Volgen
Jinhong Min
Titel
Geciteerd door
Geciteerd door
Jaar
Impact of Chamber/Annealing Temperature on the Endurance Characteristic of Zr:HfO2 Ferroelectric Capacitor
Y Choi, C Han, J Shin, S Moon, J Min, H Park, D Eom, J Lee, C Shin
Sensors 22 (11), 4087, 2022
212022
Direct measurements of size-independent lithium diffusion and reaction times in individual polycrystalline battery particles
J Min, LM Gubow, RJ Hargrave, JB Siegel, Y Li
Energy & Environmental Science 16 (9), 3847-3859, 2023
202023
Program/Erase Scheme for Suppressing Interface Trap Generation in HfO2-Based Ferroelectric Field Effect Transistor
J Min, N Ronchi, SRC McMitchell, B O’Sullivan, K Banerjee, J Van Houdt, ...
IEEE Electron Device Letters 42 (9), 1280-1283, 2021
152021
Improved remnant polarization of Zr-doped HfO2 ferroelectric film by CF4/O2 plasma passivation
Y Choi, H Park, C Han, J Min, C Shin
Scientific Reports 12 (1), 16750, 2022
132022
Gate-induced drain leakage (GIDL) in MFMIS and MFIS negative capacitance FinFETs
J Min, G Choe, C Shin
Current Applied Physics 20 (11), 1222-1225, 2020
132020
MFMIS negative capacitance FinFET design for improving drive current
J Min, C Shin
Electronics 9 (9), 1423, 2020
122020
Study of line edge roughness on various types of gate-all-around field effect transistor
J Min, C Shin
Semiconductor Science and Technology 35 (1), 015004, 2019
72019
Experimental study of endurance characteristics of Al-doped HfO2 ferroelectric capacitor
Y Choi, J Shin, S Moon, J Min, C Han, C Shin
Nanotechnology 34 (18), 185203, 2023
52023
Single‐Particle Electrochemical Cycling Single‐Crystal and Polycrystalline NMC Particles
J Min, W Suk, SCY Wong, Y Li
Advanced Functional Materials 34 (51), 2410241, 2024
42024
Endurance of ferroelectric La-doped HfO2 for SFS gate-stack memory devices
N Ronchi, S McMitchell, J Min, K Banerjee, G Van den Bosch, C Shin, ...
2020 IEEE International Memory Workshop (IMW), 1-4, 2020
32020
Device Design Guideline for HfO₂-Based Ferroelectric-Gated Nanoelectromechanical System
C Yoon, J Min, J Shin, C Shin
IEEE Journal of the Electron Devices Society 8, 608-613, 2020
22020
Microelectrode Arrays for Electrochemical Cycling of Individual Battery Particles
W Suk, J Min, T Liu, Y Li
12024
Lab-Scale X-Ray Exposure Has No Measurable Impact on Lithium-Ion Battery Performance and Lifetime
J Min, A Condon, PM Attia
Batteries 11 (2), 73, 2025
2025
Microelectrodes for Battery Materials
Y Li, MH Kim, Z Xie, J Min, Y Li
ACS nano 18 (52), 35119-35129, 2024
2024
Oxygen reservoir effect of Tungsten trioxide electrode on endurance performance of ferroelectric capacitors for FeRAM applications
Y Choi, J Shin, J Min, S Moon, D Chu, D Han, C Shin
Scientific Reports 14 (1), 28912, 2024
2024
Het systeem kan de bewerking nu niet uitvoeren. Probeer het later opnieuw.
Artikelen 1–15