| A simple frequency response compensation method for current probe measurements of ESD currents S Yang, J Zhou, D Pommerenke, D Liu 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal …, 2017 | 29 | 2017 |
| Transient analysis of ESD protection circuits for high-speed ICs JS Meiguni, J Zhou, G Maghlakelidze, Y Xu, OH Izadi, S Marathe, L Shen, ... IEEE Transactions on Electromagnetic Compatibility 63 (5), 1312-1321, 2021 | 27 | 2021 |
| Characterization of ESD risk for wearable devices J Zhou, K Ghosh, S Xiang, X Yan, A Hosseinbeig, J Lee, D Pommerenke IEEE Transactions on Electromagnetic Compatibility 60 (5), 1313-1321, 2018 | 27 | 2018 |
| IEC 61000-4-2 ESD test in display down configurationfor cell phones J Zhou, S Shinde, Y Guo, A Talebzadeh, S Marathe, Y Gan, KH Kim, ... 2016 IEEE International Symposium on Electromagnetic Compatibility (EMC …, 2016 | 20 | 2016 |
| TVS devices transient behavior modeling framework and application to SEED L Shen, S Marathe, J Meiguni, G Luo, J Zhou, D Pommerenke 2019 41st Annual EOS/ESD Symposium (EOS/ESD), 1-10, 2019 | 16 | 2019 |
| An application of system level efficient ESD design for highspeed USB3. x interface P Wei, G Maghlakelidze, J Zhou, H Gossner, D Pommerenke 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD …, 2018 | 16 | 2018 |
| Methodology for analyzing ESD-induced soft failure using full-wave simulation and measurement A Hosseinbeig, OH Izadi, S Solanki, TD Lingayat, BP Subramanya, ... IEEE Transactions on Electromagnetic Compatibility 61 (1), 11-19, 2018 | 16 | 2018 |
| Measurement techniques to identify soft failure sensitivity to ESD J Zhou, Y Guo, S Shinde, A Hosseinbeig, A Patnaik, OH Izadi, C Zeng, ... IEEE transactions on electromagnetic compatibility 62 (4), 1007-1016, 2019 | 15 | 2019 |
| Transient response of ESD protection devices for a high-speed I/O interface J Zhou, Y Xu, S Bub, S Holland, JS Meiguni, D Pommerenke, DG Beetner IEEE Transactions on Electromagnetic Compatibility 64 (4), 907-914, 2022 | 13 | 2022 |
| An ESD demonstrator system for evaluating the ESD risks of wearable devices J Zhou, Z Legenzoff, X Yan, S Yang, S Xiang, S Shinde, J Lee, ... 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 1-7, 2017 | 12 | 2017 |
| On secondary ESD event monitoring and full-wave modeling methodology S Marathe, D Li, A Hosseinbeig, H Rezaei, P Wei, J Zhou, D Pommerenke 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 1-6, 2017 | 12 | 2017 |
| ESD to the display inducing currents measured using a substitution PC board S Shinde, J Zhou, S Marathe, A Talebzadeh, Y Gan, D Pommerenke, ... 2016 IEEE International Symposium on Electromagnetic Compatibility (EMC …, 2016 | 11 | 2016 |
| Electrostatic charging of a human body caused by activities and material combinations in hospitals M Kohani, D Pommerenke, L Kinslow, A Bhandare, L Guan, J Zhou, ... IEEE Transactions on Electromagnetic Compatibility 62 (2), 315-323, 2019 | 10 | 2019 |
| Race conditions among protection devices for a high speed I/O interface J Zhou, J Meiguni, S Bub, S Holland, G Notermans, Y Xu, ... 2020 42nd Annual EOS/ESD Symposium (EOS/ESD), 1-6, 2020 | 9 | 2020 |
| Detection of ESD-induced soft failures by analyzing linux kernel function calls X Liu, G Maghlakelidze, J Zhou, OH Izadi, L Shen, M Pommerenke, SS Ge, ... IEEE Transactions on Device and Materials Reliability 20 (1), 128-135, 2020 | 9 | 2020 |
| A 20 GHz landing probe design based on pogo-pins X Yan, Y Wang, J ZhOU, T Li, J Fan 2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and …, 2018 | 8 | 2018 |
| Transient electromagnetic co-simulation of electrostatic air discharge DZ Li, J Zhou, A Hosseinbeig, D Pommerenke 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 1-8, 2017 | 8 | 2017 |
| ESD susceptibility evaluation on capacitive fingerprint module P Wei, S Marathe, J Zhou, D Pommerenke 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal …, 2017 | 8 | 2017 |
| Improved SEED Modeling of an ESD Discharge to a USB Cable Y Xu, J Zhou, S Bub, S Holland, JS Meiguni, D Pommerenke, DG Beetner IEEE Transactions on Electromagnetic Compatibility 65 (3), 625-633, 2023 | 7 | 2023 |
| Design of an artificial dummy for human metal model ESD GX Luo, K Huang, JC Zhou, W Zhang, D Pommerenke, J Holliman IEEE Transactions on Electromagnetic Compatibility 63 (1), 319-323, 2020 | 7 | 2020 |