The secondary electron emission yield for 24 solid elements excited by primary electrons in the range 250–5000 eV: a theory/experiment comparison CGH Walker, MM El‐Gomati, AMD Assa'd, M Zadražil
Scanning 30 (5), 365-380, 2008
170 2008 Why is it possible to detect doped regions of semiconductors in low voltage SEM: a review and update M El‐Gomati, F Zaggout, H Jayacody, S Tear, K Wilson
Surface and Interface Analysis: An International Journal devoted to the …, 2005
102 2005 Theory experiment comparison of the electron backscattering factor from solids at low electron energy (250–5,000 eV) MM El Gomati, CGH Walker, AMD Assa'd, M Zadražil
Scanning: The Journal of Scanning Microscopies 30 (1), 2-15, 2008
94 2008 Optics in our time MD Al-Amri, M El-Gomati, MS Zubairy
Springer Nature, 2016
83 2016 Backscattering coefficients for low energy electrons AMD Assa’d, MM El Gomati
Scanning Microsc 12 (1), 185-192, 1998
82 1998 Edge effects and image contrast in scanning Auger microscopy: A theory/experiment comparison MM El Gomati, M Prutton, B Lamb, CG Tuppen
Surface and interface analysis 11 (5), 251-265, 1988
80 1988 Monte Carlo calculations of the spatial resolution in a scanning auger electron microscope MM El Gomati, M Prutton
Surface Science 72 (3), 485-494, 1978
78 1978 Electronic excitations on clean and adsorbate covered Pd (111) by angle resolved electron energy loss spectroscopy FP Netzer, MM El Gomati
Surface Science 124 (1), 26-38, 1983
64 1983 A third‐generation Auger microscope using parallel multispectral data acquisition and analysis M Prutton, CGH Walker, JC Greenwood, PG Kenny, JC Dee, IR Barkshire, ...
Surface and interface analysis 17 (2), 71-84, 1991
63 1991 Scanning Auger electron microscopy M Prutton, MM El Gomati
John Wiley & Sons, 2006
62 2006 Imaging of the boron doping in silicon using low energy SEM I Müllerová, MM El-Gomati, L Frank
Ultramicroscopy 93 (3-4), 223-243, 2002
58 2002 A fast, parallel acquisition, electron energy analyzer: The hyperbolic field analyzer M Jacka, M Kirk, MM El Gomati, M Prutton
Review of scientific instruments 70 (5), 2282-2287, 1999
58 1999 Scatter diagrams in energy analysed digital imaging: application to scanning Auger microscopy MME Gomati, DC Peacock, M Prutton, CG Walker
Journal of Microscopy 147 (2), 149-158, 1987
55 1987 Very low energy electron microscopy of doped semiconductors MM El-Gomati, TCR Wells, H Jayakody
Microscopy of Semiconducting Materials 2001, 435-438, 2018
54 2018 Scatter diagrams and hotelling transforms: application to surface analytical microscopy M Prutton, MM El Gomati, PG Kenny
Journal of Electron Spectroscopy and Related Phenomena 52, 197-219, 1990
54 1990 Quantifying data from Auger spectra and images CGH Walker, DC Peacock, M Prutton, MM El Gomati
Surface and interface analysis 11 (5), 266-278, 1988
52 1988 Carbon nanotubes as electron sources WI Milne, KBK Teo, M Mann, IYY Bu, GAJ Amaratunga, N De Jonge, ...
physica status solidi (a) 203 (6), 1058-1063, 2006
49 2006 The spectral background in electron excited auger electron spectroscopy JAD Matthew, M Prutton, MM El Gomati, DC Peacock
Surface and Interface Analysis 11 (4), 173-181, 1988
44 1988 Low temperature reactive ion etching of silicon with T Wells, MM El-Gomati, J Wood
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1997
43 1997 The interpretation of the spatial resolution of the scanning Auger electron microscope: A theory/experiment comparison MM El Gomati, AP Janseen, M Prutton, JA Venables
Surface Science 85 (2), 309-316, 1979
39 1979 