Benjamen P. Reed

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	Wszystkie	Od 2020
Cytowania	202	201
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Alexander ShardNPL Fellow, National Physical LaboratoryZweryfikowany adres z npl.co.uk
Sofia MarchesinibpZweryfikowany adres z npl.co.uk
Andrew J PollardPrincipal Research Scientist, National Physical Laboratory (NPL)Zweryfikowany adres z npl.co.uk
David J H CantNational Physical Laboratory UKZweryfikowany adres z npl.co.uk
S. P. CooilPostdoctoral Researcher - University of Oslo, Centre of Materials Science and Nanotechnology.Zweryfikowany adres z fys.uio.no
Justin W. WellsProfessor of physics, University of OsloZweryfikowany adres z fys.uio.no
Barry BrennanAtlantic Technological UniversityZweryfikowany adres z atu.ie
Wendy R FlavellProfessor of Surface PhysicsZweryfikowany adres z manchester.ac.uk
Ben F. SpencerThe University of ManchesterZweryfikowany adres z manchester.ac.uk
Keith R. PatonNational Physical LaboratoryZweryfikowany adres z npl.co.uk
Mauricio J PrietoFritz-Haber-Institut der Max-Planck-GesellschaftZweryfikowany adres z fhi-berlin.mpg.de
Andrew G ThomasSenior lecturer, Department of Materials and Photon Science Institute, University of ManchesterZweryfikowany adres z manchester.ac.uk
Ruben Ahumada-LazoTecnológico de MonterreyZweryfikowany adres z tec.mx
Sven TougaardProfessor of physics, University of Southern DenmarkZweryfikowany adres z sdu.dk
Suresh ManiyarasuPostdoctoral Researcher, Helmholtz-Zentrum BerlinZweryfikowany adres z helmholtz-berlin.de
Andrew EvansProfessor of Physics, Aberystwyth UniversityZweryfikowany adres z aber.ac.uk
Antonija Grubišić ČaboZernike Institute for Advanced Mateirals, University of GroningenZweryfikowany adres z rug.nl
Liviu C. TănaseFritz-Haber Institute of the Max Planck SocietyZweryfikowany adres z fhi-berlin.mpg.de
Håkon Ivarssønn RøstPostdoctoral Researcher, University of BergenZweryfikowany adres z uib.no
Professor Krzysztof KoziolCranfield UniversityZweryfikowany adres z cranfield.ac.uk

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Benjamen P. Reed

National Physical Laboratory

Zweryfikowany adres z npl.co.uk

Surface Analysis X-ray Photoelectron Spectroscopy Graphene Energy Materials


Tytuł Sortuj wg cytatów Sortuj wg roku Sortuj wg tytułu	Cytowane przez Cytowane przez	Rok
Inelastic background modelling applied to hard X-ray photoelectron spectroscopy of deeply buried layers: A comparison of synchrotron and lab-based (9.25 keV) measurements BF Spencer, S Maniyarasu, BP Reed, DJH Cant, R Ahumada-Lazo, ... Applied Surface Science 541, 148635, 2021	54	2021
Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density … BP Reed, DJH Cant, SJ Spencer, AJ Carmona-Carmona, A Bushell, ... Journal of Vacuum Science & Technology A 38 (6), 2020	24	2020
Gas physisorption measurements as a quality control tool for the properties of graphene/graphite powders S Marchesini, P Turner, KR Paton, BP Reed, B Brennan, K Koziol, ... Carbon 167, 585-595, 2020	23	2020
Rapid monitoring of graphene exfoliation using NMR proton relaxation S Marchesini, P Turner, KR Paton, BP Reed, AJ Pollard Nanoscale 13 (34), 14518-14524, 2021	15	2021
Al Kα XPS reference spectra of polyethylene for all instrument geometries AG Shard, BP Reed Journal of Vacuum Science & Technology A 38 (6), 2020	15	2020
The influence of sample preparation on XPS quantification of oxygen-functionalised graphene nanoplatelets BP Reed, S Marchesini, G Chemello, DJ Morgan, N Vyas, T Howe, ... Carbon 211, 118054, 2023	12	2023
Surface analysis of pristine and cycled NMC/graphite lithium-ion battery electrodes: addressing the measurement challenges S Marchesini, BP Reed, H Jones, L Matjacic, TE Rosser, Y Zhou, ... ACS Applied Materials & Interfaces 14 (47), 52779-52793, 2022	11	2022
The Diamond (111) Surface Reconstruction and Epitaxial Graphene Interface BP Reed, ME Bathen, JWR Ash, CJ Meara, AA Zakharov, JP Goss, ... arXiv preprint arXiv:2202.09151, 2022	9	2022
Low-Temperature Growth of Graphene on a Semiconductor HI Røst, RK Chellappan, FS Strand, A Grubišić-Čabo, BP Reed, ... The Journal of Physical Chemistry C 125 (7), 4243-4252, 2021	9	2021
Quantitative and Qualitative Analyses of Mass Spectra of OEL Materials by Artificial Neural Network and Interface Evaluation: Results from a VAMAS Interlaboratory Study S Aoyagi, DJH Cant, M Dürr, A Eyres, S Fearn, IS Gilmore, S Iida, ... Analytical Chemistry 95 (40), 15078-15085, 2023	5	2023
Ionic liquid [PMIM]+[NTf2]−(Solarpur®) characterized by XPS BP Reed, J Radnik, AG Shard Surface Science Spectra 29 (1), 2022	5	2022
Influence of the Morphology on the Functionalization of Graphene Nanoplatelets Analyzed by Comparative Photoelectron Spectroscopy with Soft and Hard X‐Rays G Chemello, X Knigge, D Ciornii, BP Reed, AJ Pollard, CA Clifford, ... Advanced Materials Interfaces 10 (20), 2300116, 2023	4	2023
Understanding the bonding mechanisms of organic molecules deposited on graphene for biosensing applications EJ Legge, MM Ali, HY Abbasi, BP Reed, B Brennan, L Matjačić, Z Tehrani, ... The Journal of chemical physics 155 (17), 2021	4	2021
Magic angle HAXPES DJH Cant, BP Reed, BF Spencer, WR Flavell, AG Shard Journal of Electron Spectroscopy and Related Phenomena 264, 147311, 2023	3	2023
In situ methods: discoveries and challenges: general discussion R Arrigo, D Aureau, P Bhatt, MA Buckingham, JJC Counter, G D’Acunto, ... Faraday Discussions 236, 219-266, 2022	2	2022
Developments in the Catalytic Graphitisation of Diamond and Silicon Carbide Surfaces B Reed Aberystwyth University, 2020	2	2020
VAMAS TWA 2, 2019, sub-project A27:" intensity calibration for XPS instruments using low-density poly (ethylene)": protocol for analysis BP Reed, SJ Spencer, AG Shard	2	2019
Ensuring the Global Comparability of XPS Data Through Intensity Scale Calibration: Summary of ISO 5861: 2024 BP Reed, P Roussel, A Bushell, AG Shard Surface and Interface Analysis 57 (1), 48-51, 2025	1	2025
Final report of CCQM-K157 for the measurement of the amount of substance of HfO₂ expressed as the thickness of nm films KJ Kim, H Yu, SM Lee, JH Kwon, H Ruh, J Radnik, BS Archanjo, ... Metrologia 60 (1A), 08010, 2023	1	2023
A Simplified Method for Patterning Graphene on Dielectric Layers HI Røst, BP Reed, FS Strand, JA Durk, DA Evans, A Grubišić-Čabo, ... ACS Applied Materials & Interfaces 13 (31), 37510-37516, 2021	1	2021

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