| Comprehensive analytical comparison of ring oscillators in FDSOI technology: current starving versus back-bias control M Schramme, L Van Brandt, D Flandre, D Bol IEEE Transactions on Circuits and Systems I: Regular Papers 69 (5), 1883-1895, 2022 | 12 | 2022 |
| Robust methodology for low-frequency noise power analyses in advanced MOS transistors L Van Brandt, BK Esfeh, V Kilchytska, D Flandre 2019 Joint International EUROSOI Workshop and International Conference on …, 2019 | 8 | 2019 |
| Accurate and insightful closed-form prediction of subthreshold SRAM hold failure rate L Van Brandt, R Saeidi, D Bol, D Flandre IEEE Transactions on Circuits and Systems I: Regular Papers 69 (7), 2767-2780, 2022 | 7 | 2022 |
| On noise-induced transient bit flips in subthreshold SRAM L Van Brandt, F Silveira, JC Delvenne, D Flandre Solid-State Electronics 208, 108715, 2023 | 6 | 2023 |
| A security oriented transient-noise simulation methodology: Evaluation of intrinsic physical noise of cryptographic designs K Nawaz, L Van Brandt, I Levi, FX Standaert, D Flandre Integration 68, 71-79, 2019 | 5 | 2019 |
| Noise–dissipation relation for nonlinear electronic circuits L Van Brandt, JC Delvenne Applied Physics Letters 122 (26), 2023 | 4 | 2023 |
| Variability-Aware Noise-Induced Dynamic Instability of Ultra-Low-Voltage SRAM Bitcells L Van Brandt, JC Delvenne, D Flandre 2024 IEEE 15th Latin America Symposium on Circuits and Systems (LASCAS), 1-5, 2024 | 3 | 2024 |
| Low-frequency noise analysis of on-membrane MOSFET and in-situ thermal annealing S Amor, L Van Brandt, V Kilchytska, M Machhout, LA Francis, D Flandre 2020 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS …, 2020 | 3 | 2020 |
| Low-frequency noise transistor performance for UTBB FDSOI MOSFET-C filters L Van Brandt, BK Esfeh, N Planes, V Kilchytska, D Flandre 2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference …, 2019 | 3 | 2019 |
| Let’s make it noisy: a simulation methodology for adding intrinsic physical noise to cryptographic designs K Nawaz, L Van Brandt, FX Standaert, D Flandre 2018 14th Conference on Ph. D. Research in Microelectronics and Electronics …, 2018 | 3 | 2018 |
| Stochastic nonlinear dynamical modelling of SRAM bitcells in retention mode L Van Brandt, D Flandre, JC Delvenne 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2024 | 2 | 2024 |
| Predicting State Transitions in Autonomous Nonlinear Bistable Systems With Hidden Stochasticity L Van Brandt, JC Delvenne IEEE Control Systems Letters, 2024 | 1 | 2024 |
| Variance and skewness of current fluctuations experimentally evidenced in single-photon avalanche diodes L Van Brandt, R Vercauteren, DH Enriquez, N André, V Kilchytska, ... 2023 International Conference on Noise and Fluctuations (ICNF), 1-4, 2023 | 1 | 2023 |
| Bounding Variance and Skewness of Fluctuations in Nonlinear Dynamical Systems with Stochastic Thermodynamics JC Delvenne, L Van Brandt IFAC-PapersOnLine 56 (2), 10453-10459, 2023 | 1 | 2023 |
| Modeling and Predicting Noise-Induced Failure Rates in Ultra-Low-Voltage SRAM Bitcells Affected by Process Variations L Van Brandt, M Bonnin, MB da Silva, P Bolcato, GI Wirth, D Flandre, ... IEEE Transactions on Circuits and Systems I: Regular Papers, 2025 | | 2025 |
| Moments of Entropy Production in Dissipative Devices JC Delvenne, L Van Brandt arXiv preprint arXiv:2404.00422, 2024 | | 2024 |
| The non-Landauer Bound for the Dissipation of Bit Writing Operation L Van Brandt, JC Delvenne 2023 IEEE 23rd International Conference on Nanotechnology (NANO), 726-731, 2023 | | 2023 |
| Estimation analytique des taux de défaillance dans les SRAM sous seuil en régime de rétention de données L Van Brandt, D Flandre FETCH 2023, 2023 | | 2023 |
| Variability and Intrinsic Noise Effects in ULV CMOS SRAM Demystified L Van Brandt, F Silveira, JC Delvenne, D Bol, D Flandre IEEE Latin American Electron Devices Conference 2023, 2023 | | 2023 |
| Bounding Variance and Skewness of Fluctuations in Nonlinear Mesoscopic Systems with Stochastic Thermodynamics JC Delvenne, L Van Brandt arXiv preprint arXiv:2208.14506, 2022 | | 2022 |
Denis FlandreICTEAM, EPL, Université catholique de Louvain (UCL)Verifisert e-postadresse på uclouvain.be