| Measurement technologies for precision positioning W Gao, SW Kim, H Bosse, H Haitjema, YL Chen, XD Lu, W Knapp, ... CIRP annals 64 (2), 773-796, 2015 | 599 | 2015 |
| On-machine and in-process surface metrology for precision manufacturing W Gao, H Haitjema, FZ Fang, RK Leach, CF Cheung, E Savio, JM Linares Cirp Annals 68 (2), 843-866, 2019 | 402 | 2019 |
| Precision nano-fabrication and evaluation of a large area sinusoidal grid surface for a surface encoder W Gao, T Araki, S Kiyono, Y Okazaki, M Yamanaka Precision Engineering 27 (3), 289-298, 2003 | 392 | 2003 |
| A surface motor-driven planar motion stage integrated with an XYθZ surface encoder for precision positioning W Gao, S Dejima, H Yanai, K Katakura, S Kiyono, Y Tomita Precision Engineering 28 (3), 329-337, 2004 | 233 | 2004 |
| Ductile regime nanomachining of single-crystal silicon carbide J Patten, W Gao, K Yasuto | 220 | 2005 |
| A six-degree-of-freedom surface encoder for precision positioning of a planar motion stage X Li, W Gao, H Muto, Y Shimizu, S Ito, S Dian Precision Engineering 37 (3), 771-781, 2013 | 207 | 2013 |
| Precision nanometrology: sensors and measuring systems for nanomanufacturing W Gao Springer, 2010 | 190 | 2010 |
| Measurement of multi-degree-of-freedom error motions of a precision linear air-bearing stage W Gao, Y Arai, A Shibuya, S Kiyono, CH Park Precision engineering 30 (1), 96-103, 2006 | 179 | 2006 |
| Nanomanufacturing—Perspective and applications FZ Fang, XD Zhang, W Gao, YB Guo, G Byrne, HN Hansen CIRP Annals 66 (2), 683-705, 2017 | 157 | 2017 |
| A sub-nanometric three-axis surface encoder with short-period planar gratings for stage motion measurement A Kimura, W Gao, WJ Kim, K Hosono, Y Shimizu, L Shi, L Zeng Precision engineering 36 (4), 576-585, 2012 | 151 | 2012 |
| Precision measurement of cylinder straightness using a scanning multi-probe system W Gao, J Yokoyama, H Kojima, S Kiyono Precision Engineering 26 (3), 279-288, 2002 | 150 | 2002 |
| A new multiprobe method of roundness measurements W Gao, S Kiyono, T Nomura Precision engineering 19 (1), 37-45, 1996 | 147 | 1996 |
| Design and construction of a two-degree-of-freedom linear encoder for nanometric measurement of stage position and straightness A Kimura, W Gao, Y Arai, Z Lijiang Precision Engineering 34 (1), 145-155, 2010 | 128 | 2010 |
| A three-axis autocollimator for detection of angular error motions of a precision stage W Gao, Y Saito, H Muto, Y Arai, Y Shimizu CIRP annals 60 (1), 515-518, 2011 | 123 | 2011 |
| A compact and sensitive two-dimensional angle probe for flatness measurement of large silicon wafers W Gao, PS Huang, T Yamada, S Kiyono Precision Engineering 26 (4), 396-404, 2002 | 119 | 2002 |
| A three-axis displacement sensor with nanometric resolution W Gao, A Kimura CIRP annals 56 (1), 529-532, 2007 | 116 | 2007 |
| Machine tool calibration: Measurement, modeling, and compensation of machine tool errors W Gao, S Ibaraki, MA Donmez, D Kono, JRR Mayer, YL Chen, K Szipka, ... International Journal of Machine Tools and Manufacture 187, 104017, 2023 | 115 | 2023 |
| High accuracy profile measurement of a machined surface by the combined method W Gao, S Kiyono Measurement 19 (1), 55-64, 1996 | 112 | 1996 |
| High-accuracy roundness measurement by a new error separation method W Gao, S Kiyono, T Sugawara Precision engineering 21 (2-3), 123-133, 1997 | 111 | 1997 |
| Surface profile measurement of a sinusoidal grid using an atomic force microscope on a diamond turning machine W Gao, J Aoki, BF Ju, S Kiyono Precision Engineering 31 (3), 304-309, 2007 | 101 | 2007 |
Yuki ShimizuDivision of Mechanical and Space Engineering, Hokkaido UniversityZweryfikowany adres z eng.hokudai.ac.jp
