Distribution aligning refinery of pseudo-label for imbalanced semi-supervised learning J Kim, Y Hur, S Park, E Yang, SJ Hwang, J Shin Advances in Neural Information Processing Systems (NeurIPS), 2020 | 210 | 2020 |
Appointment scheduling at a multidisciplinary outpatient clinic using stochastic programming Y Hur, JF Bard, DJ Morrice Naval Research Logistics (NRL) 68 (1), 134-155, 2021 | 14 | 2021 |
A stochastic optimization approach to shift scheduling with breaks adjustments Y Hur, JF Bard, M Frey, F Kiermaier Computers & Operations Research 107, 127-139, 2019 | 14 | 2019 |
Hierarchy machine set-up for multi-pass lot scheduling at semiconductor assembly and test facilities Y Hur, JF Bard, R Chacon International Journal of Production Research 57 (14), 4351-4370, 2019 | 9 | 2019 |
A Simple Framework for Robust Out-of-Distribution Detection Y Hur, E Yang, SJ Hwang IEEE Access 10, 23086-23097, 2022 | 5 | 2022 |
An investigation of shift and break flexibility with real-time break assignments using a rolling horizon approach Y Hur, JF Bard, M Frey, F Kiermaier Flexible Services and Manufacturing Journal 31 (1), 174-211, 2019 | 5 | 2019 |
Quantum Computing for Airline Problems Y Hur Airline Group of the International Federation of Operational Research …, 2018 | 4 | 2018 |
Malaysian Name-based Ethnicity Classification using LSTM Y Hur KSII TRANSACTIONS ON INTERNET AND INFORMATION SYSTEMS 12 (6), 3855-3867, 2022 | 2 | 2022 |
Optimization Models for Manufacturing and Personnel Scheduling Y Hur University of Texas at Austin, 2017 | 2 | 2017 |
Method and apparatus with image analysis HUR Youngbum, J Shin, T Jihoon US Patent App. 17/574,959, 2022 | 1 | 2022 |
Self-Supervised Anomaly Detection using Outliers for Multivariate Time Series J Hong, Y Hur IEEE Access 12, 197516-197528, 2024 | | 2024 |
TripletMatch: Wafer Map Defect Detection Using Semi-Supervised Learning and Triplet Loss with Mixup C Lim, Y Hur IEEE Access 12, 182726 - 182736, 2024 | | 2024 |
Consistency Regularization for Training Confidence-Calibrated Classifiers Y Hur, J Tack, E Yang, SJ Hwang, J Shin ICML Workshop on Uncertainty & Robustness in Deep Learning (UDL), 2021 | | 2021 |