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Matias Kagias
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Metal assisted chemical etching of silicon in the gas phase: A nanofabrication platform for X-ray optics
L Romano, M Kagias, J Vila-Comamala, K Jefimovs, LT Tseng, ...
Nanoscale Horizons 5 (5), 869-879, 2020
842020
2D-Omnidirectional hard-X-ray scattering sensitivity in a single shot
M Kagias, Z Wang, P Villanueva-Perez, K Jefimovs, M Stampanoni
Physical Review Letters 116 (9), 093902, 2016
672016
Dual phase grating interferometer for tunable dark-field sensitivity
M Kagias, Z Wang, K Jefimovs, M Stampanoni
Applied Physics Letters 110 (1), 2017
632017
Micrometer-resolution imaging using MÖNCH: towards G2-less grating interferometry
S Cartier*, M Kagias*, A Bergamaschi, Z Wang, R Dinapoli, A Mozzanica, ...
Journal of synchrotron radiation 23 (6), 1462-1473, 2016
562016
Towards sub-micrometer high aspect ratio X-ray gratings by atomic layer deposition of iridium
J Vila-Comamala, L Romano, V Guzenko, M Kagias, M Stampanoni, ...
Microelectronic Engineering 192, 19-24, 2018
482018
Sub-pixel correlation length neutron imaging: Spatially resolved scattering information of microstructures on a macroscopic scale
RP Harti, M Strobl, B Betz, K Jefimovs, M Kagias, C Grünzweig
Scientific Reports 7 (1), 44588, 2017
482017
Diffractive small angle X-ray scattering imaging for anisotropic structures
M Kagias, Z Wang, ME Birkbak, E Lauridsen, M Abis, G Lovric, K Jefimovs, ...
Nature communications 10 (1), 5130, 2019
452019
Fabrication of Au gratings by seedless electroplating for X-ray grating interferometry
M Kagias, Z Wang, VA Guzenko, C David, M Stampanoni, K Jefimovs
Materials Science in Semiconductor Processing 92, 73-79, 2019
442019
Self-assembly nanostructured gold for high aspect ratio silicon microstructures by metal assisted chemical etching
L Romano, M Kagias, K Jefimovs, M Stampanoni
Rsc Advances 6 (19), 16025-16029, 2016
442016
Interpretation and utility of the moments of small-angle x-ray scattering distributions
P Modregger, M Kagias, SC Irvine, R Brönnimann, K Jefimovs, M Endrizzi, ...
Physical review letters 118 (26), 265501, 2017
402017
High aspect ratio metal microcasting by hot embossing for X-ray optics fabrication
L Romano, J Vila-Comamala, M Kagias, K Vogelsang, H Schift, ...
Microelectronic Engineering 176, 6-10, 2017
362017
X-ray scattering tensor tomography with circular gratings
J Kim, M Kagias, F Marone, M Stampanoni
Applied Physics Letters 116 (13), 2020
352020
High-aspect ratio silicon structures by displacement Talbot lithography and Bosch etching
K Jefimovs, L Romano, J Vila-Comamala, M Kagias, Z Wang, L Wang, ...
Advances in Patterning Materials and Processes XXXIV 10146, 140-146, 2017
322017
Anisotropic de Gennes narrowing in confined fluids
K Nygård, J Buitenhuis, M Kagias, K Jefimovs, F Zontone, Y Chushkin
Physical review letters 116 (16), 167801, 2016
312016
Macroscopic mapping of microscale fibers in freeform injection molded fiber-reinforced composites using X-ray scattering tensor tomography
J Kim, A Slyamov, E Lauridsen, M Birkbak, T Ramos, F Marone, ...
Composites Part B: Engineering 233, 109634, 2022
202022
Single shot x-ray phase contrast imaging using a direct conversion microstrip detector with single photon sensitivity
M Kagias, S Cartier, Z Wang, A Bergamaschi, R Dinapoli, A Mozzanica, ...
Applied Physics Letters 108 (23), 2016
202016
Tunable X-ray dark-field imaging for sub-resolution feature size quantification in porous media
BK Blykers, C Organista, MN Boone, M Kagias, F Marone, M Stampanoni, ...
Scientific reports 11 (1), 18446, 2021
192021
Fabrication of x-ray gratings for interferometric imaging by conformal seedless gold electroplating
K Jefimovs, J Vila-Comamala, C Arboleda, Z Wang, L Romano, Z Shi, ...
Micromachines 12 (5), 517, 2021
192021
Characterization of oriented microstructures through anisotropic small-angle scattering by 2D neutron dark-field imaging
J Valsecchi, M Strobl, RP Harti, C Carminati, P Trtik, A Kaestner, ...
Communications Physics 3 (1), 42, 2020
192020
Modeling of beam hardening effects in a dual-phase X-ray grating interferometer for quantitative dark-field imaging
A Pandeshwar, M Kagias, Z Wang, M Stampanoni
Optics Express 28 (13), 19187-19204, 2020
172020
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