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Mikail Yayla
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Margin-maximization in binarized neural networks for optimizing bit error tolerance
S Buschjäger, JJ Chen, KH Chen, M Günzel, C Hakert, K Morik, R Novkin, ...
2021 Design, Automation & Test in Europe Conference & Exhibition (DATE), 673-678, 2021
292021
FeFET-based binarized neural networks under temperature-dependent bit errors
M Yayla, S Buschjäger, A Gupta, JJ Chen, J Henkel, K Morik, KH Chen, ...
IEEE Transactions on Computers 71 (7), 1681-1695, 2021
202021
Software-based memory analysis environments for in-memory wear-leveling
C Hakert, KH Chen, M Yayla, G Von Der Brüggen, S Blömeke, JJ Chen
2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC), 651-658, 2020
162020
Reliable binarized neural networks on unreliable beyond von-neumann architecture
M Yayla, S Thomann, S Buschjäger, K Morik, JJ Chen, H Amrouch
IEEE Transactions on Circuits and Systems I: Regular Papers 69 (6), 2516-2528, 2022
142022
Binarized snns: Efficient and error-resilient spiking neural networks through binarization
ML Wei, M Yayla, SY Ho, JJ Chen, CL Yang, H Amrouch
2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD), 1-9, 2021
122021
Nanoparticle classification using frequency domain analysis on resource-limited platforms
M Yayla, A Toma, KH Chen, JE Lenssen, V Shpacovitch, R Hergenröder, ...
Sensors 19 (19), 4138, 2019
122019
Memory-efficient training of binarized neural networks on the edge
M Yayla, JJ Chen
Proceedings of the 59th ACM/IEEE Design Automation Conference, 661-666, 2022
82022
Fault tolerance on control applications: empirical investigations of impacts from incorrect calculations
M Yayla, KH Chen, JJ Chen
2018 4th International Workshop on Emerging Ideas and Trends in the …, 2018
72018
Towards explainable bit error tolerance of resistive ram-based binarized neural networks
S Buschjäger, JJ Chen, KH Chen, M Günzel, C Hakert, K Morik, R Novkin, ...
arXiv preprint arXiv:2002.00909, 2020
52020
Impact of non-volatile memory cells on spiking neural network annealing machine with in-situ synapse processing
ML Wei, M Yayla, SY Ho, JJ Chen, H Amrouch, CL Yang
IEEE Transactions on Circuits and Systems I: Regular Papers 70 (11), 4380-4393, 2023
42023
TREAM: A Tool for Evaluating Error Resilience of Tree-Based Models Using Approximate Memory
M Yayla, Z Valipour Dehnoo, M Masoudinejad, JJ Chen
International Conference on Embedded Computer Systems, 61-73, 2022
42022
Robust and Tiny Binary Neural Networks using Gradient-based Explainability Methods
M Sabih, M Yayla, F Hannig, J Teich, JJ Chen
Proceedings of the 3rd Workshop on Machine Learning and Systems, 87-93, 2023
32023
Brain-inspired computing: Adventure from beyond CMOS technologies to beyond von Neumann architectures ICCAD special session paper
H Amrouch, JJ Chen, K Roy, Y Xie, I Chakraborty, W Huangfu, L Liang, ...
2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD), 1-9, 2021
32021
Bit error tolerance metrics for binarized neural networks
S Buschjäger, JJ Chen, KH Chen, M Günzel, K Morik, R Novkin, L Pfahler, ...
arXiv preprint arXiv:2102.01344, 2021
32021
Stack usage analysis for efficient wear leveling in non-volatile main memory systems
C Hakert, M Yayla, KH Chen, G von der Brüggen, JJ Chen, S Buschjäger, ...
2019 ACM/IEEE 1st Workshop on Machine Learning for CAD (MLCAD), 1-6, 2019
32019
HW/SW codesign for robust and efficient binarized SNNs by capacitor minimization
M Yayla, S Thomann, ML Wei, CL Yang, JJ Chen, H Amrouch
arXiv preprint arXiv:2309.02111, 2023
22023
DAEBI: A Tool for Data Flow and Architecture Explorations of Binary Neural Network Accelerators
M Yayla, C Latotzke, R Huber, S Iskif, T Gemmeke, JJ Chen
International Conference on Embedded Computer Systems, 107-122, 2023
22023
HW/SW codesign for approximation-aware binary neural networks
A Dave, F Frustaci, F Spagnolo, M Yayla, JJ Chen, H Amrouch
IEEE Journal on Emerging and Selected Topics in Circuits and Systems 13 (1 …, 2023
22023
Universal Approximation Theorems of Fully Connected Binarized Neural Networks
M Yayla, M Günzel, B Ramosaj, JJ Chen
arXiv preprint arXiv:2102.02631, 2021
22021
FeFET and NCFET for future neural networks: Visions and opportunities
M Yayla, KH Chen, G Zervakis, J Henkel, JJ Chen, H Amrouch
2021 Design, Automation & Test in Europe Conference & Exhibition (DATE), 300-305, 2021
22021
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