| Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters JW Pinder, GH Major, DR Baer, J Terry, JE Whitten, J Čechal, ... Applied Surface Science Advances 19, 100534, 2024 | 49 | 2024 |
| Perspective on improving the quality of surface and material data analysis in the scientific literature with a focus on x-ray photoelectron spectroscopy (XPS) GH Major, JW Pinder, DE Austin, DR Baer, SL Castle, J Čechal, BM Clark, ... Journal of Vacuum Science & Technology A 41 (3), 2023 | 32 | 2023 |
| A practical guide to interpreting low energy ion scattering (LEIS) spectra S Průša, MR Linford, E Vaníčková, P Bábík, JW Pinder, T Šikola, ... Applied Surface Science 657, 158793, 2024 | 13 | 2024 |
| New challenges associated with hard X‐ray photoelectron spectroscopy (report on the 2023 ASTM E42‐ASSD AVS workshop) A Herrera‐Gomez, DJH Cant, T Conard, O Renault, MR Linford, ... Surface and Interface Analysis 56 (10), 730-736, 2024 | 2 | 2024 |
| Controlling the surface silanol density in capillary columns and planar silicon via the self-limiting, gas-phase deposition of tris (dimethylamino) methylsilane, and … B Moeini, JW Pinder, TG Avval, C Jacobsen, HH Brongersma, S Průša, ... Journal of Chromatography A 1707, 464248, 2023 | 2 | 2023 |
| Much ado about nothing? Background anomalies without accompanying primary peaks in X‐ray photoelectron spectroscopy and low energy Ion scattering JW Pinder, M Malatinova, M Kovařík, DE Austin, T Šikola, S Tougaard, ... Surface and Interface Analysis, 2025 | | 2025 |
| Introduction to the Special Issue: Modern Methods and Avoiding Errors in Surface Analysis JW Pinder, JD Crossman, B Kulbacki, MA van Spronsen, J Baltrusaitis, ... Applied Surface Science Advances 25, 100682, 2025 | | 2025 |
| Following the propagation of erroneous x-ray photoelectron spectroscopy peak fitting through the literature. A genealogical approach BM Clark, GH Major, JW Pinder, DE Austin, DR Baer, MC Biesinger, ... Journal of Vacuum Science & Technology A 42 (6), 2024 | | 2024 |
| Introduction to the Special Collection for the Society of Vacuum Coaters' 66th Annual Technical Conference JW Pinder, J Crossman, B Kulbacki, MR Linford Surface and Coatings Technology, 131259, 2024 | | 2024 |
| Development and Use of a 3D Printed Alignment Jig for Repositioning Samples in Spectroscopic Ellipsometry JD Crossman, JW Pinder, CD Boss, MR Linford | | |
| 1J. A. Woollam Co., Inc., Lincoln, NE USA; 2Department of Chemistry and Biochemistry, Brigham Young University, Provo, UT USA J Van Derslice, JN Hilfiker, JW Pinder, MR Linford | | |
| Introducing the Savitzky-Golay (SG) Smooth, Including Generating SG Kernels Using Basic Matrix Algebra. Part 2 JD Crossman, JW Pinder, MR Linford | | |
| Introducing the Savitzky-Golay (SG) Smooth Using Basic Matrix Algebra, Including Generating SG Kernels. Part JW Pinder, JD Crossman, MR Linford | | |
| In Situ Spectroscopic Ellipsometry J Van Derslice, JN Hilfiker, JW Pinder, MR Linford | | |