| Additive Manufacturing Cyber-Physical System: Supply Chain Cybersecurity and Risks N Gupta, A Tiwari, STS Bukkapatnam, R Karri IEEE Access 8, 47322-47333, 2020 | 143 | 2020 |
| A Survey of Cybersecurity of Digital Manufacturing P Mahesh, A Tiwari, C Jin, PR Kumar, ALN Reddy, STS Bukkapatanam, ... Proceedings of the IEEE 109 (4), 495-516, 2020 | 79 | 2020 |
| Explainable AI-infused ultrasonic inspection for internal defect detection A Karthikeyan, A Tiwari, Y Zhong, STS Bukkapatnam CIRP Annals 71 (1), 449-452, 2022 | 20 | 2022 |
| Protection against Counterfeiting Attacks in 3D Printing by Streaming Signature-embedded Manufacturing Process Instructions A Tiwari, EJ Villasenor, N Gupta, N Reddy, R Karri, STS Bukkapatnam Proceedings of the 2021 Workshop on Additive Manufacturing (3D Printing …, 2021 | 13 | 2021 |
| Identifying the influence of surface texture waveforms on colors of polished surfaces using an explainable AI approach Y Zhong, A Tiwari, H Yamaguchi, A Lakhtakia, STS Bukkapatnam IISE Transactions 55 (7), 731-745, 2023 | 12 | 2023 |
| Hypothesis tests with functional data for surface quality change detection in surface finishing processes S Jin, R Tuo, A Tiwari, S Bukkapatnam, C Aracne-Ruddle, A Lighty, ... IISE transactions 55 (9), 940-956, 2023 | 11 | 2023 |
| Cybersecurity assurance in the emerging manufacturing-as-a-service (MaaS) paradigm: A lesson from the video streaming industry A Tiwari, ALN Reddy, STS Bukkapatnam Smart and Sustainable Manufacturing Systems 4 (3), 324-329, 2020 | 10 | 2020 |
| Learning digital emulators for closed architecture machine tool controllers A Tiwari, Y Wang, K Saleeby, ALN Reddy, S Bukkapatnam Journal of Manufacturing Systems 68, 695-703, 2023 | 4 | 2023 |
| Unsupervised spectral-band feature identification for optimal process discrimination A Tiwari, S Bukkapatnam arXiv preprint arXiv:2212.03800, 2022 | 4 | 2022 |
| On colors of stainless-steel surfaces polished with magnetic abrasives A Tiwari, F Xu, A Lakhtakia, H Yamaguchi, STS Bukkapatnam Applied Optics 60 (9), 2549-2559, 2021 | 4 | 2021 |
| Detecting anomalous motions in ultraprecision shell-polishing process combining unsupervised spectral-band identification and Explainable-AI S Galla, A Tiwari, SC Nalband, SM Hayes, S Bhandarkar, S Bukkapatnam Journal of Manufacturing Systems, 2024 | 3 | 2024 |
| A Graphical Representation of Sensor Mapping for Machine Tool Fault Monitoring and Prognostics for Smart Manufacturing A Hanchate, PS Dave, A Verma, A Tiwari, CS Mishra, SRT Kumara, ... Smart and Sustainable Manufacturing Systems 7 (1), 82-110, 2023 | 2 | 2023 |
| Precision Polishing of Ablator Capsules via in situ Process Monitoring and Machine Learning–Based Optimization A Tiwari, S Jin, S Galla, B Botcha, S Hayes, M Biener, K Bhardwaj, ... Fusion Science and Technology, 1-13, 2024 | | 2024 |
| Smart Manufacturing Plant Floor Cybersecurity AT Jag Prasad | | 2023 |
| Machine Learning-Enhanced Prediction of Surface Smoothness for Inertial Confinement Fusion Target Polishing A Alexos, J Liu, A Tiwari, K Bhardwaj, S Hayes, P Baldi, S Bukkapatnam, ... Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States), 2023 | | 2023 |
| Coloration of stainless-steel surfaces using magnetic abrasive finishing H Yamaguchi, F Xu, A Lakhtakia, A Tiwari, STS Bukkapatnam Surface Engineering and Forensics 12490, 1249002, 2023 | | 2023 |
| Scalable Anomaly Detection in Batch Polishing Processes for Inertial Confinement Fusion Shells S Galla, A Tiwari, K Bhardwaj, SM Hayes, S Bukkapatnam, S Bhandarkar ICML 2024 AI for Science Workshop, 0 | | |
Satish T.S. BukkapatnamTexas A&M UniversityZweryfikowany adres z tamu.edu