| A survey of the advancing use and development of machine learning in smart manufacturing M Sharp, R Ak, T Hedberg Jr Journal of manufacturing systems 48, 170-179, 2018 | 317 | 2018 |
| Testing the Digital Thread in Support of Model-Based Manufacturing and Inspection TD Hedberg Jr., J Lubell, L Fischer, L Maggiano, A Barnard Feeney Journal of Computing and Information Science in Engineering 16 (2), 2016 | 173 | 2016 |
| Enabling Smart Manufacturing Research and Development using a Product Lifecycle Test Bed M Helu, T Hedberg Jr Procedia Manufacturing, 2015 | 109 | 2015 |
| Reference architecture to integrate heterogeneous manufacturing systems for the digital thread M Helu, T Hedberg Jr, AB Feeney CIRP journal of manufacturing science and technology 19, 191-195, 2017 | 90 | 2017 |
| Toward knowledge management for smart manufacturing SC Feng, WZ Bernstein, T Hedberg, A Barnard Feeney Journal of computing and information science in engineering 17 (3), 031016, 2017 | 89 | 2017 |
| Promoting Model-Based Definition to Establish a Complete Product Definition SP Ruemler, KE Zimmerman, NW Hartman, T Hedberg, ... Journal of Manufacturing Science and Engineering 139 (5), 051008-051008-7, 2016 | 85 | 2016 |
| Identified research directions for using manufacturing knowledge earlier in the product life cycle TD Hedberg Jr, NW Hartman, P Rosche, K Fischer International journal of production research 55 (3), 819-827, 2017 | 74 | 2017 |
| Towards a Lifecycle Information Framework and Technology in Manufacturing T Hedberg Jr, A Barnard Feeney, M Helu, J Camelio Journal of Computing and Information Science in Engineering, 2016 | 68 | 2016 |
| Using graphs to link data across the product lifecycle for enabling smart manufacturing digital threads TD Hedberg Jr, M Bajaj, JA Camelio Journal of computing and information science in engineering 20 (1), 011011, 2020 | 60 | 2020 |
| A standards-based approach for linking as-planned to as-fabricated product data M Helu, A Joseph, T Hedberg Jr CIRP Annals 67 (1), 487-490, 2018 | 60 | 2018 |
| Contextualising manufacturing data for lifecycle decision-making WZ Bernstein, TD Hedberg Jr, M Helu, AB Feeney International journal of product lifecycle management 10 (4), 326-347, 2017 | 51 | 2017 |
| System lifecycle handler—spinning a digital thread for manufacturing M Bajaj, T Hedberg Jr INCOSE International Symposium 28 (1), 1636-1650, 2018 | 45 | 2018 |
| Gaps analysis of integrating product design, manufacturing, and quality data in the supply chain using model-based defintion A Trainer, T Hedberg Jr, A Barnard Feeney, K Fischer, P Rosche International Manufacturing Science and Engineering Conference 49903 …, 2016 | 36 | 2016 |
| Towards Identifying the Elements of a Minimum Information Model for Use in a Model-Based Definition AMD Miller, NW Hartman, T Hedberg, A Barnard Feeney, J Zahner ASME 2017 12th International Manufacturing Science and Engineering …, 2017 | 34 | 2017 |
| Interoperability: linking design and tolerancing with metrology E Morse, S Heysiattalab, A Barnard-Feeney, T Hedberg Jr Procedia CIRP 43, 13-16, 2016 | 33 | 2016 |
| Embedding X.509 Digital Certificates in Three-Dimensional Models for Authentication, Authorization, and Traceability of Product Data T Hedberg Jr, S Krima, J Camelio Journal of Computing and Information Science in Engineering, 2016 | 29 | 2016 |
| Investigating the Impact of Standards-Based Interoperability for Design to Manufacturing and Quality in the Supply Chain K Fischer, P Rosche, A Trainer, AB Feeney, TD Hedberg http://dx.doi.org/10.6028/NIST.GCR.15-1009, 2015 | 23 | 2015 |
| Defining requirements for integrating information between design, manufacturing, and inspection TD Hedberg Jr, ME Sharp, TMM Maw, MM Helu, MM Rahman, S Jadhav, ... International journal of production research 60 (11), 3339-3359, 2022 | 19 | 2022 |
| Method for enabling a root of trust in support of product data certification and traceability TD Hedberg Jr, S Krima, JA Camelio Journal of computing and information science in engineering 19 (4), 041003, 2019 | 19 | 2019 |
| Securing the digital threat for smart manufacturing: A reference model for blockchain-based product data traceability S Krima, S Krima, T Hedberg, AB Feeney US Department of Commerce, National Institute of Standards and Technology, 2019 | 17 | 2019 |
Allison Barnard FeeneyNISTPatvirtintas el. paštas nist.gov
