidth lasing and soliton Kerr microcombs with ordinary laser diodes NG Pavlov, S Koptyaev, GV Lihachev, AS Voloshin, AS Gorodnitskiy, ... Nature Photonics 12 (11), 694-698, 2018 | 250 | 2018 |
Apparatus for and method of measuring blood pressure B Chanwook, J Kyoung, MV Riabko, Y Yoon, AD Lantsov, ... US Patent 10,405,806, 2019 | 32 | 2019 |
Interferometric fiber-optic electric current sensor for industrial application NI Starostin, MV Ryabko, YK Chamorovskii, VP Gubin, AI Sazonov, ... Key Engineering Materials 437, 314-318, 2010 | 30 | 2010 |
Hybrid integrated dual-microcomb source NY Dmitriev, SN Koptyaev, AS Voloshin, NM Kondratiev, KN Min’kov, ... Physical Review Applied 18 (3), 034068, 2022 | 29 | 2022 |
Through-focus scanning optical microscopy (TSOM) considering optical aberrations: practical implementation M Ryabko, A Shchekin, S Koptyaev, A Lantsov, A Medvedev, ... Optics Express 23 (25), 32215-32221, 2015 | 25 | 2015 |
Method for optical inspection of nanoscale objects based upon analysis of their defocused images and features of its practical implementation MV Ryabko, SN Koptyaev, AV Shcherbakov, AD Lantsov, SY Oh Optics Express 21 (21), 24483-24489, 2013 | 25 | 2013 |
Miniature microstructured fiber coil with high magneto-optical sensitivity YK Chamorovskiy, NI Starostin, MV Ryabko, AI Sazonov, SK Morshnev, ... Optics Communications 282 (23), 4618-4621, 2009 | 25 | 2009 |
Motion-free all optical inspection system for nanoscale topology control M Ryabko, S Koptyaev, A Shcherbakov, A Lantsov, SY Oh Optics Express 22 (12), 14958-14963, 2014 | 19 | 2014 |
Measuring of an embedded linear birefringence in spun optical fibers SK Morshnev, MV Ryabko, YK Chamorovskii Lasers for Measurements and Information Transfer 2006 6594, 235-243, 2007 | 15 | 2007 |
Optical measurement system and method for measuring critical dimension of nanostructure SN Koptyaev, MV Ryabko, MN Rychagov US Patent 9,360,662, 2016 | 11 | 2016 |
Spun microstructured optical fibresfor Faraday effect current sensors YK Chamorovsky, NI Starostin, SK Morshnev, VP Gubin, MV Ryabko, ... Quantum Electronics 39 (11), 1074, 2009 | 11 | 2009 |
Fiber optic current sensor Y Chamorovskiy, V Gubin, S Morshnev, Y Prziyalkovskiy, M Ryabko, ... US Patent 8,624,579, 2014 | 10 | 2014 |
Микроструктурное оптическое spun-волокно для датчиков тока на основе эффекта Фарадея ЮК Чаморовский, НИ Старостин, СК Моршнев, ВП Губин, МВ Рябко, ... Квантовая электроника 39 (11), 1074-1077, 2009 | 10 | 2009 |
Polarization dispersion in microstructure fibers with side channels MV Ryabko, VA Isaev, YK Chamorovskiĭ, SA Nikitov Optics and Spectroscopy 102, 112-117, 2007 | 9 | 2007 |
Method and device for measuring critical dimension of nanostructure AV Shcherbakov, MV Riabko, AD Lantsov US Patent 9,400,254, 2016 | 7 | 2016 |
Optical measuring system and method of measuring critical size SN Koptyaev, MV Ryabko, AV Shcherbakov, AD Lantsov US Patent 9,322,640, 2016 | 7 | 2016 |
Optical dual-comb source apparatuses including optical microresonator SN Koptyaev, GV Lihachev, NG Pavlov, AA Shchekin, IA Bilenko, ... US Patent 10,224,688, 2019 | 6 | 2019 |
Visible upconversion luminescence of doped bulk silicon for a multimodal wafer metrology BI Afinogenov, AN Sofronov, IM Antropov, NR Filatov, AS Medvedev, ... Optics Letters 46 (13), 3071-3074, 2021 | 4 | 2021 |
Optical detection of deeply subwavelength nanoparticles for silicon metrology A Sofronov, B Afinogenov, A Medvedev, A Shorokhov, M Riabko, ... Physical Review Applied 15 (6), 064049, 2021 | 4 | 2021 |
Improved critical dimension inspection for the semiconductor industry M Ryabko, S Koptyev, A Shchekin, A Medvedev SPIE Newsroom 5515, 2014 | 4 | 2014 |