Tailoring nanoporous materials by atomic layer deposition C Detavernier, J Dendooven, SP Sree, KF Ludwig, JA Martens
Chemical Society Reviews 40 (11), 5242-5253, 2011
417 2011 Heteroepitaxy, polymorphism, and faulting in GaN thin films on silicon and sapphire substrates T Lei, KF Ludwig Jr, TD Moustakas
Journal of applied physics 74 (7), 4430-4437, 1993
362 1993 Phase separation and ordering in InGaN alloys grown by molecular beam epitaxy D Doppalapudi, SN Basu, KF Ludwig Jr, TD Moustakas
Journal of applied physics 84 (3), 1389-1395, 1998
336 1998 Mass redistribution causes the structural richness of ion-irradiated surfaces CS Madi, E Anzenberg, KF Ludwig Jr, MJ Aziz
Physical review letters 106 (6), 066101, 2011
210 2011 Long range order in films grown by molecular beam epitaxy D Korakakis, KF Ludwig Jr, TD Moustakas
Applied physics letters 71 (1), 72-74, 1997
159 1997 Real-time x-ray studies of Mo-seeded Si nanodot formation during ion bombardment G Ozaydin, AS Özcan, Y Wang, KF Ludwig, H Zhou, RL Headrick, ...
Applied Physics Letters 87 (16), 2005
157 2005 Noncritical behavior of density fluctuations in supercooled water Y Xie, KF Ludwig Jr, G Morales, DE Hare, CM Sorensen
Physical review letters 71 (13), 2050, 1993
147 1993 High contrast x-ray speckle from atomic-scale order in liquids and glasses SO Hruszkewycz, M Sutton, PH Fuoss, B Adams, S Rosenkranz, ...
Physical review letters 109 (18), 185502, 2012
122 2012 Effect of Sr Content and Strain on Sr Surface Segregation of La1–x Srx Co0.2 Fe0.8 O3−δ as Cathode Material for Solid Oxide Fuel Cells Y Yu, KF Ludwig, JC Woicik, S Gopalan, UB Pal, TC Kaspar, SN Basu
ACS applied materials & interfaces 8 (40), 26704-26711, 2016
114 2016 EXAFS and WAXS structure determination for an antiarthritic drug, sodium gold (I) thiomalate RC Elder, K Ludwig, JN Cooper, MK Eidsness
Journal of the American Chemical Society 107 (17), 5024-5025, 1985
93 1985 Nucleated and continuous ordering in Cu 3 Au KF Ludwig Jr, GB Stephenson, JL Jordan-Sweet, J Mainville, YS Yang, ...
Physical review letters 61 (16), 1859, 1988
90 1988 In Situ X-ray Fluorescence Measurements During Atomic Layer Deposition: Nucleation and Growth of TiO2 on Planar Substrates and in Nanoporous Films J Dendooven, S Pulinthanathu Sree, K De Keyser, D Deduytsche, ...
The Journal of Physical Chemistry C 115 (14), 6605-6610, 2011
87 2011 In situ x‐ray diffraction analysis of the C49–C54 titanium silicide phase transformation in narrow linesRA Roy, LA Clevenger, C Cabral Jr, KL Saenger, S Brauer, ...
Applied physics letters 66 (14), 1732-1734, 1995
83 1995 Chemical ordering in AlGaN alloys grown by molecular beam epitaxy E Iliopoulos, KF Ludwig Jr, TD Moustakas, SNG Chu
Applied Physics Letters 78 (4), 463-465, 2001
80 2001 Effects of Mo seeding on the formation of Si nanodots during low-energy ion bombardment G Ozaydin, KF Ludwig, H Zhou, RL Headrick
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2008
76 2008 Effect of atmospheric CO2 on surface segregation and phase formation in La0. 6Sr0. 4Co0. 2Fe0. 8O3− δ thin films Y Yu, H Luo, D Cetin, X Lin, K Ludwig, U Pal, S Gopalan, S Basu
Applied surface science 323, 71-77, 2014
75 2014 Instrumentation for millisecond‐resolution scattering studies GB Stephenson, KF Ludwig Jr, JL Jordan‐Sweet, S Brauer, J Mainville, ...
Review of Scientific Instruments 60 (7), 1537-1540, 1989
74 1989 Tuning the pore size of ink-bottle mesopores by atomic layer deposition J Dendooven, B Goris, K Devloo-Casier, E Levrau, E Biermans, ...
Chemistry of Materials 24 (11), 1992-1994, 2012
70 2012 Observation of a Precursor during the Crystallization of Amorphous Ni M Sutton, YS Yang, J Mainville, JL Jordan-Sweet, KF Ludwig Jr, ...
Physical review letters 62 (3), 288, 1989
63 1989 Si(100) surface morphology evolution during normal-incidence sputtering with 100–500 eV ions F Ludwig Jr, CR Eddy Jr, O Malis, RL Headrick
Applied physics letters 81 (15), 2770-2772, 2002
62 2002