Articole cu mandate pentru acces public - Richard G Southwick IIIAflați mai multe
Disponibile undeva: 3
Limitations of Poole–Frenkel Conduction in Bilayer MOS Devices
RG Southwick, J Reed, C Buu, R Butler, G Bersuker, WB Knowlton
IEEE Transactions on Device and materials reliability 10 (2), 201-207, 2009
Mandate: US National Institutes of Health
Temperature (5.6-300K) Dependence Comparison of Carrier Transport Mechanisms in HfO2/SiO2 and SiO2 MOS Gate Stacks
RG Southwick, J Reed, C Buu, H Bui, R Butler, G Bersuker, WB Knowlton
2008 IEEE International Integrated Reliability Workshop Final Report, 48-54, 2008
Mandate: US National Institutes of Health
On the thermal activation of negative bias temperature instability
RG Southwick, WB Knowlton, B Kaczer, T Grasser
2009 IEEE International Integrated Reliability Workshop Final Report, 36-41, 2009
Mandate: US National Institutes of Health
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