Luiz Fernando Zagonel

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Mathieu KociakResearcher, Centre National de la Recherche Scientifique (CNRS)/ Université Paris SudE-mail confirmado em lps.u-psud.fr
F. Alvarez (https://orcid.org/0000-0002...Full Professor, Instituto de Fisica, Unversidad de CampinasE-mail confirmado em ifi.unicamp.br
STEPHAN OdileUniversité Paris-SudE-mail confirmado em u-pud.fr
Maria TchernychevaResearcher at Centre de Nanosciences et de Nanotechnologies (C2N), CNRS, Universite Paris-SudE-mail confirmado em u-psud.fr
Lorenzo RiguttiUniversity of Rouen NormandieE-mail confirmado em univ-rouen.fr
Marcel TENCEE-mail confirmado em u-psud.fr
Gwénolé JacopinInstitut Néel - CNRS, Univ. Grenoble Alpes, FranceE-mail confirmado em epfl.ch
Aude BaillyCNRS, Institut NéelE-mail confirmado em neel.cnrs.fr
Ricardo Javier Peña RománPost-doctoral researcher at Max Planck Institute for Solid State Research, Stuttgart, GermanyE-mail confirmado em fkf.mpg.de
Yves AuadUniversité Paris SaclayE-mail confirmado em universite-paris-saclay.fr
Lázaro A. PadilhaAssociate Professor, Universidade Estadual de CampinasE-mail confirmado em ifi.unicamp.br
Andres de Luna BugalloCENTRO DE FISICA APLICADA Y TECNOLOGIA AVANZADA UNAME-mail confirmado em fata.unam.mx
Ana Flavia NogueiraProfessor, University of CampinasE-mail confirmado em unicamp.br
Luiz H G TizeiResearch Director - Centre National de la Recherche Scientifique (CNRS)E-mail confirmado em cnrs.fr
Arthur LosquinCEAE-mail confirmado em cea.fr
Luiz Gustavo BonatoPost-doctoral researcher, Istituto Italiano di TecnologiaE-mail confirmado em iit.it
Diogo B. AlmeidaAdjunct Professor at Universidade Federal do ABCE-mail confirmado em ufabc.edu.br
Javier García de AbajoICFO and ICREAE-mail confirmado em nanophotonics.es
Francisco de la PeñaLecturerE-mail confirmado em univ-lille1.fr
Gabriel NagamineUniversity of BernE-mail confirmado em unibe.ch

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Luiz Fernando Zagonel

Universidade Estadual de Campinas - "Gleb Wataghin" Institute of Physics

E-mail confirmado em unicamp.br - Página inicial

Microscopy semiconductors plasma Nanotechnology New Instrumentation


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Nanometer scale spectral imaging of quantum emitters in nanowires and its correlation to their atomically resolved structure LF Zagonel, S Mazzucco, M Tencé, K March, R Bernard, B Laslier, ... Nano letters 11 (2), 568-573, 2011	237	2011
Ultraviolet photodetector based on GaN/AlN quantum disks in a single nanowire L Rigutti, M Tchernycheva, A De Luna Bugallo, G Jacopin, FH Julien, ... Nano letters 10 (8), 2939-2943, 2010	210	2010
Unveiling nanometer scale extinction and scattering phenomena through combined electron energy loss spectroscopy and cathodoluminescence measurements A Losquin, LF Zagonel, V Myroshnychenko, B Rodríguez-González, ... Nano letters 15 (2), 1229-1237, 2015	196	2015
Cathodoluminescence in the scanning transmission electron microscope M Kociak, LF Zagonel Ultramicroscopy 176, 112-131, 2017	152	2017
Influence of the process temperature on the steel microstructure and hardening in pulsed plasma nitriding LF Zagonel, CA Figueroa, R Droppa Jr, F Alvarez Surface and Coatings Technology 201 (1-2), 452-457, 2006	119	2006
Electron microscopy (big and small) data analysis with the open source software package HyperSpy F de la Peña, T Ostasevicius, VT Fauske, P Burdet, P Jokubauskas, ... Microscopy and Microanalysis 23 (S1), 214-215, 2017	100	2017
Growth mechanism and properties of InGaN insertions in GaN nanowires G Tourbot, C Bougerol, F Glas, LF Zagonel, Z Mahfoud, S Meuret, P Gilet, ... Nanotechnology 23 (13), 135703, 2012	95	2012
hyperspy/hyperspy: HyperSpy 1.3 F De La Peña, T Ostasevicius, V Tonaas Fauske, P Burdet, ... Zenodo, 2017	85*	2017
Imaging and quantifying the morphology of an organic–inorganic nanoparticle at the sub-nanometre level MM Van Schooneveld, A Gloter, O Stephan, LF Zagonel, R Koole, ... Nature nanotechnology 5 (7), 538-544, 2010	83	2010
Single-wire light-emitting diodes based on GaN wires containing both polar and nonpolar InGaN/GaN quantum wells G Jacopin, ADL Bugallo, P Lavenus, L Rigutti, FH Julien, LF Zagonel, ... Applied Physics Express 5 (1), 014101, 2011	76	2011
Photocatalytic hydrogen production of Co (OH) 2 nanoparticle-coated α-Fe 2 O 3 nanorings H Wender, RV Gonçalves, CSB Dias, MJM Zapata, LF Zagonel, ... Nanoscale 5 (19), 9310-9316, 2013	75	2013
Nanosized precipitates in H13 tool steel low temperature plasma nitriding LF Zagonel, J Bettini, RLO Basso, P Paredez, H Pinto, CM Lepienski, ... Surface and Coatings Technology 207, 72-78, 2012	71	2012
Direct quantification of gold along a single Si nanowire A Bailly, O Renault, N Barrett, LF Zagonel, P Gentile, N Pauc, F Dhalluin, ... Nano letters 8 (11), 3709-3714, 2008	70	2008
Influence of the microstructure on the residual stresses of nitrided iron–chromium alloys NEV Diaz, RE Schacherl, LF Zagonel, EJ Mittemeijer Acta Materialia 56 (6), 1196-1208, 2008	66	2008
Orientation-dependent work function of in situ annealed strontium titanate LF Zagonel, M Bäurer, A Bailly, O Renault, M Hoffmann, SJ Shih, ... Journal of Physics: Condensed Matter 21 (31), 314013, 2009	65	2009
Band gap measurements of monolayer h-BN and insights into carbon-related point defects RJP Román, FJRC Costa, A Zobelli, C Elias, P Valvin, G Cassabois, B Gil, ... 2D Materials 8 (4), 044001, 2021	57	2021
Seeing and measuring in colours: Electron microscopy and spectroscopies applied to nano-optics M Kociak, O Stéphan, A Gloter, LF Zagonel, LHG Tizei, M Tencé, K March, ... Comptes Rendus Physique 15 (2-3), 158-175, 2014	53	2014
Energy-filtered XPEEM with NanoESCA using synchrotron and laboratory X-ray sources: Principles and first demonstrated results O Renault, N Barrett, A Bailly, LF Zagonel, D Mariolle, JC Cezar, ... Surface science 601 (20), 4727-4732, 2007	51	2007
Stimulated electron energy loss and gain in an electron microscope without a pulsed electron gun P Das, JD Blazit, M Tencé, LF Zagonel, Y Auad, YH Lee, XY Ling, ... Ultramicroscopy 203, 44-51, 2019	47	2019
Visualizing highly localized luminescence in GaN/AlN heterostructures in nanowires LF Zagonel, L Rigutti, M Tchernycheva, G Jacopin, R Songmuang, ... Nanotechnology 23 (45), 455205, 2012	47	2012

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