Md Mahbub Alam

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Domenic ForteProfessor of ECE, University of FloridaGeverifieerd e-mailadres voor ece.ufl.edu
Mark M. TehranipoorIntel Charles E. Young Endowed Chair Professor, ECE, University of FloridaGeverifieerd e-mailadres voor ufl.edu
Fatemeh (Saba) GanjiAssistant Professor of ECE, Worcester Polytechnic Institute (WPI)Geverifieerd e-mailadres voor wpi.edu
Shahin TajikAssistant Professor, Worcester Polytechnic Institute (WPI)Geverifieerd e-mailadres voor wpi.edu
Sreeja ChowdhuryCadence Design Systems, ex-Ansys, ex-University of FloridaGeverifieerd e-mailadres voor cadence.com
Beomsoo ParkQualcommGeverifieerd e-mailadres voor ufl.edu
Nima MaghariAssociate Professor, University of FloridaGeverifieerd e-mailadres voor ece.ufl.edu
Haoting ShenComputer Science and Engineering Department, University of Nevada, RenoGeverifieerd e-mailadres voor unr.edu

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Md Mahbub Alam

University of Florida

Geverifieerd e-mailadres voor ufl.edu

Hardware security and Trust VLSI design and test FPGA security IC supply Chain vulnerabilities IoT security.


Titel Sorteren op citaties Sorteren op jaar Sorteren op titel	Geciteerd door Geciteerd door	Jaar
RAM-Jam: Remote Temperature and Voltage Fault Attack on FPGAs using Memory Collisions MM Alam, S Tajik, F Ganji, M Tehranipoor, D Forte 2019 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), 48-55, 2019	111	2019
Challenges and Opportunities in Analog and Mixed Signal (AMS) Integrated Circuit (IC) Security DF Md Mahbub Alam, Sreeja Chowdhury, Beomsoo Park, David Munzer, Nima ... Journal of Hardware and Systems Security, 2017	38*	2017
Impact of X-ray Tomography on the Reliability of Integrated Circuits M Alam, H Shen, N Asadizanjani, M Tehranipoor, D Forte IEEE Transactions on Device and Materials Reliability 17 (1), 59-68, 2017	34	2017
Recycled FPGA detection using exhaustive LUT path delay characterization MM Alam, M Tehranipoor, D Forte 2016 IEEE International test conference (ITC), 1-10, 2016	34	2016
Recycled FPGA Detection Using Exhaustive LUT Path Delay Characterization and Voltage Scaling MM Alam, M Tehranipoor, D Forte IEEE Transactions on Very Large Scale Integration (VLSI) Systems 27 (12 …, 2019	30	2019
Analyzing the Impact of X-ray Tomography on the Reliability of Integrated Circuits MT Halit Dogan, Md Mahbub Alam, Navid Asadizanjani, Domenic Forte ISTFA 2015: Proceedings from the 41st International Symposium for Testing …, 2015	21*	2015
Chaogate Parameter Optimization using Bayesian Optimization and Genetic Algorithm RY Acharya, NF Charlot, MM Alam, F Ganji, D Gauthier, D Forte 2021 22nd International Symposium on Quality Electronic Design (ISQED), 426-431, 2021	11	2021
Post-Quantum LMS and SPHINCS+ Hash-Based Signatures for UEFI Secure Boot. P Kampanakis, P Panburana, M Curcio, C Shroff, MM Alam IACR Cryptol. ePrint Arch. 2021, 41, 2021	7	2021
Soft-HaT: Software-Based Silicon Reprogramming for Hardware Trojan Implementation MM Alam, A Nahiyan, M Sadi, D Forte, M Tehranipoor ACM Transactions on Design Automation of Electronic Systems (TODAES) 25 (4 …, 2020	5	2020
Counterfeit IC Detection: A Defect Database and Test Procedure MM Alam, S Chowdhury, N Asadizanjani, M Tehranipoor, D Forte

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