| Defect and texture engineering of relaxor thin films for High-Power energy storage applications W Abbas, MS Ibrahim, M Waseem, C Lu, HH Lee, S Fazal, KH Loo, ... Chemical Engineering Journal 482, 148943, 2024 | 9 | 2024 |
| Long-term lifetime prediction of power mosfet devices based on lstm and gru algorithms MS Ibrahim, W Abbas, M Waseem, C Lu, HH Lee, J Fan, KH Loo Mathematics 11 (15), 3283, 2023 | 9 | 2023 |
| The effect of pre-existing voids on solder reliability at different thermomechanical stress Levels: experimental assessment A Waseem, MS Ibrahim, C Lu, M Waseem, HH Lee, KH Loo Materials & Design 233, 112275, 2023 | 8 | 2023 |
| Evaluation of Temperature-Humidity-Reverse Bias Robustness of 3rd Generation 650V Class 4H-SiC Discrete Power MOSFET Devices M Waseem, MS Ibrahim, W Abbas, C Lu, H Yuluo, HH Lee, Z Hao, KH Loo 2023 IEEE International Integrated Reliability Workshop (IIRW), 1-6, 2023 | | 2023 |
