| An energy-efficient one-shot time-based neural network accelerator employing dynamic threshold error correction in 65 nm LR Everson, M Liu, N Pande, CH Kim IEEE Journal of Solid-State Circuits 54 (10), 2777-2785, 2019 | 34 | 2019 |
| A non-volatile near-memory read mapping accelerator SK Khatamifard, ZI Chowdhury, N Pande, M Razaviyayn, CH Kim, ... arXiv preprint arXiv:1709.02381, 2017 | 18 | 2017 |
| GeNVoM: Read mapping near non-volatile memory SK Khatamifard, Z Chowdhury, N Pande, M Razaviyayn, C Kim, ... IEEE/ACM Transactions on Computational Biology and Bioinformatics 19 (6 …, 2021 | 15 | 2021 |
| A 104.8 TOPS/W one-shot time-based neuromorphic chip employing dynamic threshold error correction in 65nm LR Everson, M Liu, N Pande, CH Kim 2018 IEEE Asian Solid-State Circuits Conference (A-SSCC), 273-276, 2018 | 14 | 2018 |
| Read mapping near non-volatile memory SK Khatamifard, Z Chowdhury, N Pande, M Razaviyayn, C Kim, ... arXiv preprint arXiv:1709.02381, 2017 | 13 | 2017 |
| Characterizing electromigration effects in a 16nm FinFET process using a circuit based test vehicle N Pande, C Zhou, MH Lin, R Fung, R Wong, S Wen, CH Kim 2019 IEEE International Electron Devices Meeting (IEDM), 5.3. 1-5.3. 4, 2019 | 12 | 2019 |
| Understanding the key parameter dependences influencing the soft-error susceptibility of standard combinational logic N Pande, S Kumar, LR Everson, CH Kim IEEE Transactions on Nuclear Science 67 (1), 116-125, 2019 | 11 | 2019 |
| Room temperature ferromagnetism in thermally diffused Cr in GaN P Suggisetti, D Banerjee, R Adari, N Pande, T Patil, S Ganguly, D Saha AIP Advances 3 (3), 2013 | 9 | 2013 |
| Investigating the Aging Dynamics of Diode-connected MOS Devices using an Array-based Characterization Vehicle in a 65nm Process N Pande, G Park, CH Kim, S Krishnan, V Reddy 2019 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2019 | 7 | 2019 |
| A counter based ADC non-linearity measurement circuit and its application to reliability testing G Park, M Kim, N Pande, PW Chiu, J Song, CH Kim 2019 IEEE Custom Integrated Circuits Conference (CICC), 1-4, 2019 | 4 | 2019 |
| On-Chip Heater Design and Control Methodology for Reliability Testing Applications Requiring Over 300° C Local Temperatures H Yu, YH Yi, N Pande, CH Kim IEEE Transactions on Device and Materials Reliability 23 (2), 233-240, 2023 | 3 | 2023 |
| Neutron-Induced Pulsewidth Distribution of Logic Gates Characterized Using a Pulse Shrinking Chain-Based Test Structure N Pande, S Kumar, LR Everson, G Park, I Ahmed, CH Kim IEEE Transactions on Nuclear Science 68 (12), 2736-2747, 2021 | 3 | 2021 |
| Electromigration-induced bit-error-rate degradation of interconnect signal paths characterized from a 16nm test chip N Pande, C Zhou, MH Lin, R Fung, R Wong, S Wen, CH Kim 2021 Symposium on VLSI Technology, 1-2, 2021 | 3 | 2021 |
| A 16nm all-digital hardware monitor for evaluating electromigration effects in signal interconnects through bit-error-rate tracking N Pande, C Zhou, MH Lin, R Fung, R Wong, SJ Wen, CH Kim IEEE Transactions on Device and Materials Reliability 22 (2), 194-204, 2022 | 2 | 2022 |
| Array-Based On-Chip Hardware Monitors for Statistically Efficient Integrated Circuit Reliability Characterization N Pande University of Minnesota, 2020 | | 2020 |
| Large excitonic binding energy in GaN based superluminescent light emitting diode on naturally survived sub-10 nm lateral nanowires D Banerjee, MB Nadar, P Upadhyay, R Singla, S Sankaranarayanan, ... arXiv preprint arXiv:1503.02279, 2015 | | 2015 |
| Inductively Coupled Plasma T Patil, N Pande, RB Adari, P Suggisetti, N Raorane, S Ganguly, ... | | 2012 |
| Dry Etching of GaCrN using Inductively Coupled Cl2/Ar Chemistry T Patil, N Pande, R Adari, P Suggisetti, S Subramanian, S Ganguly, ... | | |
