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Adilson S. Cardoso
Adilson S. Cardoso
Geverifieerd e-mailadres voor gatech.edu
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A 0.8 THz SiGe HBT Operating at 4.3 K
PS Chakraborty, AS Cardoso, BR Wier, AP Omprakash, JD Cressler, ...
IEEE Electron Device Letters 35 (2), 151-153, 2014
922014
A new wideband, low insertion loss, high linearity SiGe RF switch
CD Cheon, MK Cho, SG Rao, AS Cardoso, JD Connor, JD Cressler
IEEE Microwave and Wireless Components Letters 30 (10), 985-988, 2020
382020
Low-loss, wideband SPDT switches and switched-line phase shifter in 180-nm RF CMOS on SOI technology
AS Cardoso, P Saha, PS Chakraborty, DM Fleischhauer, JD Cressler
2014 IEEE Radio and Wireless Symposium (RWS), 199-201, 2014
372014
Evaluation of enhanced low dose rate sensitivity in fourth-generation SiGe HBTs
ZE Fleetwood, AS Cardoso, I Song, E Wilcox, NE Lourenco, SD Phillips, ...
IEEE transactions on Nuclear Science 61 (6), 2915-2922, 2014
282014
Single-event transient and total dose response of precision voltage reference circuits designed in a 90-nm SiGe BiCMOS technology
AS Cardoso, PS Chakraborty, N Karaulac, DM Fleischhauer, ...
IEEE transactions on Nuclear Science 61 (6), 3210-3217, 2014
262014
An investigation of single-event effects and potential SEU mitigation strategies in fourth-generation, 90 nm SiGe BiCMOS
NE Lourenco, SD Phillips, TD England, AS Cardoso, ZE Fleetwood, ...
IEEE transactions on Nuclear Science 60 (6), 4175-4183, 2013
262013
An investigation of single-event transients in C-SiGe HBT on SOI current mirror circuits
S Jung, NE Lourenco, I Song, MA Oakley, TD England, R Arora, ...
IEEE transactions on Nuclear Science 61 (6), 3193-3200, 2014
222014
An investigation of single event transient response in 45-nm and 32-nm SOI RF-CMOS devices and circuits
TD England, R Arora, ZE Fleetwood, NE Lourenco, KA Moen, AS Cardoso, ...
IEEE Transactions on Nuclear Science 60 (6), 4405-4411, 2013
212013
On the Transient Response of a Complementary (npn pnp) SiGe HBT BiCMOS Technology
NE Lourenco, ZE Fleetwood, S Jung, AS Cardoso, PS Chakraborty, ...
IEEE Transactions on Nuclear Science 61 (6), 3146-3153, 2014
202014
A SiGe 8–18-GHz receiver with built-in-testing capability for self-healing applications
DC Howard, PK Saha, S Shankar, TD England, AS Cardoso, ...
IEEE Transactions on Microwave Theory and Techniques 62 (10), 2370-2380, 2014
182014
Evaluating the effects of single event transients in FET-based single-pole double-throw RF switches
AS Cardoso, PS Chakraborty, NE Lourenco, TD England, P Saha, ...
IEEE Transactions on Nuclear Science 61 (2), 756-765, 2014
182014
Single-event effects in a W-band (75-110 GHz) radar down-conversion mixer implemented in 90 nm, 300 GHz SiGe HBT technology
S Zeinolabedinzadeh, I Song, US Raghunathan, NE Lourenco, ...
IEEE Transactions on Nuclear Science 62 (6), 2657-2665, 2015
172015
Design methodology for a wideband, low insertion loss, digital step attenuator in SiGe BiCMOS technology
CD Cheon, SG Rao, W Lim, AS Cardoso, MK Cho, JD Cressler
IEEE Transactions on Circuits and Systems II: Express Briefs 69 (3), 744-748, 2021
162021
Single-event transient response of comparator pre-amplifiers in a complementary SiGe technology
A Ildefonso, NE Lourenco, ZE Fleetwood, MT Wachter, GN Tzintzarov, ...
IEEE transactions on Nuclear Science 64 (1), 89-96, 2016
142016
Impact of total ionizing dose on a 4th generation, 90 nm SiGe HBT Gaussian pulse generator
F Inanlou, NE Lourenco, ZE Fleetwood, I Song, DC Howard, A Cardoso, ...
IEEE transactions on Nuclear Science 61 (6), 3050-3054, 2014
122014
Total ionizing dose response of triple-well FET-based wideband, high-isolation RF switches in a 130 nm SiGe BiCMOS technology
AS Cardoso, PS Chakraborty, NE Lourenco, P Song, TD England, ...
IEEE Transactions on Nuclear Science 60 (4), 2567-2573, 2013
112013
On the cryogenic RF linearity of SiGe HBTs in a fourth-generation 90-nm SiGe BiCMOS technology
AS Cardoso, AP Omprakash, PS Chakraborty, N Karaulac, ...
IEEE Transactions on Electron Devices 62 (4), 1127-1135, 2015
92015
A 42.5–51.0 GHz SiGe BiCMOS integrated tunable bandpass filter and attenuator
A Moradinia, CD Cheon, CT Coen, NE Lourenco, AS Cardoso, ...
2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and …, 2022
82022
The effects of temperature on the single-event transient response of a high-voltage (> 30 V) complementary SiGe-on-SOI technology
AP Omprakash, A Ildefonso, ZE Fleetwood, GN Tzintzarov, AS Cardoso, ...
IEEE Transactions on Nuclear Science 66 (1), 389-396, 2018
72018
Cryogenic characterization of RF low-noise amplifiers utilizing inverse-mode SiGe HBTs for extreme environment applications
I Song, AS Cardoso, H Ying, MK Cho, JD Cressler
IEEE Transactions on Device and Materials Reliability 18 (4), 613-619, 2018
72018
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Artikelen 1–20