Obserwuj
Aiman El-Maleh
Aiman El-Maleh
Professor of Computer Engineering, King Fahd University of Petroleum & Minerals
Zweryfikowany adres z kfupm.edu.sa - Strona główna
Tytuł
Cytowane przez
Cytowane przez
Rok
FPGA-based accelerators of deep learning networks for learning and classification: A review
A Shawahna, SM Sait, A El-Maleh
ieee Access 7, 7823-7859, 2018
5652018
Transistor-Level Defect Tolerant Digital System Design at the Nanoscale
AH El-Maleh, A Al-Yamani, BM Al-Hashimi
Research Proposal Submitted to Internal Track Research Grant Programs, 2007
2542007
A fault tolerance technique for combinational circuits based on selective-transistor redundancy
AT Sheikh, AH El-Maleh, MES Elrabaa, SM Sait
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (1), 224-237, 2016
1342016
Extended frequency-directed run-length code with improved application to system-on-a-chip test data compression
AH El-Maleh, RH Al-Abaji
9th international conference on electronics, circuits and systems 2, 449-452, 2002
1292002
Test data compression for system-on-a-chip using extended frequency-directed run-length code
AH El-Maleh
IET Computers & Digital Techniques 2 (3), 155-163, 2008
1002008
An efficient test relaxation technique for combinational & full-scan sequential circuits
A El-Maleh, A Al-Suwaiyan
Proceedings 20th IEEE VLSI Test Symposium (VTS 2002), 53-59, 2002
932002
Binary particle swarm optimization (BPSO) based state assignment for area minimization of sequential circuits
AH El-Maleh, AT Sheikh, SM Sait
Applied soft computing 13 (12), 4832-4840, 2013
902013
Complexity of sequential ATPG
TE Marchok, A El-Maleh, W Maly, J Rajski
Proceedings the European Design and Test Conference. ED&TC 1995, 252-261, 1995
881995
A geometric-primitives-based compression scheme for testing systems-on-a-chip
A El-Maleh, S Al Zahir, E Khan
Proceedings 19th IEEE VLSI Test Symposium. VTS 2001, 54-59, 2001
832001
Defect-tolerant N2-transistor structure for reliable nanoelectronic designs
AH El-Maleh, BM Al-Hashimi, A Melouki, F Khan
IET computers & digital techniques 3 (6), 570-580, 2009
682009
Cuckoo search based resource optimization of datacenters
SM Sait, A Bala, AH El-Maleh
Applied Intelligence 44, 489-506, 2016
652016
Test vector decomposition-based static compaction algorithms for combinational circuits
AH El-Maleh, YE Osais
ACM Transactions on Design Automation of Electronic Systems (TODAES) 8 (4 …, 2003
622003
Efficient test compression technique based on block merging
AH El-Maleh
IET Computers & Digital Techniques 2 (5), 327-335, 2008
582008
Simulation-based method for synthesizing soft error tolerant combinational circuits
AH El-Maleh, KAK Daud
IEEE Transactions on Reliability 64 (3), 935-948, 2015
562015
An efficient test relaxation technique for synchronous sequential circuits
A El-Maleh, K Al-Utaibi
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2004
522004
Finite state machine state assignment for area and power minimization
A El-Maleh, SM Sait, FN Khan
2006 IEEE International Symposium on Circuits and Systems (ISCAS), 4 pp., 2006
482006
A generalized modular redundancy scheme for enhancing fault tolerance of combinational circuits
AH El-Maleh, FC Oughali
Microelectronics Reliability 54 (1), 316-326, 2014
442014
Behavior and testability preservation under the retiming transformation
A El-Maleh, TE Marchok, J Rajski, W Maly
IEEE transactions on computer-aided design of integrated circuits and …, 1997
381997
A complexity analysis of sequential ATPG
TE Marchok, A El-Maleh, W Maly, J Rajski
IEEE transactions on computer-aided design of integrated circuits and …, 1996
371996
On test set preservation of retimed circuits
A El-Maleh, T Marchok, J Rajski, W Maly
Proceedings of the 32nd annual ACM/IEEE Design Automation Conference, 176-182, 1995
341995
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