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William D. Nix
William D. Nix
Geverifieerd e-mailadres voor stanford.edu
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Indentation size effects in crystalline materials: a law for strain gradient plasticity
WD Nix, H Gao
Journal of the Mechanics and Physics of Solids 46 (3), 411-425, 1998
49861998
A method for interpreting the data from depth-sensing indentation instruments
MF Doerner, WD Nix
Journal of Materials research 1 (4), 601-609, 1986
40301986
Mechanical properties of thin films
WD Nix
Metallurgical transactions A 20, 2217-2245, 1989
33171989
Sample dimensions influence strength and crystal plasticity
MD Uchic, DM Dimiduk, JN Florando, WD Nix
Science 305 (5686), 986-989, 2004
27412004
What is the Young's Modulus of Silicon?
MA Hopcroft, WD Nix, TW Kenny
Journal of microelectromechanical systems 19 (2), 229-238, 2010
25342010
Mechanism-based strain gradient plasticity—I. Theory
H Gao, Y Huang, WD Nix, JW Hutchinson
Journal of the Mechanics and Physics of Solids 47 (6), 1239-1263, 1999
24241999
Effects of the substrate on the determination of thin film mechanical properties by nanoindentation
R Saha, WD Nix
Acta materialia 50 (1), 23-38, 2002
19242002
Size dependence of mechanical properties of gold at the micron scale in the absence of strain gradients
JR Greer, WC Oliver, WD Nix
Acta Materialia 53 (6), 1821-1830, 2005
17912005
25th anniversary article: understanding the lithiation of silicon and other alloying anodes for lithium‐ion batteries
MT McDowell, SW Lee, WD Nix, Y Cui
Advanced materials 25 (36), 4966-4985, 2013
16872013
Interconnected silicon hollow nanospheres for lithium-ion battery anodes with long cycle life
Y Yao, MT McDowell, I Ryu, H Wu, N Liu, L Hu, WD Nix, Y Cui
Nano letters 11 (7), 2949-2954, 2011
16742011
Nanoscale gold pillars strengthened through dislocation starvation
JR Greer, WD Nix
Physical Review B—Condensed Matter and Materials Physics 73 (24), 245410, 2006
11102006
Determination of indenter tip geometry and indentation contact area for depth-sensing indentation experiments
KW McElhaney, JJ Vlassak, WD Nix
Journal of Materials research 13 (5), 1300-1306, 1998
10511998
A new bulge test technique for the determination of Young's modulus and Poisson's ratio of thin films
JJ Vlassak, WD Nix
Journal of materials research 7 (12), 3242-3249, 1992
9501992
In situ TEM of two-phase lithiation of amorphous silicon nanospheres
MT McDowell, SW Lee, JT Harris, BA Korgel, C Wang, WD Nix, Y Cui
Nano letters 13 (2), 758-764, 2013
9232013
Crystallite coalescence: A mechanism for intrinsic tensile stresses in thin films
WD Nix, BM Clemens
Journal of materials research 14 (8), 3467-3473, 1999
8191999
Stresses and deformation processes in thin films on substrates
MF Doerner, WD Nix
Critical Reviews in Solid State and Material Sciences 14 (3), 225-268, 1988
7971988
Mechanism-based strain gradient plasticity—II. Analysis
Y Huang, H Gao, WD Nix, JW Hutchinson
Journal of the Mechanics and Physics of Solids 48 (1), 99-128, 2000
7732000
Measurement and interpretation of stress in aluminum-based metallization as a function of thermal history
PA Flinn, DS Gardner, WD Nix
IEEE Transactions on electron devices 34 (3), 689-699, 2005
7352005
The principles of engineering materials
CR Barrett, WD Nix, AS Tetelman
(No Title), 1973
6971973
Studying the kinetics of crystalline silicon nanoparticle lithiation with in situ transmission electron microscopy
MT McDowell, I Ryu, SW Lee, C Wang, WD Nix, Y Cui
Advanced Materials 24 (45), 6034-6041, 2012
6902012
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