| Soft errors induced by high-energy electrons MJ Gadlage, AH Roach, AR Duncan, AM Williams, DP Bossev, MJ Kay IEEE Transactions on Device and Materials Reliability 17 (1), 157-162, 2016 | 88 | 2016 |
| FPGA bitstream security: a day in the life A Duncan, F Rahman, A Lukefahr, F Farahmandi, M Tehranipoor 2019 IEEE International test conference (ITC), 1-10, 2019 | 52 | 2019 |
| Electron-induced single-event upsets in 45-nm and 28-nm bulk CMOS SRAM-based FPGAs operating at nominal voltage MJ Gadlage, AH Roach, AR Duncan, MW Savage, MJ Kay IEEE Transactions on Nuclear Science 62 (6), 2717-2724, 2015 | 52 | 2015 |
| Single-event mitigation in combinational logic using targeted data path hardening V Srinivasan, AL Sternberg, AR Duncan, WH Robinson, BL Bhuva, ... IEEE transactions on nuclear science 52 (6), 2516-2523, 2005 | 46 | 2005 |
| Effect of accumulated charge on the total ionizing dose response of a NAND flash memory MJ Kay, MJ Gadlage, AR Duncan, D Ingalls, A Howard, TR Oldham IEEE Transactions on Nuclear Science 59 (6), 2945-2951, 2012 | 27 | 2012 |
| Multiple-cell upsets induced by single high-energy electrons MJ Gadlage, AH Roach, AR Duncan, AM Williams, DP Bossev, MJ Kay IEEE Transactions on Nuclear Science 65 (1), 211-216, 2017 | 23 | 2017 |
| Leakage current degradation of gallium nitride transistors due to heavy ion tests BD Olson, JD Ingalls, CH Rice, CC Hedge, PL Cole, AR Duncan, ... 2015 IEEE Radiation Effects Data Workshop (REDW), 1-10, 2015 | 22 | 2015 |
| Impact of X-ray exposure on a triple-level-cell NAND flash MJ Gadlage, MJ Kay, JD Ingalls, AR Duncan, SA Ashley IEEE Transactions on Nuclear Science 60 (6), 4533-4539, 2013 | 19 | 2013 |
| Simulation study on the effect of multiple node charge collection on error cross-section in CMOS sequential logic MC Casey, AR Duncan, BL Bhuva, WH Robinson, LW Massengill IEEE Transactions on Nuclear Science 55 (6), 3136-3140, 2008 | 18 | 2008 |
| Interrupted PROGRAM and ERASE operations for characterizing radiation effects in commercial NAND flash memories AH Roach, MJ Gadlage, AR Duncan, JD Ingalls, MJ Kay IEEE Transactions on Nuclear Science 62 (6), 2390-2397, 2015 | 17 | 2015 |
| Preliminary radiation testing of a state-of-the-art commercial 14nm cmos processor/system-on-a-chip CM Szabo, A Duncan, KA LaBel, M Kay, P Bruner, M Krzesniak, L Dong 2015 IEEE Radiation Effects Data Workshop (REDW), 1-8, 2015 | 14 | 2015 |
| Repurposing SoC analog circuitry for additional COTS hardware security A Duncan, L Jiang, M Swany 2018 IEEE International Symposium on Hardware Oriented Security and Trust …, 2018 | 13 | 2018 |
| Characterizing radiation and stress-induced degradation in an embedded split-gate NOR flash memory AR Duncan, MJ Gadlage, AH Roach, MJ Kay IEEE Transactions on Nuclear Science 63 (2), 1276-1283, 2016 | 13 | 2016 |
| Impact of neutron-induced displacement damage on the multiple bit upset sensitivity of a bulk CMOS SRAM MJ Gadlage, MJ Kay, AR Duncan, MW Savage, JD Ingalls, ... IEEE Transactions on Nuclear Science 59 (6), 2722-2728, 2012 | 11 | 2012 |
| FLATS: filling logic and testing spatially for FPGA authentication and tamper detection A Duncan, G Skipper, A Stern, A Nahiyan, F Rahman, A Lukefahr, ... 2019 IEEE international symposium on hardware oriented security and trust …, 2019 | 10 | 2019 |
| Using charge accumulation to improve the radiation tolerance of multi-Gb NAND flash memories MJ Kay, MJ Gadlage, AR Duncan, JD Ingalls, MW Savage IEEE Transactions on Nuclear Science 60 (6), 4214-4219, 2013 | 9 | 2013 |
| SeRFI: secure remote FPGA initialization in an untrusted environment A Duncan, A Nahiyan, F Rahman, G Skipper, M Swany, A Lukefahr, ... 2020 IEEE 38th VLSI Test Symposium (VTS), 1-6, 2020 | 8 | 2020 |
| Combination metal oxide semi-conductor field effect transistor (MOSFET) and junction field effect transistor (JFET) operable for modulating current voltage response or … JL Titus, M Savage, PL Cole, AR Duncan US Patent 9,595,519, 2017 | 8 | 2017 |
| Low-energy electron irradiation of NAND flash memories MJ Gadlage, AH Roach, JM Labello, MR Halstead, MJ Kay, AR Duncan, ... IEEE Transactions on Nuclear Science 64 (1), 212-217, 2016 | 8 | 2016 |
| Digital test system M Gadlage, A Duncan US Patent 9,431,133, 2016 | 8 | 2016 |
