| An improved read-assist energy efficient single ended PPN based 10T SRAM cell for wireless sensor network P Sanvale, N Gupta, V Neema, AP Shah, SK Vishvakarma Microelectronics Journal 92, 104611, 2019 | 59 | 2019 |
| Stable, reliable, and bit-interleaving 12T SRAM for space applications: A device circuit co-design N Yadav, AP Shah, SK Vishvakarma IEEE Transactions on Semiconductor Manufacturing 30 (3), 276-284, 2017 | 57 | 2017 |
| On-chip adaptive body bias for reducing the impact of NBTI on 6T SRAM cells AP Shah, N Yadav, A Beohar, SK Vishvakarma IEEE Transactions on Semiconductor Manufacturing 31 (2), 242-249, 2018 | 48 | 2018 |
| Soft error hardened asymmetric 10T SRAM cell for aerospace applications AP Shah, SK Vishvakarma, M Hübner Journal of Electronic Testing 36, 255-269, 2020 | 30 | 2020 |
| An ultra-low power, reconfigurable, aging resilient RO PUF for IoT applications S Khan, AP Shah, N Gupta, SS Chouhan, JG Pandey, SK Vishvakarma Microelectronics journal 92, 104605, 2019 | 30 | 2019 |
| Process variation and NBTI resilient Schmitt trigger for stable and reliable circuits AP Shah, N Yadav, A Beohar, SK Vishvakarma IEEE Transactions on Device and Materials Reliability 18 (4), 546-554, 2018 | 28 | 2018 |
| A reliable, multi-bit error tolerant 11T SRAM memory design for wireless sensor nodes V Sharma, N Gupta, AP Shah, SK Vishvakarma, SS Chouhan Analog Integrated Circuits and Signal Processing 107 (2), 339-352, 2021 | 27 | 2021 |
| Utilizing manufacturing variations to design a tri-state flip-flop PUF for IoT security applications S Khan, AP Shah, SS Chouhan, S Rani, N Gupta, JG Pandey, ... Analog Integrated Circuits and Signal Processing 103 (3), 477-492, 2020 | 23 | 2020 |
| Dual threshold voltage and sleep switch dual threshold voltage DOIND approach for leakage reduction in domino logic circuits AP Shah, V Neema, S Daulatabad, P Singh Microsystem Technologies 25, 1639-1652, 2019 | 22 | 2019 |
| An efficient NBTI sensor and compensation circuit for stable and reliable SRAM cells AP Shah, N Yadav, A Beohar, SK Vishvakarma Microelectronics Reliability 87, 15-23, 2018 | 21 | 2018 |
| A symmetric D flip-flop based PUF with improved uniqueness S Khan, AP Shah, SS Chouhan, N Gupta, JG Pandey, SK Vishvakarma Microelectronics Reliability 106, 113595, 2020 | 19 | 2020 |
| Analog/RF characteristics of a 3D-Cyl underlap GAA-TFET based on a Ge source using fringing-field engineering for low-power applications A Beohar, N Yadav, AP Shah, SK Vishvakarma Journal of Computational Electronics 17 (4), 1650-1657, 2018 | 18 | 2018 |
| Efficient CZTSSe thin film solar cell employing MoTe2/MoS2 as hole transport layer A Kannaujiya, AK Patel, S Kannaujiya, AP Shah Micro and Nanostructures 169, 207356, 2022 | 17 | 2022 |
| QCA based cost efficient coplanar 1× 4 RAM design with set/reset ability SF Naz, S Ahmed, SB Ko, AP Shah, S Sharma International Journal of Numerical Modelling: Electronic Networks, Devices …, 2022 | 17 | 2022 |
| Effect of process, voltage and temperature (PVT) variations In LECTOR-B (leakage reduction technique) at 70 nm technology node AP Shah, V Neema, S Daulatabad 2015 International Conference on Computer, Communication and Control (IC4), 1-6, 2015 | 16 | 2015 |
| An energy‐efficient data‐dependent low‐power 10T SRAM cell design for LiFi enabled smart street lighting system application N Gupta, V Sharma, AP Shah, S Khan, M Huebner, SK Vishvakarma International Journal of Numerical Modelling: Electronic Networks, Devices …, 2020 | 13 | 2020 |
| 8-bit 250-MS/s ADC Based on SAR Architecture with Novel Comparator at 70 nm Technology Node S Daulatabad, V Neema, AP Shah, P Singh Procedia Computer Science 79, 589-596, 2016 | 13 | 2016 |
| Next generation QCA technology based true random number generator for cryptographic applications MM Fazili, MF Shah, SF Naz, AP Shah Microelectronics Journal 126, 105502, 2022 | 12 | 2022 |
| Radiation hardened 12T SRAM cell with improved writing capability for space applications R Sharma, D Mondal, AP Shah Memories-Materials, Devices, Circuits and Systems 5, 100071, 2023 | 11 | 2023 |
| BTI and soft-error tolerant voltage bootstrapped Schmitt trigger circuit N Gupta, AP Shah, SK Vishvakarma IEEE Transactions on Device and Materials Reliability 21 (1), 153-155, 2021 | 11 | 2021 |
Dr. Santosh Kumar VishvakarmaIndian Institute of Technology Indoreiiti.ac.in의 이메일 확인됨