Vertical profiles and enrichment pattern of natural radionuclides in monazite areas of coastal Kerala PK Shetty, Y Narayana, K Siddappa Journal of environmental radioactivity 86 (1), 132-142, 2006 | 46 | 2006 |
Variation of radiation level and radionuclide enrichment in high background area PK Shetty, Y Narayana Journal of environmental radioactivity 101 (12), 1043-1047, 2010 | 43 | 2010 |
Behavior of 210Po and 210Pb in high background areas of coastal Kerala on the south west coast of India Y Narayana, PK Shetty, K Siddappa Applied radiation and isotopes 64 (3), 396-401, 2006 | 35 | 2006 |
Depth profile study of natural radionuclides in the environment of coastal Kerala P Shetty, Y Narayana, K Rajashekara Journal of Radioanalytical and Nuclear Chemistry 290 (1), 159-163, 2011 | 26 | 2011 |
Tuning of Schottky barrier height of Al/n-Si by electron beam irradiation IP Vali, PK Shetty, MG Mahesha, VC Petwal, J Dwivedi, RJ Choudhary Applied Surface Science 407, 171-176, 2017 | 24 | 2017 |
Formation and characterization of silicon films on flexible polymer substrates PK Shetty, ND Theodore, J Ren, J Menendez, HC Kim, E Misra, JW Mayer, ... Materials letters 59 (8-9), 872-875, 2005 | 23 | 2005 |
Structural and optical studies of gamma irradiated N-doped 4H-SiC IP Vali, PK Shetty, MG Mahesha, VG Sathe, DM Phase, RJ Choudhary Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2019 | 22 | 2019 |
Nanocrystalline Si formation in the a-Si/Al system on polyimide and silicon dioxide substrates TL Alford, PK Shetty, ND Theodore, N Tile, D Adams, JW Mayer Thin Solid Films 516 (12), 3940-3947, 2008 | 20 | 2008 |
Electron and gamma irradiation effects on Al/n‒4H–SiC Schottky contacts IP Vali, PK Shetty, MG Mahesha, VC Petwal, J Dwivedi, DM Phase, ... Vacuum 172, 109068, 2020 | 19 | 2020 |
Gamma irradiation effects on Al/n-Si Schottky junction properties IP Vali, PK Shetty, MG Mahesha, R Keshav, VG Sathe, DM Phase, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2018 | 16 | 2018 |
Enrichment of natural radionuclides in monazite areas of coastal Kerala Y Narayana, PK Shetty, K Siddappa International Congress Series 1276, 333-334, 2005 | 15 | 2005 |
Determination of trace level mercury in biological and environmental samples by neutron activation analysis P Shetty, AA Moosavi-Movahedi, K Rengan Journal of radioanalytical and nuclear chemistry 182, 205-211, 1994 | 14 | 1994 |
Structural optimization of indium oxide thin film for gamma dosimetry applications C Aparna, PK Shetty, MG Mahesha Materials Science in Semiconductor Processing 150, 106931, 2022 | 12 | 2022 |
Radioactivity and radiation hazard evaluation in the environment of coastal Kerala, India PK Shetty, Y Narayana International Journal of Low Radiation 4 (3), 189-199, 2007 | 11 | 2007 |
Thermal neutron irradiation effects on structural and electrical properties of n-type 4H‒SiC IP Vali, PK Shetty, MG Mahesha, MN Rao, S Kesari Journal of Materials Science: Materials in Electronics 31, 8496-8501, 2020 | 8 | 2020 |
Gamma and neutron irradiation effects on the structural and optical properties of potash alum crystals AN Prabhu, PK Shetty, IP Vali, H Kumar, S Udupa Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2017 | 8 | 2017 |
Sensitivity estimation of indium oxide thin film for gamma sensing C Aparna, PK Shetty, MG Mahesha, I Yashodhara, N Karunakara Journal of Materials Science 58 (27), 11374-11391, 2023 | 7 | 2023 |
Structural and optical properties of indium oxide thin films synthesized at different deposition parameters by spray pyrolysis C Aparna, MG Mahesha, PK Shetty Materials Today: Proceedings 55, 141-147, 2022 | 7 | 2022 |
Structural, optical and sensitivity study of optimized indium oxide thin film for gamma sensing applications C Aparna, PK Shetty, MG Mahesha, N Karunakara, I Yashodhara Sensors and Actuators A: Physical 345, 113785, 2022 | 6 | 2022 |
Implications of electron beam irradiation on Al/n-Si Schottky junction properties IP Vali, PK Shetty, MG Mahesha, VC Petwal, J Dwivedi, DM Phase, ... Microelectronics Reliability 91, 179-184, 2018 | 6 | 2018 |