| Ionizing radiation hardness tests of GaN HEMTs for harsh environments ACV Bôas, MAA de Melo, RBB Santos, R Giacomini, NH Medina, ... Microelectronics Reliability 116, 114000, 2021 | 33 | 2021 |
| Improving MOSFETs’ TID tolerance through diamond layout style LE Seixas, OL Goncalez, R Souza, S Finco, RG Vaz, GA Da Silva, ... IEEE Transactions on Device and Materials Reliability 17 (3), 593-595, 2017 | 20 | 2017 |
| A current limiting switch for applications in space power systems AV Dias, JA Pomilio, S Finco 2017 IEEE southern power electronics conference (SPEC), 1-6, 2017 | 19 | 2017 |
| Study of proton radiation effects among diamond and rectangular gate MOSFET layouts LE Seixas, S Finco, MAG Silveira, NH Medina, SP Gimenez Materials Research Express 4 (1), 015901, 2017 | 18 | 2017 |
| Mask configurable smart power circuits-applications and GF-NMOS devices MC Simas, S Finco, AP Casimiro, PM Santos, F Behrens, C Mammana US Patent App. 09/915,571, 2002 | 17 | 2002 |
| SAFIIRA: A heavy-ion multi-purpose irradiation facility in Brazil VAP Aguiar, NH Medina, N Added, ELA Macchione, SG Alberton, ... Review of Scientific Instruments 91 (5), 2020 | 16 | 2020 |
| Breakdown voltage improvement of standard MOS technologies targeted at smart power PM Santos, MIC Simas, M Lanca, S Finco, FH Behrens IAS'95. Conference Record of the 1995 IEEE Industry Applications Conference …, 1995 | 16 | 1995 |
| Minimizing the TID effects due to gamma rays by using diamond layout for MOSFETs LE Seixas, OL Gonçalez, RG Vaz, AC da Costa Telles, S Finco, ... Journal of Materials Science: Materials in Electronics 30, 4339-4351, 2019 | 14 | 2019 |
| Power integrated circuit drives based on HV NMOS S Finco, P Tavares, ACF De Mattos, MIC Simas 2002 IEEE 33rd Annual IEEE Power Electronics Specialists Conference …, 2002 | 14 | 2002 |
| A smart power integrated circuit educational tool S Finco, W Melo, F Castaldo, J Pomilio, BV Borges, P Santos IEEE transactions on power electronics 22 (4), 1290-1302, 2007 | 13 | 2007 |
| Radiation Hardness of GaN HEMTs to TID Effects: COTS for harsh environments ACV Bôas, MAA De Melo, RBB Santos, R Giacomini, NH Medina, ... 2019 19th European Conference on Radiation and Its Effects on Components and …, 2019 | 10 | 2019 |
| Modeling of a MOS ultralow voltage astable multivibrator for energy harvesting ACC Telles, S Finco, JA Pomilio IEEE Transactions on Circuits and Systems II: Express Briefs 61 (3), 168-172, 2014 | 10 | 2014 |
| High performance NMOS active Zener and rectifier diodes S Finco, AP Casimiro, PM Santos, P Tavares, MIC Simas Conference Record of the 2001 IEEE Industry Applications Conference. 36th …, 2001 | 10 | 2001 |
| A cost effective smart power approach with NMOS based blocks in standard CMOS technology S Finco, P Tavares, P Santos, AP Casimiro, F Behrens, M Lança, ... 1998 IEEE International Conference on Electronics, Circuits and Systems …, 1998 | 10 | 1998 |
| Smart Power IC for DC-DC low power regulation S Finco, FH Behrens, MIC Simas Conference Record of the 1992 IEEE Industry Applications Society Annual …, 1992 | 10 | 1992 |
| Boosting the SOI MOSFET electrical performance by using the octagonal layout style in high temperature environment EHS Galembeck, C Renaux, D Flandre, S Finco, SP Gimenez IEEE Transactions on Device and Materials Reliability 17 (1), 221-228, 2017 | 9 | 2017 |
| A current limiter for satellite power protection RHG Chacón, AV Dias, ÂA Santos, PC Secheusk, TC Cavalcante, ... Analog Integrated Circuits and Signal Processing 112 (2), 289-300, 2022 | 8 | 2022 |
| Matriz gate array cmos avançada, configurável por um único nível de metal SA Simões, F Chavez, RP Ribas, S Finco, M Cuin Jr, FH Behrens Congresso da SBMICRO 7, 281-291, 1992 | 7 | 1992 |
| A latching current limiter with telemetries for space applications RHG Chacón, AV Dias, ÂA Dos Santos, PC Secheusk, S Manea, JA Diniz, ... 2021 34th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems …, 2021 | 6 | 2021 |
| Overview about radiation–matter interaction mechanisms and mitigation techniques RNS Raphael, LE Seixas Jr, AM Pinto Jr, SA Bascopé, LT Manera, ... Brazilian Technology Symposium, 223-238, 2017 | 6 | 2017 |
