Profiluri

Christopher Frost

Individual Merit STFC Research Scientist

Adresă de e-mail confirmată pe stfc.ac.uk

Citat de 7566 ori

Radiation Effects Neutron Science Single Event Effects

Steve LaLumondiere

The Aerospace Corporation

Adresă de e-mail confirmată pe aero.org

Citat de 1818 ori

Single Event Effects Radiation Effects Semiconductor Device and Materials …

Jeffrey S. Kauppila

Institute for Space and Defense Electronics, Vanderbilt University

Adresă de e-mail confirmată pe vanderbilt.edu

Citat de 1694 ori

Radiation Effects CMOS Single-Event Effects Compact Modeling

Nathaniel Kaneshige

Helion Energy

Adresă de e-mail confirmată pe helionenergy.com

Citat de 1520 ori

Radiation Detection Neutron Detectors Fusion Diagnostics Radiation Effects Single Event Effects

laurent ARTOLA

Senior II Research Engineer ONERA

Adresă de e-mail confirmată pe onera.fr

Citat de 1379 ori

Electronic reliability Single Event Effects Radiation effects Semiconductor device

Boyang Du

Citat de 637 ori

Fault Tolerant FPGA Testing Single Event Effects Radiation Effects

Hangfang Zhang

Vanderbilt University

Adresă de e-mail confirmată pe vanderbilt.edu

Citat de 579 ori

Embedded Systems Single event effects IC design

Liang Wang

Beijing Microelectronics Technology Institute

Adresă de e-mail confirmată pe vanderbilt.edu

Citat de 519 ori

radiation effects radiation hardening single event effects cmos phase-locked loop

Pedro Martín-Holgado

Centro Nacional de Aceleradores, Universidad de Sevilla

Adresă de e-mail confirmată pe us.es

Citat de 323 ori

radiation_effects_on_electronics microelectronics single_event_effects radiation_detectors Dosimetry

Chundong Liang

Vanderbilt University; Maxim Integrated; Micron; Amazon AWS

Adresă de e-mail confirmată pe amazon.com

Citat de 295 ori

Microelectronics Reliability single-event-effects Semiconductor Devices Electronics

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