| Carbon-based supercapacitors produced by activation of graphene Y Zhu, S Murali, MD Stoller, KJ Ganesh, W Cai, PJ Ferreira, A Pirkle, ... science 332 (6037), 1537-1541, 2011 | 6695 | 2011 |
| Surface and grain boundary scattering in nanometric Cu thin films: A quantitative analysis including twin boundaries K Barmak, A Darbal, KJ Ganesh, PJ Ferreira, JM Rickman, T Sun, B Yao, ... Journal of Vacuum Science & Technology A 32 (6), 2014 | 104 | 2014 |
| D-STEM: A parallel electron diffraction technique applied to nanomaterials KJ Ganesh, M Kawasaki, JP Zhou, PJ Ferreira Microscopy and Microanalysis 16 (5), 614-621, 2010 | 78 | 2010 |
| Site-specific deposition of Au nanoparticles in CNT films by chemical bonding A Velamakanni, CW Magnuson, KJ Ganesh, Y Zhu, J An, PJ Ferreira, ... Acs Nano 4 (1), 540-546, 2010 | 61 | 2010 |
| Grain boundary character distribution of nanocrystalline Cu thin films using stereological analysis of transmission electron microscope orientation maps AD Darbal, KJ Ganesh, X Liu, SB Lee, J Ledonne, T Sun, B Yao, ... Microscopy and Microanalysis 19 (1), 111-119, 2013 | 58 | 2013 |
| Catalyst‐free synthesis and characterization of metastable boron carbide nanowires A Velamakanni, KJ Ganesh, Y Zhu, PJ Ferreira, RS Ruoff Advanced Functional Materials 19 (24), 3926-3933, 2009 | 54 | 2009 |
| Effect of downscaling nano-copper interconnects on the microstructure revealed by high resolution TEM-orientation-mapping KJ Ganesh, AD Darbal, S Rajasekhara, GS Rohrer, K Barmak, PJ Ferreira Nanotechnology 23 (13), 135702, 2012 | 49 | 2012 |
| Grain structure analysis and effect on electromigration reliability in nanoscale Cu interconnects L Cao, KJ Ganesh, L Zhang, O Aubel, C Hennesthal, M Hauschildt, ... Applied Physics Letters 102 (13), 2013 | 44 | 2013 |
| A. Pirkle, RM Wallace, KA Cychosz, M. Thommes, D. Su, EA Stach and RS Ruoff Y Zhu, S Murali, MD Stoller, KJ Ganesh, W Cai, PJ Ferreira Science 332, 1537-1541, 2011 | 28 | 2011 |
| Texture and stress analysis of 120 nm copper interconnects KJ Ganesh, S Rajasekhara, JP Zhou, PJ Ferreira Scripta Materialia 62 (11), 843-846, 2010 | 25 | 2010 |
| Evidence of metastable hcp phase grains in as-deposited nanocrystalline nickel films S Rajasekhara, KJ Ganesh, K Hattar, JA Knapp, PJ Ferreira Scripta Materialia 67 (2), 189-192, 2012 | 24 | 2012 |
| Automated local texture and stress analysis in cu interconnects using d-STEM and precession microscopy KJ Ganesh, S Rajasekhara, D Bultreys, JP Zhou, PJ Ferreira Microscopy and Microanalysis 16 (S2), 1728-1729, 2010 | 6 | 2010 |
| Analysis of grain structure by precession electron diffraction and effects on electromigration reliability of Cu interconnects L Cao, KJ Ganesh, L Zhang, O Aubel, C Hennesthal, E Zschech, ... 2012 IEEE International Interconnect Technology Conference, 1-3, 2012 | 5 | 2012 |
| A STEM Parallel Diffraction Technique Applied to Nanomaterials KJ Ganesh, M Kawasaki, JP Zhou, PJ Ferreira Microscopy and Microanalysis 15 (S2), 752-753, 2009 | 5 | 2009 |
| Controlled assembly of silane-based polymers: chemically robust thin-films A Velamakanni, JR Torres, KJ Ganesh, PJ Ferreira, JS Major Langmuir 26 (19), 15295-15301, 2010 | 4 | 2010 |
| Grain structure analysis and implications on electromigration reliability for Cu interconnects L Cao, KJ Ganesh, L Zhang, PJ Ferreira, PS Ho 2012 IEEE International Reliability Physics Symposium (IRPS), EM. 3.1-EM. 3.5, 2012 | 3 | 2012 |
| Grain boundary characterization of nanocrystalline cu from the stereological analysis of transmission electron microscope orientation maps A Darbal, K Ganesh, K Barmak, G Rohrer, P Ferreira, T Sun, K Coffey Microscopy and Microanalysis 17 (S2), 1416-1417, 2011 | 2 | 2011 |
| D-STEM combined with precession microscopy for nanoscale crystal orientation and phase mapping K Ganesh, S Rajasekhara, D Bultreys, K Hattar, J Knapp, P Ferreira Microscopy and Microanalysis 17 (S2), 1090-1091, 2011 | 2 | 2011 |
| High-resolution characterization of activated graphene for supercapacitor applications EA Stach, D Su, K Yager, P Ercius, KJ Ganesh, PJ Ferreira, Y Zhu, ... Microscopy and Microanalysis 18 (S2), 1536-1537, 2012 | 1 | 2012 |
| Rapid and automated grain orientation and grain boundary analysis in nanoscale copper interconnects KJ Ganesh, S Rajasekhara, D Bultreys, PJ Ferreira 2011 International Reliability Physics Symposium, 5C. 2.1-5C. 2.3, 2011 | 1 | 2011 |
