R F Egerton

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Marek MalacNanotechnology Research Centre, National Research Council and Dept. of Physics, U of AlbertaE-mail confirmado em ualberta.ca
Shangcong ChengGuest Scientist, Molecular Foundry of Lawrence Berkeley National LabE-mail confirmado em lbl.gov
Feng WangArgonne National LaboratoryE-mail confirmado em anl.gov
Marco BeleggiaUniversity of Modena and Reggio EmiliaE-mail confirmado em unimore.it
Peter RezProfessor of Physics, Arizona State UniversityE-mail confirmado em asu.edu
Frank HegmannProfessor, Department of Physics, University of Alberta, CanadaE-mail confirmado em ualberta.ca
M. Sergio MorenoResearch Fellow (Group Leader) in CONICET. Centro Atómico Bariloche - San Carlos de BarilocheE-mail confirmado em cab.cnea.gov.ar
Oksana OstroverkhovaProfessor of Physics, Oregon State UniversityE-mail confirmado em science.oregonstate.edu
Toshihiro AokiIrvine Materials Research Institute, University of California, IrvineE-mail confirmado em uci.edu
Tracy LovejoyScientist, NionE-mail confirmado em nion.com
Ondrej KrivanekNion Co., Arizona State U.E-mail confirmado em nion.com
Robert A. McLeodLead Software Architect Scientist, Hitachi High-tech Canada Inc.E-mail confirmado em hitachi-hightech.com
Mark FreemanDepartment of Physics, University of AlbertaE-mail confirmado em ualberta.ca
Philip E BatsonResearch Professor of Physics, Rutgers UniversityE-mail confirmado em physics.rutgers.edu
Dong Su（苏东）Institute of Physics, CAS; Past: Brookhaven National Laboratory；Stony Brook Univ.; ASU; EPFLE-mail confirmado em iphy.ac.cn
John J. RehrProfessor of Physics, University of WashingtonE-mail confirmado em uw.edu
Stephen PennycookUniversity of TennesseeE-mail confirmado em utk.edu

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R F Egerton

Emeritus Professor, University of Alberta

E-mail confirmado em ualberta.ca - Página inicial

electron microscopy energy-loss spectroscopy radiation damage


Título Ordenar por citações Ordenar por ano Ordenar por título	Citado por Citado por	Ano
Electron energy-loss spectroscopy in the electron microscope RF Egerton Springer Science & Business Media, 2011	7511	2011
Radiation damage in the TEM and SEM RF Egerton, P Li, M Malac Micron 35 (6), 399-409, 2004	2490	2004
Physical principles of electron microscopy RF Egerton Springer, 2005	2135	2005
Electron energy-loss spectroscopy in the TEM RF Egerton Reports on Progress in Physics 72 (1), 016502, 2008	1116	2008
EELS log‐ratio technique for specimen‐thickness measurement in the TEM T Malis, SC Cheng, RF Egerton Journal of electron microscopy technique 8 (2), 193-200, 1988	1052	1988
Vibrational spectroscopy in the electron microscope OL Krivanek, TC Lovejoy, N Dellby, T Aoki, RW Carpenter, P Rez, ... Nature 514 (7521), 209-212, 2014	808	2014
Energy-filtering transmission electron microscopy C Deininger, RF Egerton, F Hofer, B Jouffrey, D Krahl, RD Leapman, ... Springer, 2013	452	2013
Control of radiation damage in the TEM RF Egerton Ultramicroscopy 127, 100-108, 2013	413	2013
Radiation damage to organic and inorganic specimens in the TEM RF Egerton Micron 119, 72-87, 2019	390	2019
Mechanisms of radiation damage in beam‐sensitive specimens, for TEM accelerating voltages between 10 and 300 kV RF Egerton Microscopy research and technique 75 (11), 1550-1556, 2012	332	2012
Basic questions related to electron-induced sputtering in the TEM RF Egerton, R McLeod, F Wang, M Malac Ultramicroscopy 110 (8), 991-997, 2010	302	2010
K-shell ionization cross-sections for use in microanalysis RF Egerton Ultramicroscopy 4 (2), 169-179, 1979	281	1979
Inelastic scattering of 80 keV electrons in amorphous carbon RF Egerton Philosophical Magazine 31 (1), 199-215, 1975	228	1975
Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy RF Egerton Ultramicroscopy 107 (8), 575-586, 2007	224	2007
Bandlike transport in pentacene and functionalized pentacene thin films revealed by subpicosecond transient photoconductivity measurements O Ostroverkhova, DG Cooke, S Shcherbyna, RF Egerton, FA Hegmann, ... Physical Review B—Condensed Matter and Materials Physics 71 (3), 035204, 2005	215	2005
Formulae for light-element micro analysis by electron energy-loss spectrometry RF Egerton Ultramicroscopy 3, 243-251, 1978	202	1978
Measurement of local thickness by electron energy-loss spectroscopy RF Egerton, SC Cheng Ultramicroscopy 21 (3), 231-244, 1987	192	1987
Choice of operating voltage for a transmission electron microscope RF Egerton Ultramicroscopy 145, 85-93, 2014	188	2014
Optical and transient photoconductive properties of pentacene and functionalized pentacene thin films: Dependence on film morphology O Ostroverkhova, S Shcherbyna, DG Cooke, RF Egerton, FA Hegmann, ... Journal of Applied Physics 98 (3), 2005	169	2005
Fabrication of submicrometer regular arrays of pillars and helices M Malac, RF Egerton, MJ Brett, B Dick Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1999	149	1999

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