| Materials, processes, and facile manufacturing for bioresorbable electronics: a review X Yu, W Shou, BK Mahajan, X Huang, H Pan Advanced Materials 30 (28), 1707624, 2018 | 174 | 2018 |
| Low‐cost manufacturing of bioresorbable conductors by evaporation–condensation‐mediated laser printing and sintering of Zn nanoparticles W Shou, BK Mahajan, B Ludwig, X Yu, J Staggs, X Huang, H Pan Advanced Materials 29 (26), 1700172, 2017 | 117 | 2017 |
| Mechanically milled irregular zinc nanoparticles for printable bioresorbable electronics BK Mahajan, X Yu, W Shou, H Pan, X Huang Small 13 (17), 1700065, 2017 | 74 | 2017 |
| Materials, mechanics, and patterning techniques for elastomer-based stretchable conductors X Yu, BK Mahajan, W Shou, H Pan Micromachines 8 (1), 7, 2016 | 72 | 2016 |
| A device-to-system perspective regarding self-heating enhanced hot carrier degradation in modern field-effect transistors: A topical review MA Alam, BK Mahajan, YP Chen, W Ahn, H Jiang, SH Shin IEEE Transactions on Electron Devices 66 (11), 4556-4565, 2019 | 57 | 2019 |
| Enlarged broad band photodetection using Indium doped TiO2 alloy thin film MB Sarkar, A Mondal, B Choudhuri, BK Mahajan, S Chakrabartty, ... Journal of alloys and compounds 615, 440-445, 2014 | 49 | 2014 |
| Electrothermal performance limit of β-Ga2O3 field-effect transistors BK Mahajan, YP Chen, J Noh, PD Ye, MA Alam Applied Physics Letters 115 (17), 2019 | 36 | 2019 |
| Aerosol printing and photonic sintering of bioresorbable zinc nanoparticle ink for transient electronics manufacturing BK Mahajan, B Ludwig, W Shou, X Yu, E Fregene, H Xu, H Pan, X Huang Science China Information Sciences 61, 1-10, 2018 | 35 | 2018 |
| Positive Bias Temperature Instability and Hot Carrier Degradation of Back-End-of-Line, nm-Thick, In2O3 Thin-Film Transistors YP Chen, M Si, BK Mahajan, Z Lin, DY Peide, MA Alam IEEE Electron Device Letters 43 (2), 232-235, 2021 | 22 | 2021 |
| Barrier modification of metal-contact on silicon by sub-2 nm platinum nanoparticles and thin dielectrics H Zheng, BK Mahajan, SC Su, S Mukherjee, K Gangopadhyay, ... Scientific Reports 6 (1), 25234, 2016 | 21 | 2016 |
| Ag Nanoparticles Sheltered In2O3 Nanowire as a Capacitive MOS Memory Device A Nath, BK Mahajan, MB Sarkar IEEE Transactions on Nanotechnology 19, 856-863, 2020 | 18 | 2020 |
| Enhancing detectivity of indium-oxide-based photodetectors via vertical nanostructuring through glancing angle deposition A Nath, BK Mahajan, LR Singh, S Vishwas, RK Nanda, MB Sarkar Journal of Electronic Materials 50, 3722-3730, 2021 | 17 | 2021 |
| A novel ‘IV spectroscopy’technique to deconvolve threshold voltage and mobility degradation in LDMOS transistors YP Chen, BK Mahajan, D Varghese, S Krishnan, V Reddy, MA Alam 2020 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2020 | 13 | 2020 |
| An analytical model of hot carrier degradation in LDMOS transistors: Rediscovery of universal scaling BK Mahajan, YP Chen, MA Alam IEEE Transactions on Electron Devices 68 (8), 3923-3929, 2021 | 11 | 2021 |
| Self-heating and reliability-aware “intrinsic” safe operating Area of wide bandgap semiconductors—an analytical approach BK Mahajan, YP Chen, N Zagni, MA Alam IEEE Transactions on Device and Materials Reliability 21 (4), 518-527, 2021 | 10 | 2021 |
| Synthesis and detailed characterizations of Ag nanoparticles coated In2O3 nanostructured devices: An analytical and experimental approach A Nath, BK Mahajan, A Mondal, LR Singh, MB Sarkar Journal of Vacuum Science & Technology B 39 (5), 2021 | 10 | 2021 |
| Improved photo-detection using zigzag TiO2 nanostructures as an active medium AK Tiwari, A Mondal, BK Mahajan, B Choudhuri, T Goswami, MB Sarkar, ... Journal of Nanoscience and Nanotechnology 15 (7), 5099-5104, 2015 | 10 | 2015 |
| Hot carrier degradation in classical and emerging logic and power electronic devices: Rethinking reliability for next-generation electronics MA Alam, BK Mahajan, YP Cheri 2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2021 | 9 | 2021 |
| Quantifying region-specific hot carrier degradation in LDMOS transistors using a novel charge pumping technique BK Mahajan, YP Chen, D Varghese, V Reddy, S Krishnan, MA Alam 2021 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2021 | 9 | 2021 |
| Super single pulse charge pumping technique for profiling interfacial defects YP Chen, BK Mahajan, D Varghese, S Krishnan, V Reddy, MA Alam IEEE Transactions on Electron Devices 68 (2), 726-732, 2021 | 9 | 2021 |
Muhammad Ashraful AlamJai N. Gupta Distinguished Professor of Electrical Engineering, Purdue UniversityZweryfikowany adres z purdue.edu