Secondary ion mass spectrometry: a practical handbook for depth profiling and bulk impurity analysis RG Wilson, FA Stevie, CW Magee
(No Title), 1989
1181 1989 Introduction to x-ray photoelectron spectroscopy FA Stevie, CL Donley
Journal of Vacuum Science & Technology A 38 (6), 2020
540 2020 Focused ion beam milling and micromanipulation lift-out for site specific cross-section TEM specimen preparation LA Giannuzzi, JL Drown, SR Brown, RB Irwin, FA Stevie
MRS Online Proceedings Library 480 (1), 19-27, 1997
258 1997 Secondary ion yield changes in Si and GaAs due to topography changes during O+ 2 or Cs+ ion bombardment FA Stevie, PM Kahora, DS Simons, P Chi
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 6 (1 …, 1988
197 1988 Effect of high temperature heat treatments on the quality factor of a large-grain<? format?> superconducting radio-frequency niobium cavity P Dhakal, G Ciovati, GR Myneni, KE Gray, N Groll, P Maheshwari, ...
Physical Review Special Topics—Accelerators and Beams 16 (4), 042001, 2013
163 2013 The correlation between ion beam/material interactions and practical FIB specimen preparation BI Prenitzer, CA Urbanik-Shannon, LA Giannuzzi, SR Brown, RB Irwin, ...
Microscopy and Microanalysis 9 (3), 216-236, 2003
143 2003 Application of focused ion beam lift‐out specimen preparation to TEM, SEM, STEM, AES and SIMS analysis FA Stevie, CB Vartuli, LA Giannuzzi, TL Shofner, SR Brown, B Rossie, ...
Surface and Interface Analysis: An International Journal devoted to the …, 2001
141 2001 Ion channeling effects on the focused ion beam milling of Cu BW Kempshall, SM Schwarz, BI Prenitzer, LA Giannuzzi, RB Irwin, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2001
137 2001 FIB lift-out specimen preparation techniques: ex-situ and in-situ methods LA Giannuzzi, BW Kempshall, SM Schwarz, JK Lomness, BI Prenitzer, ...
Introduction to focused ion beams: instrumentation, theory, techniques and …, 2005
135 2005 High field G Ciovati, G Myneni, F Stevie, P Maheshwari, D Griffis
Physical Review Special Topics—Accelerators and Beams 13 (2), 022002, 2010
127 2010 Bioremediation of chromium(VI) contaminated soil by Streptomyces sp. MC1 MA Polti, RO García, MJ Amoroso, CM Abate
Journal of Basic Microbiology 49 (3), 285-292, 2009
124 2009 Secondary ion mass spectrometry: applications for depth profiling and surface characterization F Stevie
Momentum Press, 2015
118 2015 Transmission electron microscope specimen preparation of Zn powders using the focused ion beam lift-out technique BI Prenitzer, LA Giannuzzi, K Newman, SR Brown, RB Irwin, FA Stevie, ...
Metallurgical and Materials Transactions A 29, 2399-2406, 1998
107 1998 Applications of focused ion beams in microelectronics production, design and development FA Stevie, TC Shane, PM Kahora, R Hull, D Bahnck, VC Kannan, E David
Surface and interface analysis 23 (2), 61-68, 1995
103 1995 Chemically and geometrically enhanced focused ion beam micromachining PE Russell, TJ Stark, DP Griffis, JR Phillips, KF Jarausch
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1998
92 1998 Introduction to focused ion beams LA Gianuzzi, FA Stevie
Instrumentation, Theory, Techniques and Practice: Springer, 2005
91 2005 Comparative evaluation of protective coatings and focused ion beam chemical vapor deposition processes BW Kempshall, LA Giannuzzi, BI Prenitzer, FA Stevie, SX Da
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2002
88 2002 H2 O enhanced focused ion beam micromachining TJ Stark, GM Shedd, J Vitarelli, DP Griffis, PE Russell
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1995
85 1995 Chemical and spatial differentiation of syringyl and guaiacyl lignins in poplar wood via time-of-flight secondary ion mass spectrometry C Zhou, Q Li, VL Chiang, LA Lucia, DP Griffis
Analytical Chemistry 83 (18), 7020-7026, 2011
80 2011 13C isotopic labeling studies of growth mechanisms in the metalorganic vapor phase epitaxy of GaAs RM Lum, JK Klingert, DW Kisker, SM Abys, FA Stevie
Journal of Crystal Growth 93 (1-4), 120-126, 1988
72 1988 