| Geometric error measurement and compensation of machines—an update H Schwenke, W Knapp, H Haitjema, A Weckenmann, R Schmitt, ... CIRP annals 57 (2), 660-675, 2008 | 1269 | 2008 |
| Measurement technologies for precision positioning W Gao, SW Kim, H Bosse, H Haitjema, YL Chen, XD Lu, W Knapp, ... CIRP annals 64 (2), 773-796, 2015 | 600 | 2015 |
| Dimensional micro and nano metrology HN Hansen, K Carneiro, H Haitjema, L De Chiffre CIRP annals 55 (2), 721-743, 2006 | 429 | 2006 |
| On-machine and in-process surface metrology for precision manufacturing W Gao, H Haitjema, FZ Fang, RK Leach, CF Cheung, E Savio, JM Linares Cirp Annals 68 (2), 843-866, 2019 | 402 | 2019 |
| CIRP encyclopedia of production engineering S Chatti, L Laperrière, G Reinhart, T Tolio Springer, 2019 | 211 | 2019 |
| Modeling and verifying non-linearities in heterodyne displacement interferometry S Cosijns, H Haitjema, PHJ Schellekens Precision engineering 26 (4), 448-455, 2002 | 188 | 2002 |
| Bandwidth characteristics and comparisons of surface texture measuring instruments R Leach, H Haitjema Measurement Science and Technology 21 (3), 032001, 2010 | 150 | 2010 |
| Calibration and verification of areal surface texture measuring instruments RK Leach, CL Giusca, H Haitjema, C Evans, X Jiang CIRP annals 64 (2), 797-813, 2015 | 146 | 2015 |
| Development of a silicon-based nanoprobe system for 3-D measurements H Haitjema, WO Pril, PHJ Schellekens CIRP Annals 50 (1), 365-368, 2001 | 125 | 2001 |
| Bio-inspired textures for functional applications AP Malshe, S Bapat, KP Rajurkar, H Haitjema Cirp Annals 67 (2), 627-650, 2018 | 124 | 2018 |
| Deformation and wear of pyramidal, silicon-nitride AFM tips scanning micrometre-size features in contact mode ML Bloo, H Haitjema, WO Pril Measurement 25 (3), 203-211, 1999 | 98 | 1999 |
| The optical, electrical and structural properties of fluorine-doped, pyrolytically sprayed tindioxide coatings H Haitjema, JJP Elich, CJ Hoogendoorn Solar energy materials 18 (5), 283-297, 1989 | 80 | 1989 |
| Metrological characteristics for the calibration of surface topography measuring instruments: a review R Leach, H Haitjema, R Su, A Thompson Measurement Science and Technology 32 (3), 032001, 2020 | 77 | 2020 |
| Uncertainty in measurement of surface topography H Haitjema Surf.Topogr.:Metrol.Prop. 3 (2015), 035004, 2015 | 74 | 2015 |
| Calibration of displacement sensors up to 300 µm with nanometre accuracy and direct traceability to a primary standard of length H Haitjema, PHJ Schellekens, S Wetzels Metrologia 37 (1), 25, 2000 | 74 | 2000 |
| Uncertainty analysis of roughness standard calibration using stylus instruments H Haitjema Precision Engineering 22 (2), 110-119, 1998 | 67 | 1998 |
| Physical properties of pyrolytically sprayed tin-doped indium oxide coatings H Haitjema, JJP Elich Thin solid films 205 (1), 93-100, 1991 | 57 | 1991 |
| Noise bias removal in profile measurements H Haitjema, MAA Morel Measurement 38 (1), 21-29, 2005 | 56 | 2005 |
| The physical properties of fluorine-doped tin dioxide films and the influence of ageing and impurity effects H Haitjema, J Elich Solar energy materials 16 (1-3), 79-90, 1987 | 52 | 1987 |
| Surface Parameter H Haitjema CIRP Encyclopedia of Production Engineering, 1199-1202, 2014 | 51* | 2014 |
Richard LeachUniversity of NottinghamZweryfikowany adres z nottingham.ac.uk