Ultrastable low-noise current amplifier: A novel device for measuring small electric currents with high accuracy D Drung, C Krause, U Becker, H Scherer, FJ Ahlers
Review of Scientific Instruments 86 (2), 2015
104 2015 Validation of a quantized-current source with 0.2 ppm uncertainty F Stein, D Drung, L Fricke, H Scherer, F Hohls, C Leicht, M Götz, C Krause, ...
Applied Physics Letters 107 (10), 2015
99 2015 Quantum metrology triangle experiments: a status review H Scherer, B Camarota
Measurement Science and Technology 23 (12), 124010, 2012
93 2012 Precision measurement of the quantized anomalous Hall resistance at zero magnetic field M Götz, KM Fijalkowski, E Pesel, M Hartl, S Schreyeck, M Winnerlein, ...
Applied Physics Letters 112 (7), 2018
90 2018 Robustness of single-electron pumps at sub-ppm current accuracy level F Stein, H Scherer, T Gerster, R Behr, M Götz, E Pesel, C Leicht, ...
Metrologia 54 (1), S1, 2016
81 2016 Improving the traceable measurement and generation of small direct currents D Drung, M Götz, E Pesel, H Scherer
IEEE transactions on instrumentation and measurement 64 (11), 3021-3030, 2015
71 2015 Improved cryogenic current comparator setup with digital current sources M Gotz, D Drung, E Pesel, HJ Barthelmess, C Hinnrichs, C Aßmann, ...
IEEE Transactions on Instrumentation and Measurement 58 (4), 1176-1182, 2009
60 2009 Single-charge devices with ultrasmall Nb∕ AlOx∕ Nb trilayer Josephson junctions R Dolata, H Scherer, AB Zorin, J Niemeyer
Journal of Applied Physics 97 (5), 2005
49 2005 Electron counting capacitance standard with an improved five-junction R-pump B Camarota, H Scherer, MW Keller, SV Lotkhov, GD Willenberg, FJ Ahlers
Metrologia 49 (1), 8, 2011
43 2011 Single‐Electron Pumps and Quantum Current Metrology in the Revised SI H Scherer, HW Schumacher
Annalen der Physik 531 (5), 1800371, 2019
36 2019 Validation of the ultrastable low-noise current amplifier as travelling standard for small direct currents D Drung, C Krause, SP Giblin, S Djordjevic, F Piquemal, O Séron, ...
Metrologia 52 (6), 756, 2015
36 2015 Measurement of sub-picoampere direct currents with uncertainties below ten attoamperes C Krause, D Drung, H Scherer
Review of Scientific Instruments 88 (2), 2017
31 2017 Bistability in the current-induced breakdown of the quantum Hall effect FJ Ahlers, G Hein, H Scherer, L Bilek, H Nickel, R Losch, W Schlapp
Semiconductor science and technology 8 (12), 2062, 1993
31 1993 Single electron transistors with high-quality superconducting niobium islands R Dolata, H Scherer, AB Zorin, J Niemeyer
Applied physics letters 80 (15), 2776-2778, 2002
30 2002 Single electron transistors with R Dolata, H Scherer, AB Zorin, J Niemeyer
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2003
25 2003 Multilayer technique for fabricating Nb junction circuits exhibiting charging effects AB Pavolotsky, T Weimann, H Scherer, VA Krupenin, J Niemeyer, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1999
25 1999 Current scaling and electron heating between integer quantum Hall plateaus in GaAs/AlxGa1-xAs heterostructures H Scherer, L Schweitzer, FJ Ahlers, L Bliek, R Losch, W Schlapp
Semiconductor science and technology 10 (7), 959, 1995
23 1995 Steps toward a capacitance standard based on single-electron counting at PTB H Scherer, SV Lotkhov, GD Willenberg, AB Zorin
IEEE transactions on instrumentation and measurement 54 (2), 666-669, 2005
22 2005 The effect of thermal annealing on the properties of Al–AlOx–Al single electron tunneling transistors H Scherer, T Weimann, AB Zorin, J Niemeyer
Journal of Applied Physics 90 (5), 2528-2532, 2001
21 2001 Characterization of all-chromium tunnel junctions and single-electron tunneling devices fabricated by direct-writing multilayer technique H Scherer, T Weimann, P Hinze, BW Samwer, AB Zorin, J Niemeyer
Journal of Applied Physics 86 (12), 6956-6964, 1999
21 1999