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| LLM-Powered Static Binary Taint Analysis P Liu, C Sun, Y Zheng, X Feng, C Qin, Y Wang, Z Xu, Z Li, P Di, Y Jiang, ... ACM Transactions on Software Engineering and Methodology, 2025 | 2 | 2025 |
| Automated Flaw Detection for Industrial Robot RESTful Service Y Wang, P Liu, Y Zheng, D Fang, S Si, Z Pan, W Zhang, L Sun International Conference on Verification, Model Checking, and Abstract …, 2025 | | 2025 |
