| Ferroelectric field effect transistors (FeFETs): advancements, challenges and exciting prospects for next generation non-volatile memory (NVM) applications J Ajayan, P Mohankumar, D Nirmal, LMIL Joseph, S Bhattacharya, ... Materials Today Communications 35, 105591, 2023 | 23 | 2023 |
| An efficient MRTD model for the analysis of crosstalk in CMOS-driven coupled Cu interconnects S Rebelli, BR Nistala Radioengineering 27 (2), 532-540, 2018 | 12 | 2018 |
| A Multiresolution Time Domain (MRTD) Method for Crosstalk Noise Modeling of CMOS-Gate-Driven Coupled MWCNT Interconnects S Rebelli, BR Nistala IEEE Transactions on Electromagnetic Compatibility, DOI: 10.1109/TEMC.2019 …, 2019 | 8 | 2019 |
| Design of low power 4-bit Baugh-Wooley multiplier using 1-bit mirror and approximate full adders A Rampeesa, P Akhila, M Irfan, S Rebelli, LR Thoutam, J Ajayan 2022 2nd Asian Conference on Innovation in Technology (ASIANCON), 1-4, 2022 | 6 | 2022 |
| A novel MRTD model for signal integrity analysis of resistive driven coupled copper interconnects S Rebelli, BR Nistala COMPEL-The international journal for computation and mathematics in …, 2018 | 5 | 2018 |
| Minimization of crosstalk noise and delay using reduced graphene nano ribbon (GNR) interconnect S Bhattacharya, S Das, S Tayal, J Ajayan, L Joseph, TK Juluru, ... Microelectronics Journal 127, 105533, 2022 | 3 | 2022 |
| Analysis of COVID-19 CT Chest Image Classification using Dl4jMlp Classifier and Multilayer Perceptron in WEKA Environment S Sreejith, J Ajayan, NVU Reddy, S Rebelli Current Medical Imaging 20 (1), e170423215872, 2024 | 2 | 2024 |
| Design of High Quality Factor Symmetrical Differential Inductor using Intercalated-Graphene S Reddy K, NK Ch, S Ch, A D, S Rebelli, L Raju T 2022 2nd International Conference on Intelligent Technologies (CONIT), 2022 | 2 | 2022 |
| Investigation of Gate-Length Scaling Effects on the Thermal Reliability of 25T-TSPC Flip-Flop SH Juveria, S Rebelli, J Ajayan 2024 International Conference on Smart Electronics and Communication Systems …, 2024 | | 2024 |
| Thermal Reliability Study of Aggressively Scaled C2SFF for Future IoT Applications SH Juveria, S Rebelli, J Ajayan 2024 International Conference on Smart Electronics and Communication Systems …, 2024 | | 2024 |
| Performance Comparison of 2 x1 Multiplexer Based High Performance Static and Dynamic Nanoscale Carry Select Adder for Future DSP Applications R Pateru, J Ajayan, K Alekhya, G Vamshi, J Ruthvik, S Rebelli 2024 IEEE 4th International Conference on VLSI Systems, Architecture …, 2024 | | 2024 |
| An Investigative Study on Performance and Reliability Effects on S2C/TSPC/SCD D-Flip-Flops using 16 nm CMOS Process K Karthikeya, NT Teja, J Ajayan, S Sreejith, M Manikandan, S Rebelli 2024 IEEE International Conference on Interdisciplinary Approaches in …, 2024 | | 2024 |
| Reliability Study of Highly Sensitive Nanoscale Dynamic Comparators Over a Wide Range of VDDs/Temperatures for Future Flash/SAR ADCs RSJA Barigela Rahul, Vemula Raj Kumar, Akkinapelly Pranith Kumar, Chirra Sai ... Nanoworld Journal 9 (S5), S180-S185, 2023 | | 2023 |
| Transmission Line-Based Modeling of CNT and GNR Interconnects Using Numerical Methods S Rebelli Nano-Interconnect Materials and Models for Next Generation Integrated …, 2023 | | 2023 |
Prof. Bheema Rao NistalaProfessor of ECE Department, NIT WarangalVerifisert e-postadresse på nitw.ac.in