| Reduction in the thermal conductivity of single crystalline silicon by phononic crystal patterning PE Hopkins, CM Reinke, MF Su, RH Olsson III, EA Shaner, ZC Leseman, ... Nano letters 11 (1), 107-112, 2010 | 504 | 2010 |
| Effects of surface roughness and oxide layer on the thermal boundary conductance at aluminum/silicon interfaces PE Hopkins, LM Phinney, JR Serrano, TE Beechem 2010 14th International Heat Transfer Conference, 313-319, 2010 | 240 | 2010 |
| Criteria for cross-plane dominated thermal transport in multilayer thin film systems during modulated laser heating PE Hopkins, JR Serrano, LM Phinney, SP Kearney, TW Grasser, ... Journal of Heat Transfer 132 (8), 081302, 2010 | 230 | 2010 |
| Invited Article: Simultaneous mapping of temperature and stress in microdevices using micro-Raman spectroscopy T Beechem, S Graham, SP Kearney, LM Phinney, JR Serrano Review of Scientific Instruments 78 (6), 061301, 2007 | 208 | 2007 |
| Effect of dislocation density on thermal boundary conductance across GaSb/GaAs interfaces PE Hopkins, JC Duda, SP Clark, CP Hains, TJ Rotter, LM Phinney, ... Applied Physics Letters 98 (16), 161913, 2011 | 99 | 2011 |
| Origin of reduction in phonon thermal conductivity of microporous solids PE Hopkins, PT Rakich, RH Olsson, IF El-Kady, LM Phinney Applied Physics Letters 95 (16), 161902, 2009 | 93 | 2009 |
| Measuring the thermal conductivity of porous, transparent SiO2 films with time domain thermoreflectance PE Hopkins, B Kaehr, LM Phinney, TP Koehler, AM Grillet, D Dunphy, ... Journal of Heat Transfer 133 (6), 061601, 2011 | 76 | 2011 |
| Rough surface adhesion in the presence of capillary condensation FW DelRio, ML Dunn, LM Phinney, CJ Bourdon, MP de Boer Applied physics letters 90 (16), 163104, 2007 | 76 | 2007 |
| Ultrashort-pulse laser heating of silicon to reduce microstructure adhesion K Fushinobu, LM Phinney, NC Tien International Journal of Heat and Mass Transfer 39 (15), 3181-3186, 1996 | 62 | 1996 |
| Spatially resolved temperature mapping of electrothermal actuators by surface Raman scattering SP Kearney, LM Phinney, MS Baker Journal of Microelectromechanical Systems 15 (2), 314-321, 2006 | 61 | 2006 |
| A thermomechanical model for adhesion reduction of MEMS cantilevers JW Rogers, TJ Mackin, LM Phinney Journal of microelectromechanical systems 11 (5), 512-520, 2002 | 59 | 2002 |
| Surface adhesion reduction in silicon microstructures using femtosecond laser pulses NC Tien, S Jeong, LM Phinney, K Fushinobu, J Bokor Applied physics letters 68 (2), 197-199, 1996 | 59 | 1996 |
| Thermal conductivity in nanoporous gold films during electron-phonon nonequilibrium PE Hopkins, PM Norris, LM Phinney, SA Policastro, RG Kelly Journal of Nanomaterials 2008, 22, 2008 | 58 | 2008 |
| Micro-Raman thermometry of thermal flexure actuators JR Serrano, LM Phinney, SP Kearney Journal of Micromechanics and Microengineering 16 (7), 1128, 2006 | 54 | 2006 |
| Phonon considerations in the reduction of thermal conductivity in phononic crystals PE Hopkins, LM Phinney, PT Rakich, RH Olsson, I El-Kady Applied Physics A 103 (3), 575-579, 2011 | 50 | 2011 |
| Process yields for laser repair of aged, stiction-failed, MEMS devices JW Rogers, LM Phinney Journal of microelectromechanical systems 10 (2), 280-285, 2001 | 47 | 2001 |
| Thermal contact conductance of adhered microcantilevers ST Huxtable, DG Cahill, LM Phinney Journal of applied physics 95 (4), 2102-2108, 2004 | 43 | 2004 |
| Thermal conductivity measurements on polycrystalline silicon microbridges using the 3ω technique PE Hopkins, LM Phinney Journal of Heat Transfer 131 (4), 043201, 2009 | 42 | 2009 |
| Raman thermometry of polysilicon microelectro-mechanical systems in the presence of an evolving stress MR Abel, S Graham, JR Serrano, SP Kearney, LM Phinney Journal of heat transfer 129 (3), 329-334, 2007 | 38 | 2007 |
| Re-examining electron-fermi relaxation in gold films with a nonlinear thermoreflectance model PE Hopkins, LM Phinney, JR Serrano Journal of Heat Transfer 133 (4), 044505, 2011 | 34 | 2011 |
Patrick E. HopkinsUniversity of VirginiaZweryfikowany adres z virginia.edu
