| Deepfl: Integrating multiple fault diagnosis dimensions for deep fault localization X Li, W Li, Y Zhang, L Zhang Proceedings of the 28th ACM SIGSOFT international symposium on software …, 2019 | 331 | 2019 |
| Deepbillboard: Systematic physical-world testing of autonomous driving systems H Zhou, W Li, Z Kong, J Guo, Y Zhang, B Yu, L Zhang, C Liu Proceedings of the ACM/IEEE 42nd International Conference on Software …, 2020 | 166 | 2020 |
| Understanding graphs in EDA: From shallow to deep learning Y Ma, Z He, W Li, L Zhang, B Yu Proceedings of the 2020 international symposium on physical design, 119-126, 2020 | 53 | 2020 |
| Openmpl: An open-source layout decomposer W Li, Y Ma, Q Sun, L Zhang, Y Lin, IHR Jiang, B Yu, DZ Pan IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2020 | 18 | 2020 |
| Fit: Fill insertion considering timing B Jiang, X Zhang, R Chen, G Chen, P Tu, W Li, EFY Young, B Yu Proceedings of the 56th Annual Design Automation Conference 2019, 1-6, 2019 | 14 | 2019 |
| Adaptive layout decomposition with graph embedding neural networks W Li, Y Ma, Y Lin, B Yu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2022 | 11 | 2022 |
| Rethinking graph neural networks for the graph coloring problem W Li, R Li, Y Ma, SO Chan, D Pan, B Yu arXiv preprint arXiv:2208.06975, 2022 | 10 | 2022 |
| Learning point clouds in eda W Li, G Chen, H Yang, R Chen, B Yu Proceedings of the 2021 International Symposium on Physical Design, 55-62, 2021 | 9 | 2021 |
| TreeNet: Deep point cloud embedding for routing tree construction W Li, Y Qu, G Chen, Y Ma, B Yu Proceedings of the 26th Asia and South Pacific Design Automation Conference …, 2021 | 5 | 2021 |
| A unified approximation framework for deep neural networks Y Ma, R Chen, W Li, F Shang, W Yu, M Cho, B Yu arXiv preprint arXiv:1807.10119, 2018 | 3 | 2018 |
| PEPR: Pseudo-Exhaustive Physically-Aware Region Testing W Li, C Nigh, D Duvalsaint, S Mitra, RD Blanton 2022 IEEE International Test Conference (ITC), 314-323, 2022 | 2 | 2022 |
| Faulty Function Extraction for Defective Circuits C Nigh, R Purdy, W Li, S Mitra, RD Blanton 2024 IEEE European Test Symposium (ETS), 1-6, 2024 | 1 | 2024 |
| Global Floorplanning via Semidefinite Programming W Li, F Wang, JMF Moura, RD Blanton 2023 60th ACM/IEEE Design Automation Conference (DAC), 1-6, 2023 | 1 | 2023 |
| Silent Data Corruption: Test or Reliability Problem? EJ Marinissen, HD Dixit, S Blanton, A Kuo, W Li, S Mitra, C Nigh, R Purdy, ... 2024 IEEE European Test Symposium (ETS), 1-7, 2024 | | 2024 |
| Characterize the ability of GNNs in attacking logic locking W Li, R Purdy, JMF Moura, RD Blanton 2023 ACM/IEEE 5th Workshop on Machine Learning for CAD (MLCAD), 1-6, 2023 | | 2023 |
