| Reliability modeling and analysis of hot-carrier degradation in multiple-fin SOI n-channel FinFETs with self-heating A Gupta, C Gupta, RA Vega, TB Hook, A Dixit IEEE Transactions on Electron Devices 66 (5), 2075-2080, 2019 | 41 | 2019 |
| 3-D LER and RDF Matching Performance of Nanowire- FETs in Inversion, Accumulation, and Junctionless-modes AD Anil Kumar Bansal, Charu Gupta, Anshul Gupta, Ramendra Singh, Terence B Hook IEEE Transactions on Electron Devices, 2018 | 38 | 2018 |
| Investigation of Hot-Carrier Degradation in 0.18- m MOSFETs for the Evaluation of Device Lifetime and Digital Circuit Performance A Gupta, C Gupta, HS Jatana, A Dixit IEEE Transactions on Device and Materials Reliability 19 (4), 609-614, 2019 | 32 | 2019 |
| Series Resistance Reduction with Linearity Assessment for Vertically Stacked Junctionless Accumulation Mode Nanowire FET AD Anil Kumar Bansal, Manoj Kumar, Charu Gupta, Terence B Hook IEEE Transactions on Electron Devices, 2018 | 27 | 2018 |
| Single event transients in sub-10nm SOI MuGFETs due to heavy-ion irradiation CK Jha, K Aditya, C Gupta, A Gupta, A Dixit IEEE Transactions on Device and Materials Reliability 20 (2), 395-403, 2020 | 16 | 2020 |
| Alternatives for Doping in Nanoscale Field‐Effect Transistors F Riederer, T Grap, S Fischer, MR Mueller, D Yamaoka, B Sun, C Gupta, ... physica status solidi (a) 215 (7), 1700969, 2018 | 16 | 2018 |
| Impact of hot-carrier degradation on drain-induced barrier lowering in multifin SOI n-channel FinFETs with self-heating C Gupta, A Gupta, RA Vega, TB Hook, A Dixit IEEE Transactions on Electron Devices 67 (5), 2208-2212, 2020 | 13 | 2020 |
| Analytical modeling of parasitic capacitance in inserted-oxide FinFETs R Singh, A Gupta, C Gupta, AK Bansal, TB Hook, A Dixit IEEE Transactions on Electron Devices 64 (12), 5274-5278, 2017 | 12 | 2017 |
| Impact of LER on Mismatch in Nanosheet Transistors for 5nm-CMOS CK Jha, C Gupta, A Gupta, RA Vega, A Dixit 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-4, 2020 | 10 | 2020 |
| Comparison of LER induced mismatch in NWFET and NSFET for 5-nm CMOS CK Jha, P Yogi, C Gupta, A Gupta, RA Vega, A Dixit IEEE Journal of the Electron Devices Society 8, 1184-1192, 2020 | 8 | 2020 |
| Characterization and Modeling of Hot Carrier Degradation in N-Channel Gate-All-Around Nanowire FETs C Gupta, A Gupta, S Tuli, E Bury, B Parvais, A Dixit IEEE Transactions on Electron Devices 67 (1), 4 - 10, 2019 | 8 | 2019 |
| Suppression of short-channel effects by double-gate double-channel device design in normally-off AlGaN/GaN MIS-HEMTs C Gupta, A Gupta, AK Bansal, A Dixit IETE Journal of Research 67 (3), 425-432, 2021 | 5 | 2021 |
| Time evolution of DIBL in gate-all-around nanowire MOSFETs during hot-carrier stress A Gupta, C Gupta, A Veloso, B Parvais, A Dixit IEEE Transactions on Electron Devices 68 (6), 2641-2646, 2021 | 4 | 2021 |
| Stressor efficacy and mobility enhancement in N-channel nanowire FETs A Gupta, C Gupta, AK Bansal, A Dixit 2017 International Conference on Electron Devices and Solid-State Circuits …, 2017 | 4 | 2017 |
| Impact of Hot Carrier Degradation on GIDL Current in 45nm SOI-NFETs C Gupta, A Gupta, A Dixit 2019 IEEE International Integrated Reliability Workshop (IIRW), 1-4, 2019 | 3 | 2019 |
| Impact of hot carrier injection on total ionizing dose effect of 10-nm N-channel bulk FinFETs P Yogi, M Kumar, K Aditya, C Gupta, A Dixit 2020 5th IEEE International Conference on Emerging Electronics (ICEE), 1-4, 2020 | 2 | 2020 |
| A physics based model for DC self-heating in nanowire-FET considering lattice temperature M Kumar, AK Bansal, K Aditya, C Gupta, A Gupta, A Dixit 2018 4th IEEE International Conference on Emerging Electronics (ICEE), 1-5, 2018 | 1 | 2018 |
| Gate topologies for mitigation of short channel effects in highly scaled AlGaN/GaN HEMTs C Gupta, A Gupta, AK Bansal, A Dixit 2017 International Conference on Electron Devices and Solid-State Circuits …, 2017 | 1 | 2017 |
| Buried multi-gate InAs-nanowire FETs T Grap, F Riederer, C Gupta, J Knoch 2017 47th European Solid-State Device Research Conference (ESSDERC), 82-85, 2017 | 1 | 2017 |
| Impact of Hot Carrier Stress on RF FOMs in 10-nm Bulk N-Channel FinFETs A Gupta, C Gupta, RA Vega, A Dixit 2019 IEEE International Integrated Reliability Workshop (IIRW), 1-4, 2019 | | 2019 |
Abhisek DixitNXP Chair Professor, Electrical Engineering, IIT Delhi, New Delhi, IndiaPatvirtintas el. paštas ee.iitd.ac.in
